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    • 1. 发明专利
    • 測色装置
    • JPWO2017099032A1
    • 2018-09-27
    • JP2016086033
    • 2016-12-05
    • コニカミノルタ株式会社
    • 山田 正之
    • G01J3/51
    • G01J3/0251G01J1/02G01J3/51
    • 試料の表面における色彩が高精度に測定され得る小型の測色装置を提供するために、測色装置は、積分球と光源部と受光部と低反射率部を備えている。積分球は、試料が覆うように配される測定用の開口を成す第1開口部と、該第1開口部に対向して試料からの反射光を通過させる受光用の開口を成す第2開口部とを有している。光源部は、積分球の内壁面に光を照射する。受光部は、光源部からの光が内壁面で反射され、測定用の開口を介して試料の表面の2次元領域に照射される際に、測定用の開口を介して積分球内に入射される2次元領域からの反射光を受光用の開口を介して受光し、反射光に応じた信号を出力する。低反射率部は、受光部の周囲の積分球の内部空間に臨む領域に配され且つ積分球の内壁面よりも光の反射率が低い。測定用の開口から低反射率部を平面視した低反射率部の外径が、受光用の開口から測定用の開口を平面視した測定用の開口の径以上である。
    • 2. 发明专利
    • Optical measurement apparatus, optical measurement system, and fiber coupler
    • 光学测量装置,光学测量系统和光纤耦合器
    • JP2011203077A
    • 2011-10-13
    • JP2010069964
    • 2010-03-25
    • Otsuka Denshi Co Ltd大塚電子株式会社
    • OKUBO KAZUAKITAGUCHI TOICHI
    • G01J3/02G01J1/02G01M11/00G01N21/27
    • G01N21/55G01J3/02G01J3/0218G01J3/0251G01J3/0254G01J3/0262G01J3/10G01N21/255G01N21/59G01N2201/0655
    • PROBLEM TO BE SOLVED: To provide a quantum efficiency measuring method which can reduce the error resulting from re-excitation (secondary excitation) during measurement of quantum efficiency, a quantum efficiency measuring apparatus, and an integrator made to face the apparatus.SOLUTION: The optical measurement apparatus includes a spectroscopic measurement device 50, an incidence-side fiber 20 for propagating light to be measured, a hemispherical part 1 having a light diffuse reflection layer 1a on its inner wall, and a plane part 2 disposed to close an opening of the hemispherical part 1 and having a mirror reflection layer 2a located to face the inner wall of the hemispherical part 1. The plane part 2 includes an incidence window 5 for directing the light emitted thorough the incidence-side fiber 20 into an integrating space formed by the hemispherical part 1 and the plane part 2, and an emission-side fiber 30 for propagating the light in the integrating space to the spectroscopic measurement device 50 through an emission window 6.
    • 要解决的问题:提供量子效率测量方法,其可以减少量子效率测量期间的再激励(二次激发)导致的误差,量子效率测量装置和面向设备的积分器。解决方案: 光学测量装置包括光谱测量装置50,用于传播待测光的入射侧光纤20,在其内壁上具有光漫反射层1a的半球形部分1和用来封闭被测光的开口的平面部分2 半球形部分1并且具有面对半球形部分1的内壁的镜面反射层2a。平面部分2包括入射窗5,用于将通过入射侧光纤20射出的光引导到由 半球形部分1和平面部分2以及用于将积分空间中的光传播到光谱m的发射侧光纤30 测量装置50通过发射窗口6。
    • 5. 发明专利
    • Spectrophotometer
    • 分光光度计
    • JPS5763426A
    • 1982-04-16
    • JP13763680
    • 1980-10-03
    • Hitachi Ltd
    • BABA GOROU
    • G01J3/443G01J3/00G01J3/28G01N21/27
    • G01J3/28G01J3/0251G01J3/502G01J3/524
    • PURPOSE:To enable to appropriately obtain a total spectro RF even if a fluorescent color is contained, by a method wherein a spectro reflection refelectance factor (RF) of a sample is measured in a reflection measuring manner, and a spectro fluorescence RF is measured in an radiation measuring manner. CONSTITUTION:A mirror 6 reflects a light from a light source 1 through a lens 2, a slit 4, and a concave diffraction grating 5, and the light enters into an integrating sphere 8 through the diffraction trating 5, the slit 4, and a half mirror 3 again. The light, which disperses in the integrating sphere 8 and is reflected in a stream line direction of a sample 9, disperses at a concave diffraction grating 12 through a half mirror 10 and a slit 11, and is inputted to a light-receiving element group 13. After the relative spectro sensitivity of the light-receiving element group 13 is found, a standard white plate, containing no fluorescent color, is placed at a sample surface 9 of the integrating sphere 8 to find a spectro distribution. Then, after the spectro distribution is measured on the sample surface 9, a light-shielding plate 7 is placed in front of the mirror 6, and a measurement takes place as the light is shielded in order from a short wavelength side of a spectrum. Processing of the data by means of a signal processing part 35 permits obtaining of a total spectro RF of the sample.
    • 目的:即使在含有荧光色的情况下,也可以通过以反射测定方式测定样品的分光反射重复系数(RF)的方法,能够适当地获得全光谱RF,并且测定分光荧光RF 辐射测量方式。 构成:反射镜6通过透镜2,狭缝4和凹面衍射光栅5反射来自光源1的光,并且光通过衍射台5,狭缝4和光源4进入积分球8。 半反射镜3再次。 分散在积分球8中并在样品9的流线方向上反射的光在凹面衍射光栅12上通过半透半反镜10和狭缝11分散,并被输入到光接收元件组 在发现光接收元件组13的相对光谱灵敏度之后,将不含荧光色的标准白板放置在积分球8的样品表面9上,以找到光谱分布。 然后,在样品表面9上测量光谱分布后,将光屏蔽板7放置在反射镜6的前面,并且当光从光谱的短波长侧依次屏蔽时,进行测量。 通过信号处理部分35对数据的处理允许获得样品的总分光RF。
    • 6. 发明专利
    • Color measuring device
    • 颜色测量装置
    • JPS5756724A
    • 1982-04-05
    • JP13195680
    • 1980-09-22
    • Shimadzu Corp
    • AKIYAMA OSAMU
    • G01J3/443G01J1/02G01J3/44G01J3/50
    • G01J3/4406G01J3/0251G01J3/502G01J3/524
    • PURPOSE:To detect fluorescence surely by subtracting fluorescence intensity from the apparent reflected light intensity in the wavelength of lighting light of reflected light spectra and calculating a spectral reflected radiance factor and a spectral fluorescence radiance factor. CONSTITUTION:The device consits of a lighting spectroscope M1 and a reflection spectroscope M2. In the spectroscope M2, a multichannel photometric element D is disposed along the spectral image plane, and the operation of interpolating the fluorescence intensity at the wavelength of lighting light from the reflected light spectra of a sample Sm is accomplished at every wavelength in the wavelength scanning of the spectroscope M1. The interpolated fluorescence intensity is subtracted from the apparent reflected light intensity at the lighting light wavelength of the reflected light spectra in an arithmetic circuit. The fluorescence intensity is divided by the ratio of the wavelength width of the spectroscope M2 to the wave- length width of the spectroscope M1. An arithmetic circuit calculating a spectral reflection radiance factor and a spectral fluorescence radiance factor from these two is provided.
    • 目的:通过从反射光谱的照明光的波长中的表观反射光强度减去荧光强度并计算光谱反射辐射系数和光谱荧光辐射系数来确定荧光检测的荧光。 构成:照明分光器M1和反射光谱仪M2的装置。 在分光镜M2中,沿着光谱图像平面设置多通道光度测定元件D,并且在波长扫描中的每个波长处实现从样品Sm的反射光谱在照明光的波长处内插荧光强度的操作 的分光仪M1。 从运算电路中反射光谱的发光光波长的表观反射光强度中减去内插荧光强度。 荧光强度除以分光镜M2的波长宽度与分光镜M1的波长宽度的比值。 提供了从这两个算出光谱反射辐射系数和光谱荧光辐射系数的运算电路。
    • 9. 发明专利
    • Measurement of optical density relating to color light
    • 相对于颜色光的光密度的测量
    • JPS61112931A
    • 1986-05-30
    • JP23559984
    • 1984-11-08
    • Canon Inc
    • SASAKI TAKU
    • G01J3/50G01J3/46G01J3/51H04N1/48H04N1/60
    • G01J3/46G01J3/0251G01J3/465G01J3/502G01J3/51H04N1/482H04N1/6016
    • PURPOSE:To provide data for enable more accurate color reproduction to a field of color printing, by measuring optical density having a clear colorimetric definition. CONSTITUTION:The reflected light of a specimen is incident to a spectroscope 18 through a pervious specimen chamber 16 by the light from a light source 14. The spectroscope 18 divides the reflected light into lights classified by wavelength component through a diffraction lattice 19 to allow said lights to irradiate a photodiode array 20. The reflectivity at every wavelength received by the photodiode array 20 is inputted to an operation circuit 21 and three stimulation values X, Y, Z are calculated according to JISZ8722. Further, the operation circuit 21 calculates the density value of each color from three stimulation values X, Y, Z according to a specific formula.
    • 目的:提供数据,以便通过测量具有清晰比色定义的光密度来实现彩色打印领域的更准确的色彩再现。 构成:试样的反射光通过来自光源14的光通过透过试样室16入射到分光镜18.分光镜18将反射光通过衍射光栅19分成波长成分分类的光,以允许所述 光照射光电二极管阵列20.由光电二极管阵列20接收的每个波长的反射率被输入到操作电路21,并根据JISZ8722计算三个刺激值X,Y,Z。 此外,运算电路21根据具体的公式从三个刺激值X,Y,Z计算每种颜色的浓度值。