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    • 2. 发明专利
    • ANALYSIS DEVICE
    • JP2002243609A
    • 2002-08-28
    • JP2001039453
    • 2001-02-16
    • ULVAC CORP
    • ITO ATSUSHIMAEHIRA KENFUWA KOYUYAMA JUNPEI
    • G01N29/02G01N5/02
    • PROBLEM TO BE SOLVED: To provide an analysis device, capable of accurately measuring changes in the oscillation frequencies of a plurality of oscillators capable of solving the problems of the difficulty in preventing interference among the oscillators by only arranging the oscillators in different containers, since it is caused by electrical interference inside a frequency measuring device and that it is difficult to accurately measure the oscillation frequencies of the oscillators since the amount of change in the oscillation frequencies with the progress of reaction being very small, even if it is possible to prevent the interference. SOLUTION: Oscillators 61-64 are immersed in liquids 211-214 and connected to and oscillating circuit 4 at a prescribed period one by one by a switching circuit 5 to oscillate the oscillating circuit 4. Difference in frequency is created from the oscillation frequency of the oscillating circuit 4 and the oscillation frequency of a reference frequency creating circuit 12 and measured by a low-frequency measuring circuit 15, to obtain the oscillation frequency of the oscillating circuit 4. By measuring the approximate value of the oscillation frequency of the oscillating circuit 4 using a high-frequency measuring circuit 11 and setting the oscillation frequency of the reference frequency creating circuit 12, on the basis of the approximate value, obtain the frequency of the oscillating circuit 4 of which the oscillation frequency varies can be obtained accurately.
    • 4. 发明专利
    • ION IRRADIATION DEVICE
    • JP2000208088A
    • 2000-07-28
    • JP718899
    • 1999-01-14
    • ULVAC CORP
    • AGAWA YOSHIAKISASAKI NORIYASUYUYAMA JUNPEI
    • H01J37/09H01J37/252
    • PROBLEM TO BE SOLVED: To measure a correct secondary electron current by cleaning the surface of a sample in advance when the secondary electron current generated by secondary electrons emitted from a sample is measured. SOLUTION: A moving mechanism 75 is formed on beam forming units 61, 62 for decelerating ions 80 emitted from an ion source and forming them into an ion beam 81 by reducing the beam diameter, so that the ions 80 are prevented from being applied on the beam forming units 61, 62 before a secondary electron current is measured. Then, the ions 80 are widely applied on a surface of a sample 21 arranged in the downstream of the beam forming units 61, 62, and the surface of the sample 21 undergoes ion milling to be cleaned. Since the surface of the sample can easily be cleaned like this and thus, the surface of the sample can be cleaned in advance every time the secondary electron emission quantity of the sample 21 is measured, the secondary electron emission quantity of the sample 21 can accurately be provided.
    • 8. 发明专利
    • RECIPROCATION TYPE VACUUM PUMP
    • JP2001304114A
    • 2001-10-31
    • JP2000120995
    • 2000-04-21
    • ULVAC CORP
    • MURAKAMI YOSHIOYUYAMA JUNPEI
    • F04B37/14F04B45/04
    • PROBLEM TO BE SOLVED: To provide a dry type vacuum pump formed that a valve disc is provided for reliably opening and closing even when a differential pressure between pressures on both sides of a valve plate is below approximate hundreds Pa and further, an actuator for a rod elevating to open and close the valve disc is situated outside a flow passage for gas and prevented from resistance against exhaust gas. SOLUTION: This reciprocation type vacuum pump comprises a coil spring 36 to press a valve disc 40 against a valve seat 38 by a low given force during closing of a suction valve 20; a rod 22 to forcibly lower the valve disc 40 against energization of the coil spring 36 during opening and separate it from the valve seat 38; and an actuator 30 to loosely fit in a cylindrical guide 23 in which the upper end part of the rod 22 is inserted and displace an annular permanent magnet 24 on the atmosphere side magnetically coupled to a soft iron piece 21 at the tip end part of the rod 22 through the wall of the guide 23 together with an annular disc 25. A direct current flowing to a solenoid coil 28 is brought into an ON and Off state to elevate the rod 22.