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1. 发明专利

JPS62228171A PEAK HOLDING CIRCUIT 失效
公开(公告)号：JPS62228171A
公开(公告)日：1987-10-07
申请号：JP6974586
申请日：1986-03-29
申请人： TOSHIBA CORP
发明人： KOSUGE HIDEO
IPC分类号： G01R19/04
摘要： PURPOSE:To enhance time resolving power while enabling the accurate detection of a peak value, by discharging a holding value after a predetermined time is elapsed from the point of time when an input pulse wave-form becomes smaller than the peak value being held. CONSTITUTION:When an ultrasonic echo is inputted to a transducer 14, said echo is supplied to the terminal of a peak holding circuit 20 through an amplifier 15 and a full-wave rectifier circuit 16. In the circuit 20, a signal having the almost the same wave-form as that of the inputted ultrasonic echo appears at the output terminal of an operational amplifier 2 and a peak value is held to a condenser 11 through a diode 3 and a protective resistor 4. This peak value is compared with the wave form of the inputted ultrasonic echo by a comparator 8 and, when the input wave form becomes lower than the peak value, comparing output comes to 'H' and is integrated by discharge signal generating circuits (9, 11) and, after a predetermined time prescribed by the time constant thereof, a discharge signal is sent out. By this mechanism, MOSFET 12 turns ON and a discharge circuit is closed and the peak value held to the condenser 5 is discharged quickly.

2. 发明专利

JPS6235257A ULTRASONIC FLAW DETECTOR 失效
公开(公告)号：JPS6235257A
公开(公告)日：1987-02-16
申请号：JP17435485
申请日：1985-08-09
申请人： TOSHIBA CORP
发明人： KOSUGE HIDEO
IPC分类号： G01N29/04
摘要： PURPOSE:To detect a flaw in a thin body, an end surface of a body to be inspected, etc., easily with high precision by making an ultrasonic wave on the body to be inspected at a desired angle of deflection. CONSTITUTION:An ultrasonic wave oscillator 3 delays the driving timing of a micro probe 1a... successively under the control of a delay time controller 7 to transmit ultrasonic waves 2a...2d at an angle alpha of deflection. Those ultrasonic waves enter the body 21 to be inspected from a contact medium 4, and are reflected by a reverse surface 21a, an end surface 21b, or a corner part 21 to enter the medium 4 again and received by the probes 1a.... Then, the ultrasonic waves 2a, 2b, and 2c are received and put together by the probe 1a..., and sent to an ultrasonic wave receiver 5. This receiver 5 performs delay addition 11 by controlling a delay time and the result is supplied to a CRT 13 and a signal processor 15; when there is a defect part, its position is found and the level of the reflected wave from the defect part is found, so that an alarm 19 is outputted by an alarm output device 19.

3. 发明专利

JPH0855887A LAMINOGRAPH 失效
公开(公告)号：JPH0855887A
公开(公告)日：1996-02-27
申请号：JP18829794
申请日：1994-08-10
申请人： TOSHIBA CORP
发明人： UYAMA KIICHIRO , FUJII MASAJI , TSUCHIYA TAKEO , MORI MIKI , SUZUKI HIROKATSU , KOSUGE HIDEO
IPC分类号： G01B15/00 , G01T1/29 , G03C5/00 , H01L21/66 , H05K3/00 , H05K3/46
摘要： PURPOSE:To provide a laminograph for accurately focusing a desired surface of a specimen. CONSTITUTION:A substrate 14 which is a specimen is laid out successively differently between an X-ray tube 11 and a detector 13, X rays from the X-ray tube 11 through the substrate 14 are detected by the detector 13 for scanning the substrate 14, the output of the detector 13 is successively collected by a data collection device 20 during scanning, a plurality of transmission images of the specimen with different transmission directions are collected, and the plurality of collected transmission images are summed to find an average while being shifted mutually by an image processing device 21, thus creating a transmission image where one focusing surface of the substrate 14 is focused. Then, the position of the focusing surface which is the surface of the substrate 14 is measured by a distance measuring instrument 23 and the amount of deviation is calculated based on the position of the measured focusing surface.

4. 发明专利

JPH02240562A DISCRIMINATING METHOD FOR KIND AND SHAPE OF DETECT BY ELECTRONIC SCANNING TYPE ULTRASONIC FLOW DETECTION 失效
公开(公告)号：JPH02240562A
公开(公告)日：1990-09-25
申请号：JP6165289
申请日：1989-03-14
申请人： NIPPON KOKAN KK , TOSHIBA CORP
发明人： NISHIFUJI KATSUYUKI , KATOU HIROHARU , KOSUGE HIDEO , TAMAKI KIYOHIDE
IPC分类号： G01N29/04 , G01N29/22 , G01N29/44
摘要： PURPOSE:To discriminate a kind and a shape of a defect in a short time and with high reliability by deriving plural discrimination characteristic values for featuring a difference of reflection behaviors of each reflected wave from a defect obtained by an electronic scanning type ultrasonic flaw detection. CONSTITUTION:A pair of array probes 7A, 7B formed by placing linearly plural pieces of vibrators in positions of almost the same distance on a cross-cut are placed relatively by inserting and holding a defect 6 of a seam welded part 5 of a body to be inspected. In such a state, with respect to these probes 7A, 7B, a linear scanning is executed by switching the transmission and reception by a flaw detection refractive angle existing in one side each. That is, first of all, a reflected wave of the defect 6 obtained by following up transmission of an ultrasonic beam 8A is received by the probe 7A, and by a variation of the reflection behavior, a beam path of the reflected wave, a peak crest value and a sharpness evaluation of a waveform and a reflection directional pattern are extracted as discrimination characteristic values. Subsequently, the same scanning is performed by the other probe 7B, as well. By evaluating synthetically these discrimination characteristic values, the kind and a shape of the defect 6 can be decided easily.

5. 发明专利

JPH01239451A ULTRASONIC FLAW DETECTING METHOD 失效
公开(公告)号：JPH01239451A
公开(公告)日：1989-09-25
申请号：JP6653988
申请日：1988-03-18
申请人： NIPPON KOKAN KK , TOSHIBA CORP
发明人： KATOU HIROHARU , NISHIFUJI KATSUYUKI , TAMAKI KIYOHIDE , KOSUGE HIDEO
IPC分类号： G01N29/04 , G01N29/22 , G01N29/24 , G01N29/26 , G01N29/44
摘要： PURPOSE:To decide the kind of a defect with high sensitivity and high accuracy by making an ultrasonic wave beam incident continuously at a difference angle according to the combination of the transmission and reception delay times of the vibrators of an array probe, and finding the directivity of the defect from the angle of incidence and an echo signal. CONSTITUTION:The transmission and reception of the array probe 1 where (n) vibrators are arranged linearly are performed by a vibrator group selected by a transmission/reception controller 6 at the time set by a delay time controller 9. Echoes received by respective vibrators are adjusted in phase by the set time and the echo signal composed by a delay adder 10 is displayed on a waveform display device 12. Received echoes obtained at intervals of the incidence angle are inputted to a signal processor 13 and the directivity of the defect 5 is found from the relation between the incidence angle of the ultrasonic beam 4 and the signal. The defect 5 has the directivity corresponding to its shape and a pattern corresponding to the defect is obtained to easily decide the kind of the defect with the high sensitivity and high accuracy.

6. 发明专利

JPH06138252A X-RAY INSPECTION DEVICE 失效
公开(公告)号：JPH06138252A
公开(公告)日：1994-05-20
申请号：JP28988292
申请日：1992-10-28
申请人： TOSHIBA CORP
发明人： KOSUGE HIDEO , UYAMA KIICHIRO
IPC分类号： B07C5/346 , G01N23/04 , G01V5/00 , G21K1/02
摘要： PURPOSE:To equalize inspection resolution over the whole scanning range of X-ray beams. CONSTITUTION:An opening formed by a fixed slit 2 and a rotating slit 3 makes a round trip in the longitudinal direction of the slit 3 as a rotary disc 4 rotates within the whole range of the angle of deflection of X-ray beams. At a position where the angle of rotation of the disc 4 is different by phi0 in + or - direction, the X-rays pass the same position of the slit 3. The inside surface of the slit 3 is formed into two slopes 3a, 3b of inclination matching the distance from the center O of the disc 4 so that the apparent area of the opening is always uniform relative to changes in the angle theta of deflection of the X-rays, and the slopes 3a, 3b are in symmetry with respect to the center of the slit 3. Therefore, the apparent area of the opening is changed in such a way as to be held constant relative to changes in the angle theta of deflection of the beams and so inspection resolution can be equalized over the whole scanning range of the X-ray beams.

7. 发明专利

JPH0474962A ULTRASONIC MEASURING APPARATUS 失效
公开(公告)号：JPH0474962A
公开(公告)日：1992-03-10
申请号：JP18536090
申请日：1990-07-16
申请人： TOSHIBA CORP
发明人： KOSUGE HIDEO
IPC分类号： G01N29/44 , G01N29/22
摘要： PURPOSE:To obtain an ultrasonic flaw detector which can detect flaws totally on line in the measurement of a depth of a planar defect in a plate material by arranging the apparatus made up of an array probe for transmission, an array probe for reception, an arithmetic processor for positions of defects from a received echo and the like. CONSTITUTION:Defect 14 in an object 11 to be inspected is parallel with the surface thereof as generated in a rolling process and array probes 1A and 1B are arranged in a symmetrical positional relationship. Ultrasonic beam 13 is propagated being refracted when entering the surface of the object 11 to be inspected. When an angle of incidence is set above a critical angle of a longitudinal wave, a lateral wave alone can be propagated through the object 11 to be inspected. As the lateral wave is slow almost half as much as sound velocity, a propagation time difference thereof due to a difference of a course doubles that of the longitudinal wave. As a wavelength thereof is shorter as compared with the sound velocity, the lateral wave is advantageous in the detection of fine defects as well. Thus, an electron focusing of the ultrasonic beam with the control of a delay time can improve resolutions and detection sensitivity with a less width of the beam.

8. 发明专利

JPH0440360A ULTRASONIC FLAW DETECTING METHOD FOR COMPOSITE MATERIAL 失效
公开(公告)号：JPH0440360A
公开(公告)日：1992-02-10
申请号：JP14691290
申请日：1990-06-05
申请人： FUJI HEAVY IND LTD , TOSHIBA CORP
发明人： YAMAMOTO KAZUTOSHI , KOSUGE HIDEO , YAMAGISHI SUMIKO , TAMAKI KIYOHIDE
IPC分类号： G01N29/04 , G01N29/22 , G01N29/44
摘要： PURPOSE:To enable highly accurate flaw detection over a wide curvature surface range by moving an ultrasonic beam in the right-left direction of the curvature surface, also moving an array probe lengthwise so as to detect its position and performing signal processing. CONSTITUTION:The array probe 11 where plural extremely small vibrators are arrayed successively in the right-left direction of the curvature surface of the composite material 16 send plural ultrasonic wave beams 30 which are controlled by an electronic scanning means 18, so even if there is variation in the position of the composite material 16, the shape of the curvature surface 17, etc., within the scanning range, the ultrasonic wave beams 30 are transmitted effectively. The controlled ultrasonic wave beam scanning is possible even at the time of reception and even if paths are disordered, the waves can securely and stably be received to enable the flaw detection. The ultrasonic wave beams 30 having directivity matching the shape of the curvature surface 17 can be transmitted and received by the electronic scanning means 18 and the directivity characteristics of the transmitting and receiving probes are controlled to inspect the curvature part over a wide range with high accuracy.

9. 发明专利

JPH02240564A ELECTRONIC SCANNING TYPE ULTRASONIC FLAW DETECTING METHOD 失效
公开(公告)号：JPH02240564A
公开(公告)日：1990-09-25
申请号：JP6165389
申请日：1989-03-14
申请人： NIPPON KOKAN KK , TOSHIBA CORP
发明人： KATOU HIROHARU , NISHIFUJI KATSUYUKI , KOSUGE HIDEO , TAMAKI KIYOHIDE
IPC分类号： G01N29/22 , G01N29/26
摘要： PURPOSE:To understand a reflection directional pattern extending over an extensive azimuth by receiving an ultrasonic beam transmitted by only a prescribed number of vibrators in about the center part by switching it successively in the arrangement direction at every vibrator or at every plural pieces of vibrators. CONSTITUTION:An ultrasonic beam 4T deflected or focused suitably is transmitted by only a vibration group 13 consisting of a prescribed number of vibrators 2 in about the center part of an array probe 1. Subsequently, by following up the transmission of the beam 4T, a reflected wave 4R for forming a sound field distribution having a directional pattern by a dimension and a shape of a defect 6 is reflected from the defect 6 of a body to be inspected 5. Next, the beam is received and recorded by executing a linear scanning along its arrangement direction at every vibrator 2 or at every plural pieces of vibrators (1)-(3) and switching successively an intensity distribution of the reflected wave 4R. In such a case, a transmission/reception timing control of each vibrator 2 is executed by a transmitting/receiving vibrator switching part 7. In such a way, a reflection directional pattern can be measured by a distance resolution of every plural vibrators extending over a wide range, and an extremely detailed shape characteristic can be detected efficiently.

10. 发明专利

JPH0261554A ULTRASONIC FLAW DETECTOR 失效
公开(公告)号：JPH0261554A
公开(公告)日：1990-03-01
申请号：JP21410388
申请日：1988-08-29
申请人： TOSHIBA CORP
发明人： KOSUGE HIDEO
IPC分类号： G01N29/06
摘要： PURPOSE:To achieve a clearer image and higher resolutions while enabling detection of various defects varied in reflection directivity by detecting positions at which a probe is moved along an object to be inspected to synthesize a plurality of scope B images. CONSTITUTION:A transmission/reception controller 9 turns ON or OFF vibrators of an array probe 1c to generate an ultrasonic transmission pulse from a group of transmitters 8. A group of receivers 11 select and receive echoes received at the vibrators and a delay time controller 10 controls the focusing and deflection of an ultrasonic beam when it is transmitted and received. A delay adder 12 performs a phase control according to a delay time to add reception signals from the vibrators. A signal processor 15 processes a plurality of signals received from directions to be converted into a scope B image as ultrasonic tomographic image and the scope B image is shown on a scope B display device 16. A position detector 17 detects the position of an array probe 1c and an image processor 18 synthesizes a position signal from the array probe 1c and the scope B image to generate an image very close to an actual condition with higher resolutions. Then, a display device 19 shows the image very close to the actual condition.

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