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    • 3. 发明专利
    • Nonvolatile semiconductor memory device and method for manufacturing the same
    • 非易失性半导体存储器件及其制造方法
    • JP2010219511A
    • 2010-09-30
    • JP2010030134
    • 2010-02-15
    • Semiconductor Energy Lab Co Ltd株式会社半導体エネルギー研究所
    • ASAMI YOSHINOBUSATO MANABU
    • H01L21/8247H01L21/20H01L21/336H01L27/10H01L27/115H01L29/786H01L29/788H01L29/792
    • H01L27/11521H01L21/84H01L27/0207H01L27/11519H01L27/11526H01L27/11546H01L27/12H01L27/1248H01L27/1266
    • PROBLEM TO BE SOLVED: To form a nonvolatile memory element which is provided with a floating gate electrode and a high withstand voltage transistor which is provided with a thick gate insulating film over one substrate without increasing a driving voltage of the nonvolatile memory element. SOLUTION: A stacked film of a first insulating film and a second insulating film is formed between an island-shaped semiconductor region and a floating gate electrode of the nonvolatile memory element and between an island-shaped semiconductor region and a gate electrode of the transistor. A part in the first insulating film overlapping with the floating gate electrode is removed, and the insulating film between the island-shaped semiconductor region and the floating gate electrode is formed thinner than the gate insulating film of the transistor. The transistor includes a conductive film which is formed in the same layer as the floating gate electrode and a conductive film which is formed in the same layer as a control gate electrode, and these two conductive films are electrically connected to each other and function as the gate electrodes of the transistor. COPYRIGHT: (C)2010,JPO&INPIT
    • 要解决的问题:为了形成非易失性存储元件,其设置有在一个衬底上设置有厚栅极绝缘膜的浮栅和高耐压晶体管,而不增加非易失性存储元件的驱动电压 。 解决方案:在非易失性存储元件的岛状半导体区域和浮置栅电极之间以及在岛状半导体区域和栅电极之间形成第一绝缘膜和第二绝缘膜的叠层膜 晶体管。 除去与浮栅电极重叠的第一绝缘膜中的一部分,并且形成岛状半导体区域和浮栅之间的绝缘膜比晶体管的栅极绝缘膜更薄。 晶体管包括形成在与浮置栅电极相同的层中的导电膜和与控制栅电极形成在同一层中的导电膜,并且这两个导电膜彼此电连接并用作 晶体管的栅电极。 版权所有(C)2010,JPO&INPIT
    • 5. 发明专利
    • Pulse output circuit and semiconductor device
    • 脉冲输出电路和半导体器件
    • JP2014030185A
    • 2014-02-13
    • JP2013132206
    • 2013-06-25
    • Semiconductor Energy Lab Co Ltd株式会社半導体エネルギー研究所
    • TANADA YOSHIFUMISATO MANABUMIYAKE HIROYUKISASAKI TOSHINARIOKAZAKI KENICHIHIZUKA JUNICHIYAMAZAKI SHUNPEI
    • H03K3/356G02F1/1368H01L21/336H01L29/786H01L51/50H03K19/0175
    • H03K3/01G09G3/3688G11C19/28
    • PROBLEM TO BE SOLVED: To provide a high-reliability semiconductor device capable of suppressing the shift of the threshold voltage of a transistor due to degradation.SOLUTION: A pulse output circuit comprises: a first transistor having a drain receiving a clock signal; a second transistor having a source receiving a first power-supply potential and having a drain connected to the drain of the first transistor; a third transistor having a drain receiving a second power-supply potential; a fourth transistor having a source receiving the first power-supply potential and having a drain connected to the drain of the third transistor; a fifth transistor having a source receiving the first power-supply potential and having a drain connected to a gate of the third transistor; and a sixth transistor having one of a source and a drain connected to the drain of the first transistor and having the other of them connected to the gate of the third transistor. The first transistor to the third transistor have back gates that are connected to one another, and the first to sixth transistors have the same conductivity type.
    • 要解决的问题:提供能够抑制由于劣化导致的晶体管的阈值电压偏移的高可靠性半导体器件。解决方案:脉冲输出电路包括:具有接收时钟信号的漏极的第一晶体管; 第二晶体管,其源极接收第一电源电位并具有连接到第一晶体管的漏极的漏极; 第三晶体管,具有接收第二电源电位的漏极; 第四晶体管,其具有接收第一电源电位的源极,并且具有连接到第三晶体管的漏极的漏极; 第五晶体管,其源极接收第一电源电位并具有连接到第三晶体管的栅极的漏极; 以及第六晶体管,其源极和漏极中的一个连接到第一晶体管的漏极,并且另一个连接到第三晶体管的栅极。 第三晶体管至第三晶体管具有彼此连接的后栅极,第一至第六晶体管具有相同的导电类型。