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1. 发明专利

JP2003330702A Data extracting/inserting method of dsp, data extracting/ inserting device, and dsp 有权
标题翻译： DSP，数据提取/插入设备和DSP的数据提取/插入方法
公开(公告)号：JP2003330702A
公开(公告)日：2003-11-21
申请号：JP2003117662
申请日：2003-04-22
申请人： Samsung Electronics Co Ltd , 三星電子株式会社
发明人： CHUNG SEUNG JAE , KIM YONG-CHUN
IPC分类号： G06F7/00 , G06F7/76 , G06F9/308 , G06F9/312 , G06F9/315 , G06F12/00 , G06F12/02 , G06F13/00
CPC分类号： G06F9/30018 , G06F9/30032 , G06F9/30043
摘要： PROBLEM TO BE SOLVED: To provide a data extracting/inserting method of and a data extracting/inserting device for DSP.
SOLUTION: The data extracting or inserting method of DSP has a source resistor and a target resistor, and uses a position value indicating a reference position of data extraction and an offset value indicating size of the extracted data to extract or insert data from the source resistor into the target resistor. When a data packet must be continuously extracted or inserted, not by byte or word in size, the data extracting or inserting method and the data extracting/ inserting device can save a memory by efficiently and continuously extracting and inserting the data packet. They have such an advantage.
COPYRIGHT: (C)2004,JPO
摘要翻译：要解决的问题：提供用于DSP的数据提取/插入方法和数据提取/插入装置。解决方案：DSP的数据提取或插入方法具有源电阻和目标电阻，并使用指示数据提取的参考位置的位置值和指示提取的数据的大小的偏移值来提取或插入数据源电阻进入目标电阻。当数据包必须连续地提取或插入时，不是以字节或字为单位，所以数据提取或插入方法和数据提取/插入装置可以通过有效且连续地提取和插入数据包来保存存储器。他们有这样的优势。版权所有（C）2004，JPO

2. 发明专利

JP2003015868A Data processing device having method for processing loop instruction using loop buffer 有权
标题翻译：具有使用循环缓冲器处理循环指令的方法的数据处理设备
公开(公告)号：JP2003015868A
公开(公告)日：2003-01-17
申请号：JP2002147048
申请日：2002-05-22
申请人： Samsung Electronics Co Ltd , 三星電子株式会社
发明人： KIM YONG-CHUN , CHUNG SEUNG JAE
IPC分类号： G06F9/32 , G06F9/38
CPC分类号： G06F9/3877 , G06F9/325 , G06F9/381
摘要： PROBLEM TO BE SOLVED: To provide a loop instruction processing device using a loop buffer in a data processing device.
SOLUTION: The data processing device comprises a central processor for transmitting a signal CCLK to a coprocessor if a coprocessor type instruction is decoded, the coprocessor for decoding the coprocessor type instruction upon receipt of the signal CCLK and the loop buffer for receiving instructions within a loop from a program memory and storing the instructions within the loop when the coprocessor decodes a loop operation from the coprocessor type instruction. The instructions within the loop are transmitted from the loop buffer to be executed in a subsequent iteration of the loop and a disable signal is transmitted to the program memory for inhibiting access to the program memory while the instructions within the loop are transmitted from the buffer.
COPYRIGHT: (C)2003,JPO
摘要翻译：要解决的问题：提供一种在数据处理装置中使用循环缓冲器的循环指令处理装置。解决方案：数据处理设备包括一个中央处理器，用于在协处理器类型指令被解码时向协处理器发送信号CCLK，用于在接收到信号CCLK时解码协处理器类型指令的协处理器和用于接收循环内的指令的循环缓冲器当协处理器从协处理器类型指令解码循环操作时，从程序存储器中存储指令到循环内。循环内的指令从循环缓冲器发送，以在循环的后续迭代中执行，并且禁止信号被发送到程序存储器，以阻止对程序存储器的访问，同时从缓冲器发送循环内的指令。

3. 发明专利

JP2004212399A Semiconductor device equipped with scan test circuit for reducing chip size, and its test method therefor 有权
公开(公告)号：JP2004212399A
公开(公告)日：2004-07-29
申请号：JP2003435868
申请日：2003-12-26
申请人： Samsung Electronics Co Ltd , 三星電子株式会社
发明人： CHUNG SEUNG JAE , KIM YONG-CHUN
IPC分类号： G01R31/28 , G01R31/3185 , G11C29/00 , H01L21/82 , H01L21/822 , H01L27/04
CPC分类号： G01R31/318536 , G01R31/318541 , G01R31/318555 , G01R31/318558
摘要： PROBLEM TO BE SOLVED: To provide a semiconductor device equipped with a scan test circuit, satisfying the overall fault coverage and reduced in a chip size by simplifying the scan test circuit, and to provide a test method of the same.
SOLUTION: The semiconductor device is provided with a multiplexer part, receiving a multiplexer control signal and the scan test circuit which selectively outputs sub-data for each port or core output data for each port. The core part receives the output data for each port of the multiplexer part and processes and generates a core internal data for each port, and outputs them with the scan system or subjects them to selective processing the core internal data for each port or a test vector, inputted serially from the outside for each port, and causes the core output data for each port to be generated.
COPYRIGHT: (C)2004,JPO&NCIPI

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