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1. 发明专利

JP2002071599A SAMPLE ASSEMBLY FOR THERMOELECTRIC MEASURING INSTRUMENT 失效
公开(公告)号：JP2002071599A
公开(公告)日：2002-03-08
申请号：JP2000259868
申请日：2000-08-29
申请人： RIGAKU DENKI CO LTD , MITSUBISHI ELECTRIC CORP
发明人： HIRAYAMA YASUO , ITO KOICHIRO , INAMI MASANOBU , MATSUO SHUICHI , HATTORI AKIRA , MIYAKUNI SHINICHI , NOTANI YOSHIHIRO , YAMAMOTO YOSHITSUGU
IPC分类号： G01R27/26 , G01N1/28 , G01N25/00 , G01N25/48
摘要： PROBLEM TO BE SOLVED: To reduce the contact electromotive force and thermoelectromotive force of a sample assembly for thermoelectric measuring instrument by improving the soaking property of the assembly by sticking the assembly to a substrate through an indium adhesive layer in a thermoelectric measuring instrument. SOLUTION: An aluminum nitride substrate 12 has an insulating property and good thermal conductivity. An intermediate layer 16 is formed at the center of the substrate 12, and relay terminal layers 24 and 26 are formed at both ends of the substrate 12. Each of the layers 16, 24, and 26 is formed in a three- layer structure of Ti, Mo, and Au layers from the substrate 12 side. A GaAs sample 14 is stuck to the upper surface of the intermediate layer 16 through an adhesive layer 18 composed of indium having good thermal conductivity. On the upper surface of the sample 14, a pair of electrode layers 20 and 22 is formed at an interval. Each of the electrode layers 20 and 22 is formed in a three-layer structure of AuGe, Ni, and Au layers from the sample 14 side. The electrode layers 20 and 22 of the sample 14 are respectively connected to the relay electrode layers 24 and 26 on the substrate 12 through Au wires 28 and 30.

2. 发明专利

JP2002286664A GAS CIRCULATION TYPE HEAT ANALYSIS APPARATUS 失效
公开(公告)号：JP2002286664A
公开(公告)日：2002-10-03
申请号：JP2001090650
申请日：2001-03-27
申请人： RIGAKU DENKI CO LTD
发明人： ARII TADASHI , MATSUO SHUICHI
IPC分类号： G01N25/20
摘要： PROBLEM TO BE SOLVED: To provide a gas circulation type heat analysis apparatus for easily exchanging samples. SOLUTION: An apparatus body 50 comprises a tubular sample holder 10, a sample retention container 20 that is freely attached and detached to and from one end of the sample holder 10, and a hollow protection pipe 40 for covering the outer periphery of the sample holder 10. The sample holder 10 and the protection pipe 40 can travel relatively while being separated, and a gas circulation path that passes through the hollow section of the sample holder 10 via the inside of the sample retention container 20 from the hollow section of the protection pipe 40 is formed at the protection pipe 40, the sample retention container 20, and the sample holder 10. The detachable sample retention container 20 is provided at one end of the sample holder 10, thus easily exchanging the sample simply by removing the sample retention container 20 from the sample holder 10 after the protection pipe 40 is retracted from the outer periphery of the sample holder 10.

3. 发明专利

JPH1078378A SAMPLE CARRYING GRIPPER 失效
公开(公告)号：JPH1078378A
公开(公告)日：1998-03-24
申请号：JP23227996
申请日：1996-09-02
申请人： RIGAKU DENKI CO LTD
发明人： AKIYAMA KIYOSHI , KUWABARA KATSUO , ITAKURA TAKAO , OKAYA SHINICHI , ITO YUJI , MATSUO SHUICHI
IPC分类号： G01N25/00 , G01N1/00 , G01N1/28
摘要： PROBLEM TO BE SOLVED: To reliably grip a sample with high reliability, and carry it to a sample installing part by applying a subject device to an applied physical and chemical apparatus such as a thermally analyzing measuring device. SOLUTION: This device is provided with a gripper main body 1, plural gripping pawls 3 and 4 which are arranged in this gripper main body 1 so as to be freely openable-closable and grip a sample by cooperating with each other, a driving means to drive so as to open-close these gripping pawls 3 and 4, a first shutter 8 to integrally move with the gripping pawl 3 and a grip confirming sensor 10 arranged in a prescribed position of the gripping device main body 1. When the gripping pawl 3 moves up to a position to grip the sample, the grip confirming sensor 10 is constituted so as to detect the first shutter 8.

4. 发明专利

JPH08261962A SAMPLE HEATING DEVICE FOR THERMAL ANALYZER 失效
公开(公告)号：JPH08261962A
公开(公告)日：1996-10-11
申请号：JP9311895
申请日：1995-03-27
申请人： RIGAKU DENKI CO LTD
发明人： MATSUO SHUICHI , SUGIURA KASUMI , KUWABARA KATSUO , AKIYAMA KIYOFUMI
IPC分类号： G01N25/00
摘要： PURPOSE: To provide a sample heating device for a thermal analyzer capable of being miniaturized, having good temperature responsiveness and uniform temperature distribution, and generating little induced magnetic field by folding a heater wire into two, winding it round the outer periphery of a protective tube into a two-spiral shape, and increasing the winding pitch of the heater wire at the center section in the axial direction of the protective tube. CONSTITUTION: A heater wire 22 is folded into two, and it is wound round the outer periphery of a protective tube 20 into a two-spiral shape. The winding pitch of the heater wire 22 is made wide at the center section 32 in the axial direction of the protective tube 20, and the winding pitch is made narrow at both sides 34 in the axial direction. The temperature distribution in the axial direction in the protective tube 20 is made uniform. Currents flow in opposite directions to each other in adjacent heater wires 22, and induced magnetic fields are offset. A pair of tilt grooves are formed on the flange 38 of the protective tube 20, the fold section 42 of the heater wire 22 is hooked on them, and the winding start portion of the heater wire 22 is rarely removed from the protective tube 20.

5. 发明专利

JPH10246713A HEATER FOR THERMAL ANALYZER 失效
公开(公告)号：JPH10246713A
公开(公告)日：1998-09-14
申请号：JP6386197
申请日：1997-03-03
申请人： RIGAKU DENKI CO LTD
发明人： MATSUO SHUICHI , SUZUKI SAMON
IPC分类号： G01N25/00 , G01N5/04
摘要： PROBLEM TO BE SOLVED: To provide a heater for a small-sized thermal analyzer with a simple structure by holding sufficient heat insulation and electric insulation. SOLUTION: A heating furnace 2 is installed on a heating furnace support member 7 placed on a metal base 3a via a plurality of contact pins 17. The member 7 and the pins 17 are both formed of ceramics having heat insulation and electric insulation. The pins 17 are provided in a low temperature region of the member 7 so that an electric resistance value of the member 7 becomes a value for inhibiting leak from the furnace 2 toward the base 3a. This region is realized by lengthening a distance R for installing the pins 17. Since sufficient electric insulation is held by a single ceramic plate without laminating many ceramic plates, its structure becomes simple and its shape becomes a small size.

6. 发明专利

JPH09288074A METHOD AND APPARATUS FOR CONTROLLING TEMPERATURE OF SAMPLE 失效
公开(公告)号：JPH09288074A
公开(公告)日：1997-11-04
申请号：JP12395796
申请日：1996-04-23
申请人： RIGAKU DENKI CO LTD
发明人： ITO YUJI , MATSUO SHUICHI , SUZUKI SAMON
IPC分类号： G01N25/00 , G05D23/22
摘要： PROBLEM TO BE SOLVED: To enable the temp. change of a sample in a state keeping the temp. difference between both ends of the sample constant and accurate, by setting the temp. difference itself between both ends of the sample to a feedback control as an object to be controlled when the thermal electromotive force of a thermoe lectric material is measured. SOLUTION: Both ends of a sample 50 composed of a thermoelectric material are respectively heated by exclusive infrared lamps 56, 58. The temps. Ta, Tb of both ends of the sample 50 are measured by thermocouples 64, 66. A signal is outputted to a firs heating power supply 72 in a first temp. control unit 70 so that the upper end temp. Ta follows a predetermined temp. rising curve and the temp. difference ΔT between the upper and lower temps. Ta, Tb is sent to a second temp. control unit 78, and the signal is outputted to a second heating power supply 80 so that the temp. difference ΔT is held to a predetermined constant value. By this constitution, the lower end temp. Tb follows so as to always hold the constant temp. difference ΔT with respect to the upper end temp. Ta. The thermal electromotive force generated between both ends of the sample 50 is detected by a voltmeter 28.

7. 发明专利

JP2002156344A ELECTRODE PRESSING UNIT FOR THERMOELECTRICITY MEASURING INSTRUMENT, AND SAMPLE SUPPORT DEVICE 失效
公开(公告)号：JP2002156344A
公开(公告)日：2002-05-31
申请号：JP2000348876
申请日：2000-11-16
申请人： RIGAKU DENKI CO LTD
发明人： MATSUO SHUICHI
IPC分类号： G01N25/00 , H01L21/66
摘要： PROBLEM TO BE SOLVED: To measure thermoelectricity of two types of samples by using or retreating an electrode pressing unit movably provided on a support bar. SOLUTION: When measuring a sample, of a type clamped between upper/ lower electrodes (for example, a plastic film), the upper electrode 42 is pressed toward the lower electrode 44 by the electrode pressing unit 58 fitted to the support bar 12. This constitution can favorably retain contact of the sample 16 clamped between the upper electrode 42 and the lower electrode 44 with the both electrodes. When the measuring a sample of a type irradiating an exciting light (for example, a semiconductor crystal), the fitting position of a base 60 on the support bar 12 is changed (or the base 60 is detached therefrom), to move the electrode pressing unit 62 to a retreat position. The electrode presser unit 62 will not obstruct the measurement of the sample 80 of the type for irradiating the excitation light 90.

8. 发明专利

JP2002071600A SAMPLE ASSEMBLY FOR PHOTOIRRADIATION TYPE THERMOELECTRIC MEASURING INSTRUMENT 失效
公开(公告)号：JP2002071600A
公开(公告)日：2002-03-08
申请号：JP2000259893
申请日：2000-08-29
申请人： RIGAKU DENKI CO LTD
发明人： HIRAYAMA YASUO , MATSUO SHUICHI , INAMI MASANOBU , ITO KOICHIRO
IPC分类号： G01R31/00 , G01N25/00
摘要： PROBLEM TO BE SOLVED: To make both the security of electrodes on the surface of a sample and photoirradiation upon the sample possible and, in addition, to eliminate the restriction imposed when the materials of the electrodes are selected by forming the surface electrode layer of a photoirradiation type thermoelectric measuring instrument in a specific pattern. SOLUTION: The photoirradiation type thermoelectric measuring instrument is constituted in such a way that two relay electrode layers 24 and 26 are formed on the surface of an aluminum nitride substrate 12, and a GaAs sample 14 is stuck to the upper surface of the first relay electrode layer 24 through an adhesive layer 18 composed of indium having good thermal conductivity. The surface electrode layer 20 of the sample 14 is formed in a fine electrode pattern and when light is projected upon the layer 20 from a spot above the sample 14, the light reaches the sample 14 through the void sections (through which the sample is exposed) of the electrode pattern. Consequently, the portions of the sample 14 in the exposed areas can be exposed directly to the light even when the surface electrode layer 20 is provided on the sample 14. Since the widths of electrodes in the electrode pattern are almost equal to the wavelength of the exposing light, the light is diffracted and reaches the sample areas underlying the electrodes.

9. 发明专利

JP2001242109A INFRARED HEATING FURNACE 失效
公开(公告)号：JP2001242109A
公开(公告)日：2001-09-07
申请号：JP2000054700
申请日：2000-02-29
申请人： RIGAKU DENKI CO LTD
发明人： TAKADA YOSHIHIRO , MATSUO SHUICHI
IPC分类号： G01N25/00 , F27B17/00 , F27B17/02 , G01N5/04 , H05B3/62
摘要： PROBLEM TO BE SOLVED: To provide an infrared heating furnace, capable of efficiently heating a sample, and which is easy to manufacture, suitable for mass production and having sufficient cooling capacity. SOLUTION: A reflecting member 20 is provided in a heating furnace body 10, and a heat source 30 is arranged in the chamber surrounded by the reflecting member 20. The heat source 30 is an annular infrared heater, and the inner surface of the reflecting member 20 is formed as a rotating oval surface. The heat source 30 is arranged to one focal point of the rotary oval surface, and a sample S is arranged at the other focal point to converge the infrared rays from the heat source 30 to the sample. The reflecting member 20 is formed of a thin-walled metal material (preferably, a copper alloy plate), and gold plating is applied to the inner surface thereof. This reflecting member 20 is formed by draw processing to be massproduced.

10. 发明专利

JPH08261963A SAMPLE HEATING DEVICE FOR THERMAL ANALYZER 失效
公开(公告)号：JPH08261963A
公开(公告)日：1996-10-11
申请号：JP9311995
申请日：1995-03-27
申请人： RIGAKU DENKI CO LTD
发明人： MATSUO SHUICHI , SUGIURA KASUMI , KUWABARA KATSUO , AKIYAMA KIYOFUMI
IPC分类号： G01N25/00
摘要： PURPOSE: To improve the cooling characteristic without reducing the heating characteristic so much by winding a heater wire round the outer periphery of a protective tube, and circulating air between the space around the protective tube and the external space. CONSTITUTION: A current is fed to a heater wire 12 wound round a protective tube 10 at the time of heating, and the protective tube 10 and a sample in it are heated. Since air holes are bored on the upper and lower heat insulating plates 22, 24, the heating efficiency is inevitably reduced. The heater wire 12 is wound directly round the outer face of the protective tube 10, its heating efficiency is excellent, and the reduction of the heating efficiency is supplemented. The heater current is tuned off for cooling the sample, and the protective tube 10 and the sample in it are cooled. The air in the space 26 around the protective tube 10 is replaced with the external air by natural convection, and the cooling of the protective tube 10 is accelerated. When air is forcibly fed by a fan 34, the cooling efficiency is further improved.

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