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1. 发明专利

JPH10340695A X-RAY GENERATOR 失效
公开(公告)号：JPH10340695A
公开(公告)日：1998-12-22
申请号：JP16503597
申请日：1997-06-06
申请人： RIGAKU DENKI CO LTD
发明人： TAKAHASHI SADAYUKI , AKIYAMA KIYOSHI , ARAI KATSUYUKI , TSUKAMOTO KATSUMI , WATANABE YOSHIAKI
IPC分类号： G21K5/00 , H01J35/18 , H05G1/00
摘要： PROBLEM TO BE SOLVED: To provide an X-ray generator which can perform opening and shutting operations of a X-ray shutter normally for a long term. SOLUTION: This device is constructed so that X-rays generated in the interior of a casing 3 are guided to the outside through an X-ray window 4 and a peripheral of the X-ray windows 4 is cooled with cooling water flowing through a cooling water passage 6. In this case, at least one of the X-ray shutter 7 which is arranged in a peripheral portion of the X-ray window 4 and a shutter base 8 which supports the X-ray shutter 7 slidably in the arrow direction, A-A', is made of a material which resists against acids, for example Ta. Since the X-ray shutter 7 and/or other member become safe from corrosion, the sliding characteristic of the X-ray shutter 7 can be maintained satisfactorily for a long term.

2. 发明专利

JPH10123073A THERMOMECHANICAL ANALYZER 失效
公开(公告)号：JPH10123073A
公开(公告)日：1998-05-15
申请号：JP28079696
申请日：1996-10-23
申请人： RIGAKU DENKI CO LTD
发明人： AKIYAMA KIYOSHI , KUWABARA KATSUO , ITAKURA TAKAO , SUGIURA KASUMI
IPC分类号： G01N25/16
摘要： PROBLEM TO BE SOLVED: To provide a thermomechanical analyzer(TMA) by which a sample is replaced automatically and by which a researcher is liberated from a complicated sample replacement operation. SOLUTION: An analyzer is constituted so as to be provided with a sample stage 32 on which many required samples S can be arranged, with a gripping means 40 which groups every sample S and with a conveyance means 30 by which the gripping means 40 is conveyed between a sample arrangement part 5 and the sample stage 32. In this case, every sample S on the sample stage 32 is gripped by the gripping means 40, and the gripping means 40 is arranged automatically to the sample arrangement part 5 in the analyzer.

3. 发明专利

JPH08247977A DIFFERENTIAL THERMAL ANALYZER 失效
公开(公告)号：JPH08247977A
公开(公告)日：1996-09-27
申请号：JP7719695
申请日：1995-03-08
申请人： RIGAKU DENKI CO LTD
发明人： TANAKA NORIHIRO , AKIYAMA KIYOSHI
IPC分类号： G01N25/20
摘要： PURPOSE: To provide a differential thermal analyzer which has excellent temperature response. CONSTITUTION: A differential thermal analyzer comprises a heat sink 8 for forming a sample chamber R, and a heat-sensitive plate 16 for placing a measuring sample 22 and a reference substance 23 and receiving the heat from the sink 8 to rise at its temperature. The analyzer measures the temperature- dependent properties of the measuring sample based on a temperature difference generated between the sample 22 and the substance 23. A mica sheet 10 having low thermal conductivity is provided between the sink 8 and the plate 16, a gas supply port for replacing the gas in the chamber R is provided at the heat sink wall 8a corresponding to the bottom wall of the chamber R, the plate 16 is bent, and one or a plurality of through holes are provided between the measuring sample placing part of the plate 16 and the reference substance placing part. Accordingly, even if the thermal capacity of the sink 8 is reduced, the temperature around the sample 22 can be stably held.

4. 发明专利

JPH10123076A APPARATUS AND METHOD FOR DIFFERENTIAL THERMOMECHANICAL ANALYSIS 失效
公开(公告)号：JPH10123076A
公开(公告)日：1998-05-15
申请号：JP28081696
申请日：1996-10-23
申请人： RIGAKU DENKI CO LTD
发明人： AKIYAMA KIYOSHI , KUWABARA KATSUO , ITAKURA TAKAO , SUGIURA KASUMI
IPC分类号： G01N25/20 , G01N25/16
摘要： PROBLEM TO BE SOLVED: To provide an apparatus and a method in which a reference sample is not required and which enhance the operability of a differential thermomechanical analysis. SOLUTION: One end of a sample S is brought into contact with a tip position 4b at a support pipe 4, the sample S is arranged, and the tip of a detecting rod 11 which is moved freely in an axial direction is brought into contact with the other end of the sample S. On the other hand, a reference detecting rod 12 which is moved freely in the axial direction is arranged and installed so as to be side by side in parallel with the detecting rod 11, and the tip of the detecting rod 12 is brought into contact with the tip partition 4b at the support pipe 4. Then, the sample S is heated from the circumference, the relative displacement of the detecting rod 11 with reference to the reference detecting rod 12 is detected, and deformation of the sample S due to heating is measured.

5. 发明专利

JPH1078399A AUTOMATIC SAMPLE REPLACING DEVICE AND METHOD THEREFOR 失效
公开(公告)号：JPH1078399A
公开(公告)日：1998-03-24
申请号：JP23228296
申请日：1996-09-02
申请人： RIGAKU DENKI CO LTD
发明人： AKIYAMA KIYOSHI , KUWABARA KATSUO , ITAKURA TAKAO , SUGIURA KASUMI
IPC分类号： G01N25/00 , G01N1/00 , G01N25/20
摘要： PROBLEM TO BE SOLVED: To release a research worker from complicated sample replacing work by automating the replacement of samples to plural thermal analysis devices. SOLUTION: This device is provided with a sample stage 10 on which necessary samples S are arranged in large numbers, a gripping member 14 having an opening-closing pawl capable of gripping the samples S, a raising-lowering machine 11 as a carrying means to carry this gripping member 14 to sample installing parts A of respective thermal analysis devices and the sample stage 10, a lateral guide rail 12 and a longitudinal guide rail 13. The samples S on the sample stage 10 are gripped by the gripping member 14, and this gripping member 14 is automatically arranged in the sample installing parts A in the necessary thermal analysis devices by the carrying means.

6. 发明专利

JPH09196871A SPECIMEN TEMPERATURE CONTROLLING METHOD 失效
公开(公告)号：JPH09196871A
公开(公告)日：1997-07-31
申请号：JP2063296
申请日：1996-01-12
申请人： RIGAKU DENKI CO LTD
发明人： ITAKURA TAKAO , KANETANI TAKASHI , AKIYAMA KIYOSHI
IPC分类号： G01N25/00 , G01N1/28 , G05D23/19
摘要： PROBLEM TO BE SOLVED: To make proper the power supplied to a liquid nitrogen heating device by changing the power from time to time in accordance with the specimen temp. in such a case where the specimen is cooled at a certain temp. falling speed in co-use of the cooling with a low temp. gas fed from liquid nitrogen and the heating made with a specimen heater. SOLUTION: When a specimen is to be cooled at a constant temp. falling speed, a necessary power is selecting among a plurality of dissociated power values, for example 80, 180W, etc., in accordance with the specimen temperature. Otherwise, an ideal power is determined by the interpolative calculation so as to obtain a specified temp. falling speed, and on the basis of the obtained ideal power curve 44, and the power to liquid nitrogen heating device is changed according to the specimen temperature. For the feedback control with a specimen heater, it is favorable to adopt a corrected power curve 46 which is 10% greater than the ideal power curve 44.

7. 发明专利

JP2003266392A MOVEMENT DEVICE USING FLUID RESPONDING TO MAGNETIC FIELD 审中-公开
公开(公告)号：JP2003266392A
公开(公告)日：2003-09-24
申请号：JP2002071714
申请日：2002-03-15
申请人： RIGAKU DENKI CO LTD
发明人： AKIYAMA KIYOSHI , KOBAYASHI YUJI
IPC分类号： B81B5/00 , F04B9/00 , F04B43/12 , F16J15/43 , F16K31/00 , H02K44/06
摘要： PROBLEM TO BE SOLVED: To provide a movement device providing a stable operation even if it is down-sized by a simplifying structure, especially being suitable for a micro-machine. SOLUTION: This movement device comprises fluids 2a and 2b which respond to a magnetic field, an elastic membrane 3 which accommodates the fluids, and a magnetic field providing device 7 which provides a changing magnetic field to the elastic membrane 3. This movement device may function as various kinds of apparatuses such as a seal apparatus, a valve apparatus, a pump apparatus, a damper apparatus, an object supporting apparatus, an oscillating apparatus, a display unit, a transport apparatus, a position adjustment apparatus and a rotation apparatus. COPYRIGHT: (C)2003,JPO

8. 发明专利

JP2001297987A SHAFT SEALING DEVICE 失效
公开(公告)号：JP2001297987A
公开(公告)日：2001-10-26
申请号：JP2000115093
申请日：2000-04-17
申请人： RIGAKU DENKI CO LTD
发明人： NOGUCHI MANABU , KOBAYASHI YUJI , AKIYAMA KIYOSHI
IPC分类号： F16J15/43 , H01L21/203 , H01L21/205
摘要： PROBLEM TO BE SOLVED: To provide a shaft sealing device which can simplifiy the structure of the circumference of a moving shaft which is sealed by the device. SOLUTION: A shaft sealing device is constituted in a structure that a rotating shaft 3 to rotate an object 4 to treat is provided between a first region R1 including the object 4 and a second region R2 other then the region R1. A first magnetic sealing unit 7 is provided on the part of the point of the shaft 3, and a second magnetic sealing unit 12 is provided on the part of the other end of shaft 3. These units 7 and 12 seal this shaft 3 between the regions R1 and R2 while allowing the rotation of the shaft 3. The shaft 3 is a hollow shaft having an aperture 22 facing the region 1, and the object 4 is mounted to the shaft 3 through the aperture 22. The object 4 is mounted to the aperture 22 through the hollow of the shaft 3.

9. 发明专利

JPH1078378A SAMPLE CARRYING GRIPPER 失效
公开(公告)号：JPH1078378A
公开(公告)日：1998-03-24
申请号：JP23227996
申请日：1996-09-02
申请人： RIGAKU DENKI CO LTD
发明人： AKIYAMA KIYOSHI , KUWABARA KATSUO , ITAKURA TAKAO , OKAYA SHINICHI , ITO YUJI , MATSUO SHUICHI
IPC分类号： G01N25/00 , G01N1/00 , G01N1/28
摘要： PROBLEM TO BE SOLVED: To reliably grip a sample with high reliability, and carry it to a sample installing part by applying a subject device to an applied physical and chemical apparatus such as a thermally analyzing measuring device. SOLUTION: This device is provided with a gripper main body 1, plural gripping pawls 3 and 4 which are arranged in this gripper main body 1 so as to be freely openable-closable and grip a sample by cooperating with each other, a driving means to drive so as to open-close these gripping pawls 3 and 4, a first shutter 8 to integrally move with the gripping pawl 3 and a grip confirming sensor 10 arranged in a prescribed position of the gripping device main body 1. When the gripping pawl 3 moves up to a position to grip the sample, the grip confirming sensor 10 is constituted so as to detect the first shutter 8.

10. 发明专利

JP2000146878A SAMPLE TEMPERATURE CONTROLLING METHOD 失效
公开(公告)号：JP2000146878A
公开(公告)日：2000-05-26
申请号：JP34232798
申请日：1998-11-17
申请人： RIGAKU DENKI CO LTD
发明人： AKIYAMA KIYOSHI , ITAKURA TAKAO , KANETANI TAKASHI
IPC分类号： G01N25/00 , G01N25/20
摘要： PROBLEM TO BE SOLVED: To highly precisely follow a sample temperature for any temperature programming curve including isothermal control, by inventing voltage control for the first heater in a sample temperature controlling method wherein a liquefied refrigerant is vaporized by the first heater to generate low temperature gas, the low temperature gas is introduced into a sample chamber, and wherein a second heater provided in an electric furnace of the sample chamber is heated to feedback-control the temperature of the sample chamber. SOLUTION: A voltage command is output to a second heater power source in a control system for a second heater to make zero a deviation ΔT between a target temperature Tr and an electric furnce temperature Tf. A predicted voltage command Ea based on a sample temperature Ts is output in a prediction controller in a control system for a first heater, and a voltage command Eb is output in a PID controller 42 to make the deviation ΔT zero. The Eb is added to the Ea in an adder 44. That is, the predicted voltage Ea predicted in the prediction controller is increased or decreased by the voltage command Eb based on the deviation ΔT.

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