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1. 发明专利

JPH09196871A SPECIMEN TEMPERATURE CONTROLLING METHOD 失效
公开(公告)号：JPH09196871A
公开(公告)日：1997-07-31
申请号：JP2063296
申请日：1996-01-12
申请人： RIGAKU DENKI CO LTD
发明人： ITAKURA TAKAO , KANETANI TAKASHI , AKIYAMA KIYOSHI
IPC分类号： G01N25/00 , G01N1/28 , G05D23/19
摘要： PROBLEM TO BE SOLVED: To make proper the power supplied to a liquid nitrogen heating device by changing the power from time to time in accordance with the specimen temp. in such a case where the specimen is cooled at a certain temp. falling speed in co-use of the cooling with a low temp. gas fed from liquid nitrogen and the heating made with a specimen heater. SOLUTION: When a specimen is to be cooled at a constant temp. falling speed, a necessary power is selecting among a plurality of dissociated power values, for example 80, 180W, etc., in accordance with the specimen temperature. Otherwise, an ideal power is determined by the interpolative calculation so as to obtain a specified temp. falling speed, and on the basis of the obtained ideal power curve 44, and the power to liquid nitrogen heating device is changed according to the specimen temperature. For the feedback control with a specimen heater, it is favorable to adopt a corrected power curve 46 which is 10% greater than the ideal power curve 44.

2. 发明专利

JPH07260662A THERMOGRAVIMETRIC METHOD 失效
公开(公告)号：JPH07260662A
公开(公告)日：1995-10-13
申请号：JP7633094
申请日：1994-03-24
申请人： RIGAKU DENKI CO LTD
发明人： ARII TADASHI , KANETANI TAKASHI , SENDA TETSUYA , KISHI AKASHI
IPC分类号： G01N5/04
摘要： PURPOSE:To obtain a superior measuring result in resolution in relatively short time by changing temperature-up speed continuously according to the speed of reduction of a sample. CONSTITUTION:A thermobalance includes a sample container 12 and a standard sample container 14 in a quartz protecting tube 10, and these containers are supported by a sample holder 16. An infrared ray lamp 20 is placed around the protecting tube 10, and the temperature of the sample is measured with a differential thermocouple 18. Specified numerical formulas with which temperature-up speed becomes a simple reduction function of reduction speed, are stored in an automatic program temperature control device 42. And, the various coefficients used in numerical formulas are set a control coefficient setting device 48. To automatic program temperature control device 42, the sample temperature data from a differential thermocouple 18 and the weight data from a balance control circuit 38 are inputted. And, current is let to flow in the infrared ray lamp 20 by the automatic program temperature control device 42 so that temperature-up speed corresponds to the reduction speed of a sample.

3. 发明专利

JP2000146878A SAMPLE TEMPERATURE CONTROLLING METHOD 失效
公开(公告)号：JP2000146878A
公开(公告)日：2000-05-26
申请号：JP34232798
申请日：1998-11-17
申请人： RIGAKU DENKI CO LTD
发明人： AKIYAMA KIYOSHI , ITAKURA TAKAO , KANETANI TAKASHI
IPC分类号： G01N25/00 , G01N25/20
摘要： PROBLEM TO BE SOLVED: To highly precisely follow a sample temperature for any temperature programming curve including isothermal control, by inventing voltage control for the first heater in a sample temperature controlling method wherein a liquefied refrigerant is vaporized by the first heater to generate low temperature gas, the low temperature gas is introduced into a sample chamber, and wherein a second heater provided in an electric furnace of the sample chamber is heated to feedback-control the temperature of the sample chamber. SOLUTION: A voltage command is output to a second heater power source in a control system for a second heater to make zero a deviation ΔT between a target temperature Tr and an electric furnce temperature Tf. A predicted voltage command Ea based on a sample temperature Ts is output in a prediction controller in a control system for a first heater, and a voltage command Eb is output in a PID controller 42 to make the deviation ΔT zero. The Eb is added to the Ea in an adder 44. That is, the predicted voltage Ea predicted in the prediction controller is increased or decreased by the voltage command Eb based on the deviation ΔT.

4. 发明专利

JPH11132977A SAMPLE-HEATING/COOLING DEVICE AND THERMAL ANALYSIS DEVICE 失效
公开(公告)号：JPH11132977A
公开(公告)日：1999-05-21
申请号：JP29989597
申请日：1997-10-31
申请人： RIGAKU DENKI CO LTD
发明人： ARII TADASHI , KANETANI TAKASHI , YAKUNO NOBUO , KISHI AKASHI , YAMAMOTO SADAJI
IPC分类号： G01N23/20 , G01N25/20
摘要： PROBLEM TO BE SOLVED: To execute XRD(X-ray diffraction) measurement and at the same time accurate DSC(differential scan calorimeter) measurement by securing an X-ray race for the X-ray diffraction measurement for a sample, and at the same time by stably heating or cooling the sample. SOLUTION: A sample-heating heater is provided inside the a standard sample holder 31 and a measurement sample holder 32, and a sample is heated from a bottom surface. Also, a sample cover 40 is provided around the standard sample holder 31 and the measurement sample holder 32, and the generation of convection is suppressed around the holders 31 and 32. Furthermore, an external cover 50 is provided around the sample cover 40, at the same time, a dry gas is supplied to the internal space of the sample cover 40 and that of the external cover 50, thus preventing dew from condensing on the internal and external surfaces of the sample cover 40 and the internal surface of the external cover 50 on cooling. In addition, the temperature of the external cover 50 is adjusted by a plate-shaped heater 21, and the dew is prevented from condensing on the external surface of the external cover 50.

5. 发明专利

JPH1073546A SAMPLE TEMPERATURE CONTROL METHOD 失效
公开(公告)号：JPH1073546A
公开(公告)日：1998-03-17
申请号：JP24685896
申请日：1996-08-30
申请人： RIGAKU DENKI CO LTD
发明人： AKIYAMA KIYOSHI , ITAKURA TAKAO , KANETANI TAKASHI
IPC分类号： G01N25/00 , F25D3/10 , G05D23/19
摘要： PROBLEM TO BE SOLVED: To supply a liquid nitrogen heater with a necessary and sufficient power when a sample is cooled at a specified temperature falling rate through combination of cooling with a cryogenic gas from liquid nitrogen and heating with a sample heater by altering power supply to the liquid nitrogen heater, at any time, depending on measured sample temperature and temperature falling rate. SOLUTION: When a sample is cooled down at a constant temperature falling rate, a required power, e.g. 80W or 180W, is selected among a plurality of discrete power levels depending on measured sample temperature and temperature falling rate. Alternatively, an ideal power is determined by interpolation such that a measured temperature falling rate is obtained and then power supply to a liquid nitrogen heater is altered according to an ideal power curve 44. Furthermore, a corrected power curve 46 higher by about 10% than the ideal power curve 44 may be preferably employed so that feedback control through the sample heater functions effectively at all times.

6. 发明专利

JPH08261965A SAMPLE SETTING METHOD FOR THERMOMECHANICAL ANALYZER 失效
公开(公告)号：JPH08261965A
公开(公告)日：1996-10-11
申请号：JP9312095
申请日：1995-03-27
申请人： RIGAKU DENKI CO LTD
发明人： INAMI MASANOBU , KANETANI TAKASHI
IPC分类号： G01N25/16
摘要： PURPOSE: To simplify the setting action of a sample by automatically and gradually increasing the downward load of a detecting rod when a setting button is pushed. CONSTITUTION: When the power source of a thermomechanical analyzer is turned off, a detecting rod 12 is kept at the upper limit position as shown by (A). When the power source is tuned on, the detecting rod 12 is automatically lowered to the prescribed intermediate position as shown by (B), and an origin is set. After the origin is set, an upward load is applied to the detecting rod 12, and the detecting rod 12 is lifted to the upper limit position (stand-by position) as shown by (C). A worker pinches a measured sample 10 with a pair of tweezers, puts it on a bottom plate 34, and pushes the setting button of an operation panel. A small downward load is first applied to the detecting rod 12 as shown by (D), then the detecting rod 12 is brought into contact with the sample 10 as shown by (E), and the movement of the detecting rod 12 is stopped. The load is further increased, and the load is maintained when it becomes the prescribed set load.

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