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    • 6. 发明专利
    • Alkali metal introduction apparatus and method of introducing alkali metal
    • 阿尔卡利金属介绍装置和介绍碱金属的方法
    • JP2011171212A
    • 2011-09-01
    • JP2010035683
    • 2010-02-22
    • Osaka Univ国立大学法人大阪大学
    • TOYODA MICHISATONAGAO HIROBUMINIIMA SHUICHIHAYAKAWA SHIGEO
    • H01J49/42G01N27/62
    • H01J49/0459
    • PROBLEM TO BE SOLVED: To provide an alkali metal introduction apparatus having improved usability.
      SOLUTION: The alkali metal introduction apparatus 1 for use in an experiment using an alkali metal gas includes an exclusive chamber 10 for crushing and a vacuum chamber 20, vacuum pumps 60a, 60b for evacuating the inside of the exclusive chamber 10 for crushing and the vacuum chamber 20, an ampul crushing unit 18 for exposing an alkali metal sealed into the ampul 16 to the outside by deforming the ampul 16 within the exclusive chamber 10 for crushing, a collision cell 40 that is disposed within the vacuum chamber 20 and can introduce the ampul 16, and an ampul introducing unit 12 for moving the ampul 16 between an exposure position where the alkali metal sealed into the ampul 16 is exposed to the outside of the deformed ampul 16 and an introduction position where the ampul 16 is introduced to the collision cell 40. Thus, the alkali metal introduction apparatus having improved usability can be provided.
      COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:提供一种具有改进的可用性的碱金属引入装置。 解决方案:用于使用碱金属气体的实验中的碱金属引入装置1包括用于破碎的专用室10和真空室20,用于抽真空室10的内部用于破碎的真空泵60a,60b 和真空室20,用于通过使专用室10内的安瓿16变形而使密封到安瓿16内的碱金属暴露于外部的安瓿破碎单元18用于破碎;设置在真空室20内的碰撞室40, 可以引入安瓿16,以及安瓿引入单元12,用于使安瓿16在密封到安瓿16中的碱金属暴露于变形的安瓿16的外部的暴露位置和安瓿16的引入位置之间移动 因此,可以提供具有改善的可用性的碱金属引入装置。 版权所有(C)2011,JPO&INPIT
    • 8. 发明专利
    • Distance measuring device, method of measuring distance, distance measurement program, and computer-readable recording medium
    • 距离测量装置,测量距离测量方法,距离测量程序和计算机可读记录介质
    • JP2011080952A
    • 2011-04-21
    • JP2009235185
    • 2009-10-09
    • Msi Tokyo IncMsi.Tokyo株式会社Osaka Univ国立大学法人大阪大学
    • TOYODA MICHISATOTAJIMA TOSHIO
    • G01B11/00
    • PROBLEM TO BE SOLVED: To provide a distance measuring device for measuring a distance between the tip of a probe and a workpiece surface from a positional relationship between a secondary image of the probe generated on the workpiece surface and the tip of the probe. SOLUTION: In an image for capturing a secondary image appearing on the surface of a workpiece 9 and the probe 6 by applying light to the probe 6 from an LED lamp 7, the distance measuring device 100 includes: an edge locating section 101 for locating the edge of a probe 6; a straight line insertion section 102 for inserting a straight line along the outer edge of the secondary image onto an image; and an overlapping determination section 103 for determining overlapping between the edge and the straight line. One or more LED lamps 7, the imaging apparatus, and the probe 6 are held movably in one piece to the surface of the workpiece 9. Thus, the distance measuring device 100 measures the distance between the edge of the probe 6 and the surface of the workpiece 9 from a positional relationship between the secondary image of the probe 6 generated on the surface of the workpiece 9 and the edge of the probe 6. COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:提供一种距离测量装置,用于根据在工件表面上产生的探针的二次图像和探针的尖端之间的位置关系来测量探针的尖端和工件表面之间的距离 。 解决方案:距离测量装置100在用于通过从LED灯7向探针6施加光来捕获出现在工件9和探针6的表面上的次要图像的图像中,包括:边缘定位部101 用于定位探针6的边缘; 用于将沿着次级图像的外边缘的直线插入到图像上的直线插入部分102; 以及用于确定边缘和直线之间的重叠的重叠确定部分103。 一个或多个LED灯7,成像装置和探针6一体地保持在工件9的表面上。因此,距离测量装置100测量探针6的边缘与探针6的表面之间的距离 工件9根据在工件9的表面上产生的探针6的二次图像与探头6的边缘之间的位置关系。(C)2011,JPO&INPIT
    • 10. 发明专利
    • Mass spectrometer
    • 质谱仪
    • JP2005079037A
    • 2005-03-24
    • JP2003310966
    • 2003-09-03
    • Shimadzu Corp株式会社島津製作所
    • YAMAGUCHI SHINICHIISHIHARA MORIOTOYODA MICHISATOOKUMURA DAISUKE
    • G01N27/62B01D59/44G01N27/64H01J49/00H01J49/40
    • H01J49/408H01J49/027
    • PROBLEM TO BE SOLVED: To improve mass accuracy of a mass spectrometer having a go-around track.
      SOLUTION: A detector 5 of an ion-nondestructive type is set on a go-around track A of ion, times of flight are measured for each round until the ion as an object for analysis goes around for N times, and time-of-flight spectra are made where a peak at each going around shows itself. Alternatively, a time of flight for each going around is measured according to detection signals by an ion-nondestructive detector 4 by changing the number of times of going around for each ion irradiation from an ion source for 1 to N rounds, and the time-of-flight spectra showing a peak at each round are made by combining it. A data processing unit 7 converts the spectrum data into a wavelength axis by Fourier transformation, and finds out peaks of frequencies corresponding to the number of mass to calculate the number of the mass from the frequencies.
      COPYRIGHT: (C)2005,JPO&NCIPI
    • 要解决的问题:提高具有复原轨迹的质谱仪的质量精度。 解决方案:将离子非破坏型的检测器5设置在离子的复原轨道A上,每个轮次测量飞行时间,直到作为分析对象的离子环绕N次,并且时间 在每个周围的峰值显示自身的情况下进行飞行光谱。 或者,根据通过离子无损检测器4的检测信号,通过将离子源的每次离子照射的次数改变为1〜N次来测量每个周围的飞行时间, 通过组合来显示每个轮次的峰值的飞行光谱。 数据处理单元7通过傅立叶变换将频谱数据转换为波长轴,并且找出与质量数相对应的频率的峰值,以从频率计算质量数。 版权所有(C)2005,JPO&NCIPI