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1. 发明专利

JPS61153707A PLANT INTERLOCK EXPLAINING DEVICE 失效
公开(公告)号：JPS61153707A
公开(公告)日：1986-07-12
申请号：JP27380484
申请日：1984-12-27
申请人： NIPPON ATOMIC IND GROUP CO , TOSHIBA CORP
发明人： HATTORI YOSHIAKI
IPC分类号： G05B23/02 , G06F19/00 , G21C17/00
摘要： PURPOSE:To prevent the generation of a human error, and to improve the safety and the operation rate by retrieving by a computer the cause of an interlock which has been set, when an industrial plant is being operated, etc., and displaying it on a display device. CONSTITUTION:An industrial plant P of an atomic power, etc. is provided with a sequential start/stop sequence for its operation, and has plural interlock systems and the same numb er of detectors for detecting the operating state. This interlock explaining device 1 is constututed of a signal input part 2 from the detector, an interlock retrieving processor 4, a data base 5, an explanation request use keyboard 6, and an explanation display device 7, whether plural logical circuit groups for inputting an interlock setting cause signal are true or false is decided successively, and its cause is retrieved. In this way, this cause can be displayed exactly and quickly by the explanation display device 7, and a burden of an operator of the industrial plant P can be reduced.

2. 发明专利

JPS63216194A ALARM PROCESSING AID 失效
公开(公告)号：JPS63216194A
公开(公告)日：1988-09-08
申请号：JP4895887
申请日：1987-03-05
申请人： NIPPON ATOMIC IND GROUP CO , TOSHIBA CORP , TOSHIBA ENGINEERING CO
发明人： HATTORI YOSHIAKI , ITO JUICHIRO , TOMIZAWA TERUAKI , YAMADA MINORU
IPC分类号： G08B23/00 , G05B23/02

3. 发明专利

JPS643702A AUTOMATIC PROCESS OPERATING DEVICE 失效
公开(公告)号：JPS643702A
公开(公告)日：1989-01-09
申请号：JP15754687
申请日：1987-06-26
申请人： NIPPON ATOMIC IND GROUP CO , TOSHIBA CORP
发明人： HATTORI YOSHIAKI
IPC分类号： G05B13/00 , G05B13/02
摘要： PURPOSE:To ensure the universal applicability of an automatic process operating device as well as the high-speed operation control of a process, by separating the data on a process operating procedure from the data on the process structure and at the same time using a concrete process structure and an abstract and conceptional structure to form said data on the process structure. CONSTITUTION:A process signal is supplied from a process 7 and converted into the data on a process state shown in a symbol by a signal input device 2. This converted data is turned into an expression showing an abstract concept by a data control means 3 for process structure with use of the data on the process structure. A process operating procedure deciding means 5 compares said abstracted process state with a process state shown in the data of the process operating procedure. Based on this comparison result, the next operating procedure is decided for output of an abstract process operating means. This operating procedure is turned into the concrete process control information expressed in a symbol by the means 3 by means of the data on the process structure. Then the process control information is converted into a process control signal by a signal output means 2 and delivered to a process 7.

4. 发明专利

JPS63167955A DIAGNOSIS SUPPORTING SYSTEM 失效
公开(公告)号：JPS63167955A
公开(公告)日：1988-07-12
申请号：JP31238186
申请日：1986-12-29
申请人： NIPPON ATOMIC IND GROUP CO , TOSHIBA CORP
发明人： HATTORI YOSHIAKI , TAKIZAWA YOJI , TANAKA KAZUMA , MIZUKAMI MASUMI
IPC分类号： G21C17/00 , G05B23/02 , G06F9/44 , G06N5/04 , G06Q10/04 , G21D3/00
摘要： PURPOSE:To hold the flexibility and independence of a rule expression, and also, to improve a processing speed of an inference, and to easily manage a knowledge data by using an object directional inference system in which a production rule is made an object. CONSTITUTION:When an input signal value is given from a signal input device 1, an inference is executed by a production rule, and an object directional inference system in which its rule is made an object is used. Also, the object is divided roughly into a signal input class 2, objects 3, 4 which become its instances, a logical operation class 5, and instances 6, 7 belonging thereto. In this state, by a variation of a logical value of the object 3, a message of an evaluation is sent to the object 6 being its consequence side object, and an evaluation method belonging to class 5 is applied. In such a way, a logical value of the object 6 is determined, and when its value is different from the previous value, the message of an evaluation is sent to the object 7. Therefore, an inference speed is improved, and also, a knowledge data management can be easily executed.

5. 发明专利

JPS6331435A NETWORK FACILITY DIAGNOSING SYSTEM 失效
公开(公告)号：JPS6331435A
公开(公告)日：1988-02-10
申请号：JP17090786
申请日：1986-07-22
申请人： NIPPON ATOMIC IND GROUP CO , TOSHIBA CORP
发明人： HATTORI YOSHIAKI , NAITO NORIO
IPC分类号： G05B23/02 , G06F9/44 , G06N5/04 , G21C17/00 , H02J13/00

6. 发明专利

JPH01150893A APPARATUS FOR PLANNING PERIODIC TEST OF NUCLEAR POWER PLANT 失效
公开(公告)号：JPH01150893A
公开(公告)日：1989-06-13
申请号：JP30865887
申请日：1987-12-08
申请人： NIPPON ATOMIC IND GROUP CO , TOSHIBA CORP
发明人： HATTORI YOSHIAKI , NAITO NORIO , NAKAI HIDETO
IPC分类号： G21D3/00 , G21C17/00
摘要： PURPOSE:To make out a plan for a periodic test including abiding by of rules by making inference by using the knowledge data stored with the restriction conditions, etc., relating to the periodic test and the plant process data base stored with the history, etc., of operation processes. CONSTITUTION:The operation process schedule previously stored in the plant constitution data base 2 is first read in by an inference mechanism 3 and is converted to the form of working memory elements so that the schedule becomes the known fact at the time of starting the planning. The restriction conditions are then read in from the knowledge data base 1 by the mechanism 3 and the range of the term of the test is determined by applying the restriction conditions for the process to the operation process schedule. The restriction conditions for the period of the test are determined by the periodic test history read in from the plant process data base 2. Two kinds of such processing are executed in parallel. The optimum test date which uniformizes operators' load to avoid concentration of the load on the operators for operation control and testing work with time is determined by the optimization conditions read in the data on the periodic test of the determined term from the data base 1. The plan for the periodic test is thus made out.

7. 发明专利

JPS62195596A NUCLEAR POWER PLANT INSTRUMENTATION DESIGN ASSISTING DEVICE 失效
公开(公告)号：JPS62195596A
公开(公告)日：1987-08-28
申请号：JP3752386
申请日：1986-02-24
申请人： NIPPON ATOMIC IND GROUP CO , TOSHIBA CORP
发明人： HATTORI YOSHIAKI , ITO JUICHIRO , FUJII MAKOTO , SHIMADA NOBUHIDE
IPC分类号： G21C17/00

8. 发明专利

JPS61223775A PLANT OPERATION TRAINING AID 失效
公开(公告)号：JPS61223775A
公开(公告)日：1986-10-04
申请号：JP6331685
申请日：1985-03-29
申请人： NIPPON ATOMIC IND GROUP CO
发明人： ITO JUICHIRO , HATTORI YOSHIAKI
IPC分类号： G09B9/00

9. 发明专利

JP2008177604A Electron beam drawing system and control method thereof 有权
公开(公告)号：JP2008177604A
公开(公告)日：2008-07-31
申请号：JP2008095027
申请日：2008-04-01
申请人： Toshiba Corp , 株式会社東芝
发明人： SHIMIZU MITSUKO , ABE TAKAYUKI , YASUSE HIROTO , OKI SUSUMU , KAMIKUBO TAKASHI , MURAKAMI EIJI , HATTORI YOSHIAKI , IIJIMA TOMOHIRO , HIGURE HITOSHI , MATSUKI KAZUTO
IPC分类号： H01L21/027 , H01J37/305
摘要： PROBLEM TO BE SOLVED: To diagnose the presence or absence of abnormality, such as a correction calculation error in proximity effect, and to locate an abnormal place easily. SOLUTION: An electron beam drawing system 60 comprises: an electron beam drawing means 2 for drawing a desired graphic pattern by irradiating the surface of a substrate with electron beams; a means 40 for computing a correction dosage for calculating a correction dosage for each small region in a drawing region, where the influence of the proximity effect is considered and the dosage of electron beams corresponding to the drawing graphic pattern is corrected; a control means 37 for calculating the amount of energy stored in the substrate when the electron beams having the corrected dosage are applied, calculating an error by comparing the amount of energy with a prescribed theoretical value, and determining precision in the operation of the means 40 for computing the correction dosage; a display means 67; and a data verification support means 61 for allowing the display means 67 to display information, where the corrected dosage is layered visibly, for each small region. COPYRIGHT: (C)2008,JPO&INPIT

10. 发明专利

JP2002124454A DRAWING DEVICE AND METHOD OF CHARGED PARTICLE BEAM 失效
公开(公告)号：JP2002124454A
公开(公告)日：2002-04-26
申请号：JP2000316747
申请日：2000-10-17
申请人： TOSHIBA CORP
发明人： OKI SUSUMU , ABE TAKAYUKI , ISHIMURA TAKIJI , HATTORI YOSHIAKI , IIJIMA TOMOHIRO
IPC分类号： G03F7/20 , H01L21/027
摘要： PROBLEM TO BE SOLVED: To reduce total processing time by sorting by reducing the unneeded time in the sorting of the drawing order of semiconductor patterns. SOLUTION: An electron beam drawing device in a variable formation beam system comprises a shot data generation circuit section 40 for generating shot data where a figure to be drawn is divided for each sub field, a recording section 43 having different recording memories 43a-43e for each shot shape, a final shot data-processing circuit section 41 for deleting an information code for indicating the final shot data in the sub field and adding break data for indicating a break in the sub field for each shot shape, and a memory control circuit section 42 for writing the shot data and break data for each shot shape into corresponding recording memories and reading data in the recording memories for each shot shape in order, thus drawing a pattern in the order of read shots for each shot shape.

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