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    • 1. 发明专利
    • Semiconductor device and device of observing internal state of semiconductor
    • 半导体器件和半导体内部状态的器件
    • JP2008039724A
    • 2008-02-21
    • JP2006218043
    • 2006-08-10
    • Matsushita Electric Ind Co Ltd松下電器産業株式会社
    • ISHII MASAHIRONAKAYAMA TAKESHIIMOTO TOMOYUKI
    • G01R31/319G01R31/28H01L21/822H01L27/04
    • PROBLEM TO BE SOLVED: To solve the problem that it is difficult to know correlation between malfunction and instability in a power source due to insufficiency of means for observing the instability in the power source inside a system LSI although one of causes of malfunction of the LSI is instability of internal power supply voltage and the tendency gets further worse due to speedup and reduction in voltage in recent years.
      SOLUTION: A circuit for generating a trigger signal when a fluctuation of the power source at each functional block power supply terminal position inside the system LSI exceeds a certain amount is constituted by resistive voltage division and incorporation of a comparator. By inputting the trigger signal into an internal signal observation control circuit of the system LSI, respective internal states during the fluctuation of the power source are output to the outside of SOC.
      COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:为了解决由于用于观察系统LSI内部的电源的不稳定性的装置不足而难以知道电源的故障和不稳定性之间的相关性的问题,尽管存在故障原因之一 的LSI内部电源电压不稳定,近年来由于加速和降低电压而导致的趋势进一步恶化。 解决方案:当系统LSI内的每个功能块电源端子位置处的电源的波动超过一定量时,产生触发信号的电路由电阻分压和比较器的结合构成。 通过将触发信号输入到系统LSI的内部信号观测控制电路中,电源波动期间的各自的内部状态被输出到SOC的外部。 版权所有(C)2008,JPO&INPIT
    • 3. 发明专利
    • Signal analysis device and signal analysis method
    • 信号分析装置及信号分析方法
    • JP2007285952A
    • 2007-11-01
    • JP2006115177
    • 2006-04-19
    • Matsushita Electric Ind Co Ltd松下電器産業株式会社
    • NAKAYAMA TAKESHITAKAHASHI EIJIIWAKI HIDEKI
    • G01R31/28
    • PROBLEM TO BE SOLVED: To provide a signal analysis device for obtaining a more accurate simulation result of the measuring signal of a substrate, and to provide a signal analysis method.
      SOLUTION: The signal analysis device comprises a signal difference calculation part 104 for calculating a difference between a signal measurement result and a signal analysis result; a signal analysis result correction part 105 for correcting to add the signal difference to an analysis result of a desired analysis point; an analysis extraction part 106; and a circuit analysis part 107. The signal analysis device enhances a product development efficiency, by adding the difference between the analysis result and the measurement result to the analysis result of the desired analysis point to correct the signal and accurately performing signal monitoring, in a development stage of a product, since the accuracy of the analysis result approximates signal waveform that is being generated on the actual product.
      COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:提供一种信号分析装置,用于获得基板的测量信号的更准确的模拟结果,并提供信号分析方法。 信号分析装置包括用于计算信号测量结果和信号分析结果之间的差的信号差分计算部分104; 信号分析结果校正部分105,用于校正以将信号差加到期望分析点的分析结果; 分析提取部106; 电路分析部107.信号分析装置通过将分析结果与测量结果之间的差异与所需分析点的分析结果相加来增强产品开发效率,以校正信号并准确地执行信号监视 产品的开发阶段,因为分析结果的准确性近似于在实际产品上产生的信号波形。 版权所有(C)2008,JPO&INPIT
    • 4. 发明专利
    • Signal measuring method, device, and electronic component
    • 信号测量方法,器件和电子元件
    • JP2007285852A
    • 2007-11-01
    • JP2006113144
    • 2006-04-17
    • Matsushita Electric Ind Co Ltd松下電器産業株式会社
    • KINOSHITA TOMOHIRONAKAYAMA TAKESHISAITO YOSHIYUKI
    • G01R31/28G01R15/04H01C1/04
    • PROBLEM TO BE SOLVED: To reduce a change of a signal waveform, caused when reflection generated at a contact point with a probe is transferred to a circuit to be measured, concerning a signal measuring method of a circuit board or the like.
      SOLUTION: A circuit element for impedance matching or the like connected to a signal wire 106 is divided into two or more, and the probe 107 is brought into contact with a connection point, and the divided voltage of a signal is measured, to thereby cause reflection of the signal by the circuit element 101 adjacent to the circuit to be measured to be attenuate. Moreover, correction operation is performed, by using each impedance value of the circuit elements 101, 102 and the measured divided voltage, and the signal of a measuring point is led out.
      COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:为了减少在与探针的接触点产生的反射被传送到要测量的电路时引起的信号波形的变化,涉及电路板等的信号测量方法。 < P>解决方案:连接到信号线106的用于阻抗匹配等的电路元件被分成两个或更多个,并且探针107与连接点接触,并且测量信号的分压, 从而使与被测量电路相邻的电路元件101的信号反射为衰减。 此外,通过使用电路元件101,102的每个阻抗值和测量的分压,执行校正操作,并且测量点的信号被引出。 版权所有(C)2008,JPO&INPIT
    • 6. 发明专利
    • Design support system, design support method and program
    • 设计支持系统,设计支持方法和程序
    • JP2005234701A
    • 2005-09-02
    • JP2004040384
    • 2004-02-17
    • Matsushita Electric Ind Co Ltd松下電器産業株式会社
    • IKEDA HIROSHINAKAYAMA TAKESHI
    • G06F17/50H05K3/00
    • G06F17/5068
    • PROBLEM TO BE SOLVED: To provide a design support system that supports operations of local placement designs of objects on a multilayer wiring board and streamlines an operation of verification of design consistency. SOLUTION: Series of dielectrics on opposite sides of a specific dielectric capable of having built-in parts are designated as a first part and a second part, respectively. A first support part 101 holds design information about the placement of objects mounted on the first part in a local design information storage part 141, manages it in response to commands given by a user via an input part 110 and displays the contents on a display part 120 to thereby support the design of the first part. A second support part 201 similarly supports the design of the second part. The first support part 101 and the second support part 201 hold design information about the placement of boundary objects mounted astride both parts in boundary design information storage parts 142 and 242, respectively, and cooperatively and synchronously display the contents on the display parts 110 and 210, respectively. COPYRIGHT: (C)2005,JPO&NCIPI
    • 要解决的问题:提供一种设计支持系统,其支持多层布线板上的对象的本地布局设计的操作,并且简化了设计一致性验证的操作。 解决方案:能够具有内置部件的特定电介质的相对侧上的电介质系列分别被指定为第一部分和第二部分。 第一支撑部分101将关于安装在第一部分上的物体的放置的设计信息保存在本地设计信息存储部分141中,并且响应于用户经由输入部分110给出的命令进行管理,并将其显示在显示部分上 从而支持第一部分的设计。 第二支撑部分201类似地支撑第二部分的设计。 第一支撑部101和第二支撑部201分别保持跨越两部分跨越边界设计信息存储部142和242的边界对象的位置的设计信息,并且在显示部110和210上协同同步地显示内容 , 分别。 版权所有(C)2005,JPO&NCIPI