会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 3. 发明专利
    • OPTICAL RECORDING MEDIUM
    • JPH09245373A
    • 1997-09-19
    • JP5019996
    • 1996-03-07
    • MITSUI TOATSU CHEMICALS
    • FUKUDA SHINMIYASHITA TAKEHIROUMEHARA HIDEKIFUKUDA NOBUHIRO
    • G11B7/258G11B7/24
    • PROBLEM TO BE SOLVED: To produce a highly reliable optical recording medium having excellent resistance against high temp. and high humidity and resistance against light by successively laminating a light-absorbing layer containing an org. dye, a metal light-reflecting layer comprising essentially silver formed sputtering, and a protective layer. SOLUTION: A rewritable compact disk is produced by successively laminating a light-absorbing layer containing an org. dye, a light-reflecting layer and a protective layer on a transparent substrate. The light-absorbing layer is formed by applying a phthalocyanine dye by 2000rpm spin coating on a resin substrate having guide grooves and drying at 70 deg.C for 2 hours to form a layer of 100nm thickness. Further, the light-reflecting layer is formed thereon by sputtering a silver indium alloy target containing 3-20wt.% indium to form a metal layer of 100nm thickness essentially comprising silver. Further, a UV- curing resin is applied by spin coating thereon and the resin is irradiated with UV rays to form the protective layer having 6μm thickness. Thereby, a highly reliable optical recording medium having excellent resistance against high temp. and high humidity and resistance against light can be produced at a low cost.
    • 4. 发明专利
    • PHOTOELECTRIC CONVERSION ELEMENT
    • JPH09232235A
    • 1997-09-05
    • JP2911296
    • 1996-02-16
    • MITSUI TOATSU CHEMICALS
    • SAITO KIMIHIKOISHIGURO NOBUYUKISADAMOTO MITSURUFUKUDA SHINASHIDA YOSHINORIFUKUDA NOBUHIRO
    • H01L21/205H01L21/20H01L31/04
    • PROBLEM TO BE SOLVED: To improve an open end voltage and a film formation speed without lowering a short-circuit photocurrent and a drive factor and to enhance the conversion efficiency of a photoelectric conversion element by forming a fine crystalline silicon semiconductor thin film which is composed of an amorphous phase containing a crystallite which contains a phase gathered and constituted to be pillar-shaped or cone-shaped. SOLUTION: A fine crystalline silicon thin film is composed of amorphous phases 20 containing crystallites 30, and the crystallites 30 contain phases 40 which are gathered and constituted to be pillar-shaped or cone-shaped. It is not required that the pillar-shaped or cone-shaped fine crystallites gathered phases 40 are in a complete pillar-shaped state or in a complete cone-shaped state, and they may have a shape which is synthesized, composed or mixed. In the amorphous phases inside the thin film, a single crystallite may be contained in them in a dispersed state. At this time, the pillar-shaped or cone- shaped phases 40 in which the crystallites 30 in a crystallite size of 2 to 1000nm, more preferably a crystallite size of 5 to 80nm, are gathered and constituted and the amorphous phases 20 in about 20% are required inside the fine crystallite silicon thin film.
    • 5. 发明专利
    • TRANSPARENT CONDUCTIVE LAMINATE
    • JPH09156023A
    • 1997-06-17
    • JP31688195
    • 1995-12-05
    • MITSUI TOATSU CHEMICALS
    • YAMAZAKI FUMIHARUFUKUDA SHINFUKUDA NOBUHIRO
    • B32B7/02B32B9/00H01B5/14
    • PROBLEM TO BE SOLVED: To inhibit a lowering of luminance at the time of continuing light emission by forming at least a transparent conductive layer composed mainly of indium oxide and a film layer composed mainly of carbon on one main face of a transparent polymer base. SOLUTION: A transparent conductive layer 20 composed mainly of indium oxide and having the thickness of 10-200nm and a film layer 30 composed mainly of carbon and having the thickness of 1-50nm are formed successively on one main face of a transparent polymer base 10. As a material used for the transparent polymer base 10, polyethylene terephthalate of superior transparency and processability or polyether sulfone of superior heat resistance is used. For the film forming method of the transparent conductive layer 20, the sputtering process can be used suitable, as a transparent conductive layer of superior transparency and conductivity can be easily processed, and for the film forming method of the film layer 30 composed mainly of carbon, the sputtering process or the plasma CVD process is more preferably used.