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    • 6. 发明专利
    • DIAMOND TOOL
    • JPH01222802A
    • 1989-09-06
    • JP4790888
    • 1988-03-01
    • OSAKA DIAMOND IND
    • UEGAMI KENJIROUNISHIMURA KAZUHITO
    • B23B27/20B24B1/00
    • PURPOSE:To prevent the fusing deposition of a chip and obtain a tool having an excellent abrasion resistance and an excellent cutting property by manufacturing the captioned tool with the rake face and the chip flowing direction thereof formed with a crystal face having a small friction coefficient and in the crystallizing direction respectively using a natural octahedral single crystal as the material. CONSTITUTION:A rake face is formed with the crystal face (110) of a natural octahedral diamond single crystal and a cutting edge in which a chip flow-out direction is the crystallizing direction is formed on this rake face. That is, if the rake face and the chip flow-out direction is formed in the crystallizing direction of a lower friction coefficient, i.e., in the direction of the face (110), the friction between the chip and the rake face of a tool is reduced, the stagnation of chips can be hard to occur, and a good cutting edge can be maintained increasing a tool life. In a threading tool for example, the rake face 1 is formed on the face (110) and a cutting edge 3 is formed on the rake face 1 in such a way that the chip flow-out direction 2 is in the direction.
    • 7. 发明专利
    • DESIGNING METHOD FOR DIAMOND TOOL
    • JPH0197503A
    • 1989-04-17
    • JP25523887
    • 1987-10-09
    • OSAKA DIAMOND IND
    • IGAWA NAOYASHIMADA SHOICHIYOSHINAGA HIROTOSHINISHIMURA KAZUHITO
    • B23B27/20C30B29/04
    • PURPOSE:To improve the cutting performance of the tool in the caption by obtaining light and dark pattern images appearing within a diamond monocrystal due to the difference in luminous efficiency with the aid of a scanning electron microscope so as to render a position in an area except for the suddenly changed portion of the pattern image or its border area, a cutting edge surface forming area. CONSTITUTION:In order to carry out the submicron analysis of a dodecahedral diamond monocrystal, a cathodeluminescence detector is built in a scanning electron microscope, and an elliptic mirror is used to collect the light so as to observe light and dark patterns which are concentrically formed along the growing direction of the crystal. If there is an outstanding difference between the light and the darkness of the light and dark patters in a cutting edge, the edge is frequently broken in the border between the light and the dark areas. Therefore, when the cutting edge is formed, it is formed in an approximately uniform luminous area or a non-luminous area except for the border area where an outstanding difference between the light and the darkness is found. Thus, the cutting performance of the cutting edge can be improved.