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1. 发明专利

JP2007214168A Chip type solid electrolytic capacitor 审中-公开
标题翻译：芯片型固体电解电容器
公开(公告)号：JP2007214168A
公开(公告)日：2007-08-23
申请号：JP2006029367
申请日：2006-02-07
申请人： Matsushita Electric Ind Co Ltd , 松下電器産業株式会社
发明人： KURANUKI KENJI , TASEI MASATOSHI , KONDO KATSUHIRO , KOBASHI MIKIO , YOSHINO TAKESHI
IPC分类号： H01G9/004 , H01G9/14 , H01G9/15
摘要： PROBLEM TO BE SOLVED: To provide a chip type solid electrolytic capacitor to be used for various electronic equipment, which can realize low ESL by solving the problem that a long lead-out distance from a capacitor element to a terminal causes high ESL.
SOLUTION: The capacitor includes a capacitor element 1 in which a conductive polymer is used for a solid electrolyte, a positive terminal 9 and a negative terminal 10 each having a top surface connected to the capacitor element 1, and an insulative exterior resin 11 covering the capacitor element 1 while the bottom surfaces of the positive and negative terminals 9 and 10 are each exposed. Surface treatment having regularity is executed on junction surfaces between the terminals 9, 10 and the capacitor element 1 and its vicinity. With this configuration, the highly reliable chip type solid electrolytic capacitor excellent in solderbility and airtightness and having achieved low ESL can be provided.
COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：为了提供一种用于各种电子设备的芯片型固体电解电容器，其可以通过解决从电容器元件到端子的长的引出距离导致高ESL的问题而实现低ESL 。解决方案：电容器包括电容器元件1，其中导电聚合物用于固体电解质，正端子9和负极端子10，其各自具有连接到电容器元件1的顶表面，以及绝缘外部树脂覆盖电容器元件1，同时露出正极和负极端子9和10的底表面。在端子9,10和电容器元件1及其附近的接合面上执行具有规则性的表面处理。通过这样的结构，能够提供可靠性和气密性优异，成本低的ESL的高可靠性的芯片型固体电解电容器。版权所有（C）2007，JPO＆INPIT

2. 发明专利

JP2005274194A Interior behavior observation device of electronic component using x-ray transmission dynamic image 审中-公开
标题翻译：使用X射线传输动态图像的电子元件的内部行为观测装置
公开(公告)号：JP2005274194A
公开(公告)日：2005-10-06
申请号：JP2004084361
申请日：2004-03-23
申请人： Matsushita Electric Ind Co Ltd , 松下電器産業株式会社
发明人： KONDO KATSUHIRO
IPC分类号： G01N23/04
摘要： PROBLEM TO BE SOLVED: To provide an apparatus capable of observing the thermal internal behavior of an invisible electronic component using X-rays.
SOLUTION: This interior behavior observation device is equipped with a heat insulating means having an X-ray generation part, or X-ray transmission image sensing part and a heat source and characterized in that the X-ray generation part and the X-ray transmission image sensing part receive no effect of the heat source and has a first heat source 2 for imparting a temperature profile 9 becoming the base of the whole to the electronic component 1 to be observed and a second heat source 3 having separate directionality capable of superposing a temperature profile curve 10 imparting a heat peak to the electronic component 1 to be observed.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：提供能够使用X射线观察不可见电子部件的热内部行为的装置。解决方案：该内部行为观察装置配备有具有X射线产生部分或X射线透射图像感测部分和热源的隔热装置，其特征在于，X射线产生部分和X 射线透射图像感测部分不受热源的影响，并且具有第一热源2，用于将温度分布9赋予整体的基底，以使待观察的电子部件1和具有分离的方向性的第二热源3 将温度分布曲线10叠加到要观察的电子部件1上的热峰。版权所有（C）2006，JPO＆NCIPI

3. 发明专利

JP2000223378A AGING APPARATUS 失效
公开(公告)号：JP2000223378A
公开(公告)日：2000-08-11
申请号：JP2584699
申请日：1999-02-03
申请人： MATSUSHITA ELECTRIC IND CO LTD
发明人： KURATANI ETSUJI , KONDO KATSUHIRO , KOBASHI MIKIO
IPC分类号： H01G13/00
摘要： PROBLEM TO BE SOLVED: To correctly decide aging malfunction in the aging apparatus for a capacitor. SOLUTION: An aging apparatus is provided with an application means for applying an aging voltage to a chip-type capacitor 1 via a protective resistor 26 and an inspection means for inspecting an aging voltage applying path to the capacitor 1, the inspection means has an alternating current supplying means for supplying an alternating current via the resistor 26 and the aging voltage applying path to the capacitor 1, a direct current supplying means for supplying a direct current to the connection point of the resistor 26 with the capacitor 1 via a resistor 70, an alternating current detecting means for detecting an AC voltage in both ends of the resistor 26 and a direct current detecting means for detecting a DC voltage in both ends of the resistor 70, and the resistance value of the resistor 70 is set higher than that of the resistor 26.

4. 发明专利

JP2007292684A Appearance/shape inspecting method and apparatus of the same 审中-公开
标题翻译：外观/形状检查方法及其设备
公开(公告)号：JP2007292684A
公开(公告)日：2007-11-08
申请号：JP2006123216
申请日：2006-04-27
申请人： Matsushita Electric Ind Co Ltd , 松下電器産業株式会社
发明人： KONDO KATSUHIRO , YAMAMOTO HAJIME
IPC分类号： G01B11/24 , G06T1/00
摘要： PROBLEM TO BE SOLVED: To provide an appearance/shape inspecting method for accurately inspecting the appearance/shape of an inspected component with a plurality of round portions, in an opaque outer layer as a portion of an outer peripheral section that has a translucent material, and to provide its apparatus.
SOLUTION: In the method for inspecting the appearance/shape of the inspected component 4, one or more illumination light guide means 5a, 5b irradiate the translucent material with an external light. The irradiation light is diffused within the translucent material. The diffused light leaks in part and is emitted to the outside from defects 6a, 6b as a light in the inspected component 4. The light, emitted from a face having the outer layer, is detected as a two-dimensional image of the outer layer by a two-dimensional camera 1.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：为了提供一种外观/形状检查方法，用于在作为外周部分的外部部分的一部分的不透明外层中用多个圆形部分精确地检查被检查部件的外观/形状，半透明材料，并提供其设备。解决方案：在用于检查被检查部件4的外观/形状的方法中，一个或多个照明光导装置5a，5b用外部光照射半透明材料。照射光在半透明材料内扩散。扩散的光部分地泄漏并作为被检测部件4中的光从缺陷6a，6b发射到外部。从具有外层的面发射的光被检测为外层的二维图像通过二维相机1.版权所有（C）2008，JPO＆INPIT

5. 发明专利

JP2000230813A VISUAL INSPECTION SYSTEM 失效
公开(公告)号：JP2000230813A
公开(公告)日：2000-08-22
申请号：JP3404599
申请日：1999-02-12
申请人： MATSUSHITA ELECTRIC IND CO LTD
发明人： SHIBUYA KIYOSHI , KONDO KATSUHIRO , SATO ATSUSHI , MORI KEIJI
IPC分类号： H05K13/08 , G01B11/24 , G01N21/85 , G01N21/89
摘要： PROBLEM TO BE SOLVED: To enable the execution of the visual inspection of components at a time without removing the components from a transparent tape and to improve workability by adhering the components to the transparent tape adhered to the opening parts of a transferring belt with the opening parts at every predetermined interval. SOLUTION: Opening parts 1 are provided for a transferring belt 2 made of a steel sheet at every predetermined interval. A substantially transparent resin tape 3 is adhered to the opening parts 1 in a bridging manner, and electronic components 4 are adhered to the tape 3 in the opening parts 1. Then the transferring belt 2 is intermittently transferred in one direction at predetermined intervals by a feed hole 5, and the upper surface 4a of the electronic component 4 is first irradiated with light to detect information from the upper surface 4a by a camera and to inspect it. Then transferring to a predetermined location, irradiation with light, and detection by the camera are repeated to perform sequential visual inspection on both peripheral side surfaces 4b, lower surface, and peripheral both inner faces 4d of the electronic component 4. Through the medium of the tape 3, it is possible to detect the visual information of the components by the illumination of the components and the camera and to eliminate the need for the removal of the components from the tape 3.

6. 发明专利

JPH0446777A ANGLE INSPECTING AND MARKING-OFF DEVICE 失效
公开(公告)号：JPH0446777A
公开(公告)日：1992-02-17
申请号：JP15197190
申请日：1990-06-11
申请人： MATSUSHITA ELECTRIC IND CO LTD
发明人： INOUE TORU , FUJIYAMA MASAZO , MORIOKA MANABU , KONDO KATSUHIRO , UNISUGA MASAHIRO
IPC分类号： G01B5/24 , B25H7/04
摘要： PURPOSE:To automate an angle inspecting and marking-off process by providing a measuring part for computing an angle of a contact point of a sliding member with multiple contact points of a work to inspect an angle of a table, and providing a marking-off pin for rotating the work at an angle on the basis of a result of the inspection after computing to draw a marking-off line at that position. CONSTITUTION:A work is rotated by a motor 21 and a sliding member 14 is fixed to make a part, where a marking-off line is to be drawn, constant against a base 29. Furthermore, an automatic marking-off unit having a marking-off pin 24 is provided to automate a series of operation from rotating the work to computing an angle and marking-off. Accurate fastening and fixing operation of a marking-off tool is thereby eliminated to improve productivity remarkably.

7. 发明专利

JP2006080113A Manufacturing device of conductive separator and manufacturing method using the same 审中-公开
标题翻译：导电分离器的制造装置及其制造方法
公开(公告)号：JP2006080113A
公开(公告)日：2006-03-23
申请号：JP2004259225
申请日：2004-09-07
申请人： Matsushita Electric Ind Co Ltd , 松下電器産業株式会社
发明人： MORI YOSHIYUKI , KONDO KATSUHIRO , SAITO TAKANAO , FUJIYAMA TERUKI , FUKUNAGA KAZUO
IPC分类号： H01G13/00 , H01G9/00 , H01G9/02
摘要： PROBLEM TO BE SOLVED: To provide the manufacturing device of a conductive separator for continuously measuring conductivity while the conductive separator is carried by solving the problem that conductivity in all regions cannot be measured in the manufacturing device of the conductive separator used for an electrolytic capacitor.
SOLUTION: The device is provided with a supply 2 supplying a band-like separator substrate 1; a polymerizer 3 sticking conductive polymer to an outer surface and a cross section of the separator substrate 1 and forming the conductive separator, a cleaner 4 removing a surplus component after polymerization; a drier 5 drying the separator after cleaning, an inspection part 6 measuring conductivity of the conductive separator 1a after drying, and a winding part 7. The device is also provided with a control unit 8 controlling supply speed of the supply 2 based on an inspection result by the inspector 6. Conductivity can continuously be measured while the conductive separator 1a is carried.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：为了提供一种导电隔板的制造装置，用于连续测量导电性，同时通过解决在用于导电隔离器的导电隔板的制造装置中不能测量所有区域的导电性的问题，电解电容器。解决方案：该装置设置有供应带状分离器基板1的供应件2; 聚合器3将导电聚合物粘附到隔板基板1的外表面和横截面并形成导电隔板;清洁器4，在聚合后除去剩余成分; 干燥后的干燥机5，干燥后的导电性分离器1a的导电性的检查部6以及卷绕部7。该装置还具备控制部8，该控制部8基于检查来控制供给2的供给速度导电分离器1a携带时可以连续测量电导率。版权所有（C）2006，JPO＆NCIPI

8. 发明专利

JPH11135386A AGING JIG FOR CHIP CAPACITOR 失效
公开(公告)号：JPH11135386A
公开(公告)日：1999-05-21
申请号：JP29827497
申请日：1997-10-30
申请人： MATSUSHITA ELECTRIC IND CO LTD
发明人： KOBASHI MIKIO , ASO HIROYUKI , KANEKO ISAO , KONDO KATSUHIRO
IPC分类号： H01G13/00
摘要： PROBLEM TO BE SOLVED: To provide an aging jig, without damaging a case of chip capacitor, capable of simply and surely mounting the capacitor, and superior in a reliability of its feed terminal contact. SOLUTION: Two sections of a side frame 2 in a strap shaped lead comb 4 integrated with the product integrally forming a plurality of chip capacitor 1 and a lead terminal 3 of the other discrete chip capacitor 1 with the other side frame 2 excised are pressure welded and supported by the feed terminal land 15 and 16 bonded and mounted on one side of a retaining plate 12, intimately making contact with a body frame 11, and the rotatable contact lever 17 and 17a electrically connected to the feed terminal land 15 and 16, and fed via a protection resistor 26. This makes the mounting structure of the jig simple and improves reliability of feeding through two series electrical connections.

9. 发明专利

JPH08178631A APPEARANCE INSPECTION DEVICE FOR CYLINDRICAL ELECTRONIC COMPONENT 失效
公开(公告)号：JPH08178631A
公开(公告)日：1996-07-12
申请号：JP32286094
申请日：1994-12-26
申请人： MATSUSHITA ELECTRIC IND CO LTD
发明人： KONDO KATSUHIRO , IIDA NARUKUNI , NAKAJIMA MASAAKI
IPC分类号： G01B11/24 , H05K13/08
摘要： PURPOSE: To provide an appearance inspection device for a cylindrical electronic component which has a simple construction and can conduct an inspection with excellent accuracy. CONSTITUTION: An appearance inspection device is made of a material with optical scattering characteristics. The appearance inspection device is composed of a U-shaped carrier jig 5 equipped with confronting arc-like holding portions holding a cylindrical electronic component 1, first light source 6 radiating light toward the cylindrical electronic component 1, second light source 7 radiating light slantwise, a camera 3 for image pickup. The appearance inspection of the cylindrical electronic component 1 can be thereby conducted with excellent accuracy.

10. 发明专利

JPH0572147A WIRING PATTERN INSPECTION DEVICE 失效
公开(公告)号：JPH0572147A
公开(公告)日：1993-03-23
申请号：JP2350992
申请日：1992-02-10
申请人： MATSUSHITA ELECTRIC IND CO LTD
发明人： KAWAMURA HIDEAKI , YAMAMOTO ATSUHARU , MARUYAMA YUJI , KAWAKAMI HIDEHIKO , ICHIKAWA IWAO , KONDO KATSUHIRO
IPC分类号： G01B11/24 , G01N21/88 , G01N21/956 , G06T1/00 , G06T7/00 , H01L21/66
摘要： PURPOSE:To realize a wiring pattern inspection device which removes the fine defect which is not desired to be detected, from the inspection object and does not give influence to the wiring pattern other than the fine defect, as for the wiring pattern inspection device which carries out the foreprocessing for previously removing the fine drawing expressed in binary expression, when the defect of the wiring pattern on a prinited circuitboard is inspected. CONSTITUTION:Only the fine drawings which are not desired to the detected among the binary system images obtained by a wiring pattern inspecting device for a printed substrate are previously removed by the contraction processing devices 202-205 as fine drawing removing means and the magnifying processing 206, and the defect inspection free from the excessive inspection which does not give influence to the wiring patterns other than the fine drawing to be removed is enabled.

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