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    • 2. 发明专利
    • Wiring board and its manufacturing method
    • 接线板及其制造方法
    • JP2005150447A
    • 2005-06-09
    • JP2003386646
    • 2003-11-17
    • Matsushita Electric Ind Co Ltd松下電器産業株式会社
    • HIGASHIYA HIDEKISUGAWA TOSHIOSASAKI TOMOE
    • H05K3/40H05K3/20H05K3/38H05K3/46
    • PROBLEM TO BE SOLVED: To provide a multilayer wiring board of an all-layer IVH structure at a high density in which, even when a wiring is made finer, a sufficiently wiring adhesion strength can be ensured; and to provide its manufacturing method. SOLUTION: The wiring board comprises electrically insulating substrates 1, 7 of one layer or more and a wiring pattern formed on at least one face of the electrically insulating substrates 1, 7. A side face of the wiring pattern is subjected to an adhesion process which differs from an adhesion process which is performed on front and rear surfaces of the wiring pattern, and the adhesion process which differs from that on the front and rear surfaces of the wiring pattern is performed on an end face of the wiring pattern, thereby further enhancing the adhesion strength of the wiring. COPYRIGHT: (C)2005,JPO&NCIPI
    • 要解决的问题:为了提供高密度的全层IVH结构的多层布线板,其中即使布线更细,可以确保足够的布线粘合强度; 并提供其制造方法。 解决方案:布线板包括一层或多层的电绝缘基板1,7和形成在电绝缘基板1,7的至少一个面上的布线图案。布线图案的侧面经受 在布线图案的端面上进行与布线图案的前表面和背面的粘附处理不同的附着处理和与布线图案的表面和背面不同的粘合处理, 从而进一步提高布线的粘合强度。 版权所有(C)2005,JPO&NCIPI
    • 3. 发明专利
    • Wiring board, its manufacturing method, and electronic part mounting body using the same
    • 接线板及其制造方法及使用其的电子部件安装体
    • JP2005093513A
    • 2005-04-07
    • JP2003321333
    • 2003-09-12
    • Matsushita Electric Ind Co Ltd松下電器産業株式会社
    • HIGASHIYA HIDEKIANPO TAKEO
    • H05K1/16H05K1/02H05K3/14H05K3/24H05K3/32H05K3/38H05K3/40
    • PROBLEM TO BE SOLVED: To realize the formation of a fine interconnect line and a stable interlayer connection simultaneously so as to provide a wiring board which displays high interlayer connection reliability and has a uniform connection resistance.
      SOLUTION: The wiring board is equipped with an electric insulating base 101, interconnect lines arranged on both the sides of the electric insulating base 101, through-holes 103 bored in the electric insulating base 101 penetrating through it, and conductors 104 filling up the through-holes 103. The interconnect lines formed on the sides of the insulating base 101 are electrically connected together with the conductors 104. At least, either of the interconnect lines formed on the sides of the base 101 is a thin film interconnect line 102 formed through a vacuum film deposition method.
      COPYRIGHT: (C)2005,JPO&NCIPI
    • 要解决的问题:同时实现精细互连线和稳定的层间连接的形成,以提供显示出高层间连接可靠性并具有均匀连接电阻的布线板。 布线板配有电绝缘基座101,布置在电绝缘基座101的两侧的布线,穿透电绝缘基座101的通孔103和填充的导体104 形成在绝缘基底101的侧面上的互连线与导体104电连接在一起。至少,形成在基底101的侧面的互连线中的至少一个是薄膜互连线 102通过真空膜沉积法形成。 版权所有(C)2005,JPO&NCIPI
    • 4. 发明专利
    • Method for judging surface of metal, printed circuit board and method for manufacturing multilayer circuit board
    • 用于判断金属表面的方法,印刷电路板和制造多层电路板的方法
    • JP2003014672A
    • 2003-01-15
    • JP2001199939
    • 2001-06-29
    • Matsushita Electric Ind Co Ltd松下電器産業株式会社
    • HIGASHIYA HIDEKIKOKUBU SHINOBU
    • G01N23/227G01N1/28G01N23/225H05K1/11H05K3/00H05K3/46
    • PROBLEM TO BE SOLVED: To provide a method for quantitatively judging the uppermost surface state of a metal to become a wiring material and to suppress a product unevenness of a printed circuit board.
      SOLUTION: The method for judging the surface of the metal comprises the steps of detecting a photoelectron to be irradiated from the surface of the metal by irradiating the surface of the metal 201 to be judged with an X-ray, and thereby analyzing the surface of the metal. The method further comprises a step of selectively removing the surface of the metal 201 to be judged. The method also comprises the steps of irradiating the exposed surface of the metal 201 exposed by the selective removal of the surface of the metal 201 with the X-ray, detecting the photoelectron irradiated from the exposed surface, and thereby analyzing the exposed surface (therein). The method also comprises the steps of comparing the surface analyzed result of the metal 201 with the analyzed result of the exposed surface, and thereby judging the surface state.
      COPYRIGHT: (C)2003,JPO
    • 要解决的问题:提供一种定量判断金属成为配线材料的最上表面状态并抑制印刷电路板的产品不均匀性的方法。 解决方案:用于判断金属表面的方法包括以下步骤:通过用X射线照射要判断的金属201的表面来检测从金属表面照射的光电子,从而分析 金属。 该方法还包括选择性地去除要判断的金属201的表面的步骤。 该方法还包括以下步骤:通过用X射线选择性去除金属201的表面而暴露的金属201的暴露表面,检测从暴露表面照射的光电子,从而分析暴露的表面(其中 )。 该方法还包括以下步骤:将金属201的表面分析结果与暴露表面的分析结果进行比较,从而判断表面状态。
    • 6. 发明专利
    • WIRING BOARD AND ITS PRODUCING METHOD
    • JP2002319751A
    • 2002-10-31
    • JP2001125398
    • 2001-04-24
    • MATSUSHITA ELECTRIC IND CO LTD
    • NAKAMURA SADASHIANDO DAIZOHIGASHIYA HIDEKI
    • H05K1/11
    • PROBLEM TO BE SOLVED: To solve a problem that, when a wiring pattern is sufficiently larger than the area of a via hole, adhesive cannot be discharged sufficiently from between the wiring pattern and an insulating basic material at the time of burying the wiring pattern in adhesive layer and, since the burying quantity of the wiring pattern is insufficient, a compressing force does not act sufficiently onto a conductive material 4 in a through hole and, since the conductor component of the conductive material 4 is not made compact easily, initial connection resistance increases and connection reliability of via hole is damaged. SOLUTION: Even if a land 2 of different area exists in the same insulation layer 1, a large connection area is ensured between the land 2 and an interlayer connector, by increasing or decreasing the area of connection face of the interlayer connector or forming an interlayer connector having a connection face of linear shape. Consequently, initial connection resistance can be settled at a low level while ensuring connection reliability of via hole.
    • 10. 发明专利
    • MANUFACTURE OF VIBRATOR AND MANUFACTURE DEVICE THEREFOR
    • JPH1041771A
    • 1998-02-13
    • JP19426896
    • 1996-07-24
    • MATSUSHITA ELECTRIC IND CO LTD
    • HIGASHIYA HIDEKI
    • H03H3/02
    • PROBLEM TO BE SOLVED: To improve the yield of a vibrator by measuring the thickness or oscillation frequency of the plural vibration parts of a diaphragm in a large plate shape, covering the specified vibration part of the diaphragm with first resist and etching the non-covered part of the first resist thereafter. SOLUTION: By directly measuring the thickness of the plural vibration parts 7 of the diaphragm 22 in the large plate shape or measuring the frequency of the plural vibration parts 7 and converting it to the thickness, the thickness distribution of the vibration parts 7 of the diaphragm 22 in the large plate shape is measured, the thickness of the respective vibration parts 7 is ranked and a part for thinning the thickness of the vibration parts 7 of the diaphragm 22 in the large plate shape by etching is specified. Thereafter, resist is applied to the entire diaphragm 22 in the large plate shape, the part for thinning the thickness of the diaphragm 7 obtained by ranking is exposed and developed and the resist is removed. Then, the vibration parts 7 is thinned by etching. Thus, the thickness dispersion of the vibration parts 7 of the diaphragm 22 in the large plate shape is made small and as a result, defects by the frequency deviation of a vibrator are suppressed.