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    • 4. 发明专利
    • Near-field optical head
    • 近场光学头
    • JP2007273086A
    • 2007-10-18
    • JP2007168729
    • 2007-06-27
    • Seiko Instruments Incセイコーインスツル株式会社
    • OMI MANABUMITSUOKA YASUYUKICHIBA TOKUOKASAMA NOBUYUKIKATO KENJINIWA TAKASHINAKAJIMA KUNIO
    • G11B7/135G01Q60/18G01Q80/00G11B7/12
    • PROBLEM TO BE SOLVED: To provide an information recording/reading device achieving information recording and reading for a high-density recording medium at high speed and high reliability by interaction between near-field light and a recording medium using a slider having a near-field optical probe. SOLUTION: The slider 1 having the near-field optical probe is positioned close to the recording medium 3. The distance is reduced between a light emitting element 2 and a microscopic aperture 7. The protrusion of the microscopic aperture is controlled from the recording medium 3 by a piezoelectric element. Accordingly, the light intensity in the probe or light detecting section is increased to increase interaction with the recording medium 3. This achieves information recording and reading apparatus with high sensitivity and accuracy. COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:提供一种信息记录/读取装置,其通过近场光和记录介质之间的相互作用,以高速度和高可靠性实现高密度记录介质的信息记录和读取,该滑块具有 近场光学探头。

      解决方案:具有近场光学探针的滑块1定位成靠近记录介质3.在发光元件2和微小孔7之间的距离减小。微小孔的突起从 记录介质3。 因此,增加探针或光检测部分中的光强度以增加与记录介质3的相互作用。这实现了具有高灵敏度和精度的信息记录和读取装置。 版权所有(C)2008,JPO&INPIT

    • 6. 发明专利
    • Near-field optical head
    • 近场光学头
    • JP2008210505A
    • 2008-09-11
    • JP2008071620
    • 2008-03-19
    • Seiko Instruments Incセイコーインスツル株式会社
    • MITSUOKA YASUYUKICHIBA TOKUOKASAMA NOBUYUKINIWA TAKASHINAKAJIMA KUNIO
    • G11B7/135
    • PROBLEM TO BE SOLVED: To improve the reliability of a head by improving its mechanical strength. SOLUTION: An edge portion 23 of a head tip portion 22 is configured by an edge 26 that is an intersection of a bottom surface 24 and a side surface 25 of a head. The bottom surface 24 and the side surface 25 intersect substantially perpendicularly. The edge portion 23 has a curved surface as viewed microscopically (nm level). A radius Rt of this curvature corresponds to a bit size that can be reproduced. As the curvature radius Rt decreases (sharper), recording can be performed with higher density. The edge portion 23 can be fabricated at an angle that is determined by a crystal face if it is formed using Si anisotropic etching. COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:通过提高机械强度来提高头部的可靠性。 解决方案:头端部22的边缘部23由作为头部的底面24和侧面25的交叉部的边缘26构成。 底面24和侧面25基本垂直地相交。 边缘部分23具有从微观(nm水平)观察的弯曲表面。 该曲率的半径Rt对应于可再现的位尺寸。 随着曲率半径Rt减小(锐化),可以以更高的密度进行记录。 如果使用Si各向异性蚀刻形成,则边缘部23可以以由晶面确定的角度制造。 版权所有(C)2008,JPO&INPIT