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    • 5. 发明专利
    • MEASURING METHOD FOR SURFACE ROUGHNESS
    • JPS62195512A
    • 1987-08-28
    • JP3808386
    • 1986-02-21
    • KOBE STEEL LTD
    • YOSHIDA KOJIMOTONISHI SUGURU
    • G01B11/30
    • PURPOSE:To improve accuracy of nondestructive measurement of surface roughness by calculating the quantity in accordance with a square root value of the sum of squares of the surface roughness based on Fourier coefficients calculated from a spatial intensity distribution of reflected light from the surface of an object to be measured. CONSTITUTION:Laser beams L are projected from a laser light source 5 and reflected light R from an aluminum drum 1 is taken in with a photodetection terminal 6 of an optical fiber cable while the photodetection terminal 6 is moved in a Y direction between F1 and F2 by a motor M3. In this way, the detected light is taken in and a detected signal E in accordance with each component of the spatial intensity distribution of the reflected light is given to a microcomputer MC. In this way, the microcomputer MC calculates each Fourier coefficient An. Next, the quantity in accordance with a square root of the sum of squares of each Fourier coefficient An is calculated based on the An. As a result, the nondestructive measurement of the surface roughness can be performed with high accuracy.
    • 6. 发明专利
    • PRECISION CUTTING DEVICE
    • JPH01281848A
    • 1989-11-13
    • JP11330088
    • 1988-05-09
    • KOBE STEEL LTD
    • MOTONISHI SUGURUYOSHIDA KOJIMATSUSHITA TOMIHARU
    • B23Q15/02
    • PURPOSE:To realize a high-precision fine groove working by constituting so that the applied voltage to a piezoelectric element is controlled in response to the detected value of a displacement gauge which has been fitted to a fine groove working tool for measuring the gap dimension between the surface of a workpiece and the end thereof. CONSTITUTION:In a tool T, a capacitance type displacement gauge 18 is fitted to the shank thereof, and at the time of cutting, the gap dimension between the end of the displacement gauge 18 and the surface of a workpiece W is measured for detecting the surface run-out of the workpiece W. This detected signal is arithmetically processed, and the applied voltage to electron ceramics is controlled so as to control the deflect on of the edge part of the tool T in response to the magnitude of the surface run-out. In other words, when the gap dimension is decreased, the applied voltage is lowered in correspondence to the value to shorten the electronic ceramics, and conversely when the gap dimension is increased, the applied voltage is raised to lengthen the electronic ceramics. Thus, even if the surface run-cut due to the rotation of the workpiece W is caused, while absorbing this, a given depth of cut can be maintained for cutting.
    • 8. 发明专利
    • TURNING TOOL
    • JPS645702A
    • 1989-01-10
    • JP16419887
    • 1987-06-29
    • KOBE STEEL LTD
    • YOSHIDA KOJIMOTONISHI SUGURU
    • B23B27/00
    • PURPOSE:To aim at miniaturization of a fine turning device by providing a grooved section between the cutting part in a plate-spring structure which is enabled to bend in the cutting direction and the shank, and then placing a piezoelectric element in the grooved section so that it is sandwiched between the shank and the cutting part. CONSTITUTION:On the cutting part 1 provided with a cutting blade 4 is formed a slit 5. The slit 5 is comprised of a square-hole-like portion 5' and a clearance- like portion 5'' which is elongated backward and forward, and it is constituted so that a parallel plate spring is formed. Between the cutting part 1 and a stiff shank 2 is provided a grooved section 3, and then, in the grooved section 3 is placed a piezoelectric element 6 so that it is sandwiched between the cutting part 1 and the shank 2. By applying voltage to the piezoelectric element 6, the cutting part 1 in a plate-spring structure is elastically deformed so that it is processed by a fine turning. Accordingly, through intensively combining the functions of a fine turning processing into one tool, it can be miniaturized, and can also be applied to general machine tools.
    • 9. 发明专利
    • SURFACE ROUGHNESS MEASURING INSTRUMENT
    • JPS6319508A
    • 1988-01-27
    • JP16428086
    • 1986-07-11
    • KOBE STEEL LTD
    • YOSHIDA KOJIMOTONISHI SUGURU
    • G01B11/30
    • PURPOSE:To accurately measure the surface roughness of an object to be measured with a high precision by inserting a light transmissibility distributed element to the optical path from the object to be measured to an array type sensor. CONSTITUTION:A laser oscillator 1 is provided as the light source, and a laser beam L from this oscillator 1 is projected to the surface of an aluminum drum 2 as the object to be measured through an incident light adjusting filter 10. A light transmissibility distributed filter 4 is inserted to the optical path of a reflected light R from the surface of the drum 2 to an array type sensor 3. The light transmissibility of this filter is so distributed that it is minimum in an incidence center C of a positive reflected light R0 and is successively increased according as going away from this center C in the direction of an arrow X. Thus, the reflected light R which passes the filter 4 and is received by the sensor 3 is converted to a photodetection signal for each light receiving cell of a CCD, and this signal is amplified by an amplifying circuit 5 and is digitized by an A/D converter 6 and is given to a microcomputer CPU 7. The CPU 7 operates the surface roughness of the drum based on this photodetection signal.
    • 10. 发明专利
    • PHOTODETECTOR
    • JPS62179619A
    • 1987-08-06
    • JP2097286
    • 1986-01-31
    • KOBE STEEL LTD
    • YOSHIDA KOJIMOTONISHI SUGURU
    • G01J1/42
    • PURPOSE:To enable the securing of a broad dynamic range with a single unit, by changing a voltage to be applied to a photoelectric multiplier tube according to a light detection output. CONSTITUTION:A light detection current Ip output from a photoelectric multiplier tube 1 according to the quantity of light l to be detected, converted into a voltage E0 with a current-voltage converter 3 of a detection circuit 2 and a high voltage is applied via a switch SW from a power source 5. Consequently, the voltage 5 supplies the voltage E0 by reducing the absolute value of a small driving voltage (-VH) all for the larger voltage E0. Therefore, the sensitivity of the multiplier tube 1 is automatically heightened for less quantity of light and it automatically lowered for a larger quantity of light, thereby compressing variation of the detection voltage E0. This can secure a broad dynamic range with a single photodetector.