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1. 发明专利

JP2002064000A LIQUID METAL LOOP 失效
公开(公告)号：JP2002064000A
公开(公告)日：2002-02-28
申请号：JP2000245742
申请日：2000-08-14
申请人： JAPAN ATOMIC ENERGY RES INST , ISHIKAWAJIMA HARIMA HEAVY IND
发明人： TAKEUCHI HIROSHI , NAKAMURA HIROO , NAKAMURA HIDEO , MIYAUCHI YASUYUKI , ANPO NORIAKI , KADOI HIDEO
IPC分类号： G21K5/02 , G21K5/08 , G21K5/10 , H05H3/06 , H05H6/00
摘要： PROBLEM TO BE SOLVED: To reduce the height of a liquid metal loop. SOLUTION: A target 1 of a hollow structure, in which a deuteron beam D can be incident, a circulation pump 2 for feeding a liquid metal Li to an inlet 6 of the target 1, a quench tank 4 which communicates with an outlet 7 of the target 1 and stores the liquid metal Li to form a free level 9, and a pipe line 11 communicating at its upstream end in the flowing direction of the liquid metal with the inner bottom 10 of the quench tank 4 and connected at its downstream end in the flow direction of the liquid metal to a suction port 8 of the circulation pump 2 are installed, an auxiliary pump 12 for feeding the liquid metal Li from the quench tank 4 to the suction port 8 of the circulation pump 2 is provided just under the quench tank 4 of the pipe line 11.

2. 发明专利

JPH03122589A APPARATUS FOR MEASURING PARTICLE BEAM 失效
公开(公告)号：JPH03122589A
公开(公告)日：1991-05-24
申请号：JP25971989
申请日：1989-10-04
申请人： JAPAN ATOMIC ENERGY RES INST
发明人： OBARA YOSHIHIRO , OKUMURA YOSHIKAZU , TAKEUCHI HIROSHI
IPC分类号： G01T1/29 , G21K5/04 , H01J37/04
摘要： PURPOSE:To automate the measurement of four-dimensional emittance and to enhance measuring accuracy by integrating a pinhole, a two-dimensional image sensor detecting the intensity distribution of a particle beam and a photoelectric converter. CONSTITUTION:The intensity distribution image formed by this measuring apparatus becomes the signal of the image output to a television screen by a photoelectric converter such as a CDD camera to be stored in a digital video memory 7. A computer 8 calculates the projection angle of the image of a two-dimensional image sensor 2 or the intensity distribution of a particle beam on the basis of the memory of the digital video memory 7. In this case, a pinhole 2 is set to the arbitray position within the cross-section (x-y cross-section) of a particle beam B by driving a movable part 5 and, by performing the above mentioned operation, (x', y') with respect to the position of the pinhole 2 or the intensity distribution of the particle beam can be easily calculated.

3. 发明专利

JPS6453200A ION GENERATOR 失效
公开(公告)号：JPS6453200A
公开(公告)日：1989-03-01
申请号：JP20985287
申请日：1987-08-24
申请人： JAPAN ATOMIC ENERGY RES INST , TOSHIBA CORP
发明人： TAKEUCHI HIROSHI , SUGIYAMA TAKASHI
IPC分类号： H01J27/02 , G01N23/225 , G21G4/04 , H01J37/08 , H01J49/10
摘要： PURPOSE:To reduce the size of a generator by fixing an ion source vessel to the generator in such a manner that the particle flow hole thereof aligns to the particle orbit and providing a spiral or cylindrical ion forming member to the inside of the ion source vessel in such a manner that the axial center thereof aligns to the particle orbit. CONSTITUTION:The supply of gas is stopped and the particles entering a vacuum vessel 1 are released from a particle outlet 14 through the flow hole 2b of the ion source vessel 2, the axial center part of filaments 4 and a vessel flow hole 2c when ions are not generated. The gas is supplied from a gas cylinder 11 into the vessel 2 and the filaments 4 are energized, simultaneously with which an electron drawing out power supply 8 and an ion drawing out power supply 9 are operated in the stage of generating the ions. The thermions (e) released from the filaments 4 in such a manner are accelerated by the power supply 8, by which the gas is electrolytically dissociated and the ions (i) are generated. The ions are released by the power supply 9 to the outside. The size of the generator is reduced and the safety thereof is improved if the generator is constituted in such a manner.

4. 发明专利

JPS6452372A ANALYZER FOR PHYSICAL QUANTITY OF NEUTRAL PARTICLE 失效
公开(公告)号：JPS6452372A
公开(公告)日：1989-02-28
申请号：JP20985387
申请日：1987-08-24
申请人： JAPAN ATOMIC ENERGY RES INST , TOSHIBA CORP
发明人： TAKEUCHI HIROSHI , KITA YOSHIO , HAYASHI KAZUO
IPC分类号： H01J47/12
摘要： PURPOSE:To make neutral particles not get out from detectors on low energy side by electrically insulating one of a stripping cell and a vacuum chamber from the other and applying a constant voltage to it. CONSTITUTION:One of a stripping cell 2 for ionizing neutral particles to be analyzed and a vacuum chamber 1 including a magnetic pole 3 and an electrode 5 for giving a specific orbital operation to the particles ionized by this cell 2 and plural arranged detectors 6 for detecting the particles is electrically insulated from the other, and constant additional energy is further added to the energy of the ionized particles. Therefore, if the position of the detector of the minimum energy channel stays constant, the rotational radius of the ions incident in the minimum energy channel at the magnetic pole 3 is lessened by the additional energy. Accordingly, ion particles do not get out from the detectors 6, since may do not receive any end face effect at the electrode 5.

5. 发明专利

JPS63252288A SHIELDING DEVICE FOR TURBO-MOLECULAR PUMP 失效
公开(公告)号：JPS63252288A
公开(公告)日：1988-10-19
申请号：JP8625387
申请日：1987-04-08
申请人： JAPAN ATOMIC ENERGY RES INST , TOSHIBA CORP
发明人： TAKEUCHI HIROSHI , KITA YOSHIO
IPC分类号： G21B1/00 , F04D19/04 , G21B1/05

6. 发明专利

JPS57152656A NEUTRAL PARTICLE DETECTING DEVICE 失效
公开(公告)号：JPS57152656A
公开(公告)日：1982-09-21
申请号：JP3909181
申请日：1981-03-18
申请人： TOKYO SHIBAURA ELECTRIC CO , JAPAN ATOMIC ENERGY RES INST
发明人： KONAGAI CHIKARA , MIURA IWAO , KIMURA TOYOAKI , MATOBA TOORU , TAKEUCHI HIROSHI
IPC分类号： G01T1/36 , G01N27/62 , G01T3/00 , H01J49/00 , H01J49/06 , H01J49/10 , H01J49/26 , H01J49/44
摘要： PURPOSE:To detect low-energy neutral particles by means of a small device by deflecting a charged particle beam according to the momentum, accelerating the deflected charged particle beam by means of an electrostatic field, and generating pulse signals with pulse-wve heights corresponding to the magnitude of the mass or kinetic energy. CONSTITUTION:A neutral particle beam 11, after being made incident upon a charge exchanging part 1 and converted into a charged particle beam 12, is deflected with a momentum analyzing magnet 7 according to the momentum of the charged particles before being discharged from the magnet 7. After that, the deflected charged particles are passed through electrodes 23 and 24, and are made incident upon a semiconductive detecting device 21. The device 21 consists of semiconductive detectors 22A-22H of a silicone surface barrier type, and produces pulse signals with pulse-wave heights corresponding to the magnitude of the mass or kinetic energy.

7. 发明专利

JPS5537956A CHARGE EXCHANGING REACTION EQUIPMENT 失效
公开(公告)号：JPS5537956A
公开(公告)日：1980-03-17
申请号：JP11135278
申请日：1978-09-12
申请人： TOKYO SHIBAURA ELECTRIC CO , JAPAN ATOMIC ENERGY RES INST
发明人： SUKENOBU SATORU , MATOBA TOORU , KIMURA TOYOAKI , TAKEUCHI HIROSHI
IPC分类号： G21K1/14 , H05H1/00 , H05H1/22 , H05H3/00

8. 发明专利

JPS6453190A NEUTRON PARTICLE MEASURING INSTRUMENT 失效
公开(公告)号：JPS6453190A
公开(公告)日：1989-03-01
申请号：JP20979187
申请日：1987-08-24
申请人： JAPAN ATOMIC ENERGY RES INST , TOSHIBA CORP
发明人： TAKEUCHI HIROSHI , KASAI KENJI
IPC分类号： G01T3/00 , H01J47/12
摘要： PURPOSE:To improve the accuracy of the reproducibility of plasma by measuring neutron particles and an accompanying background at the same time, and securely removing the background at the time of from the energy distribution. CONSTITUTION:Ionized charged particles are made incident on the particle analyzing mechanism 14 of a vacuum container 13, deflected by a quantity corresponding to a charged particle energy in an electric or magnetic field produced by the particle analyzing mechanism 14, and projected to a projection side where slits 15 are formed. At this time, a charged particle detector 17 for neutron particle measurement detects charged particles passing through a window part 16 and an electronic circuit 19 counts them. Parts where tracks of charged particles are cut off by the slits 15, on the other hand, are made incident on a charged particle detector 18 for background measurement and an electronic circuit 20 processes them. Thus the background is securely removed and the state of plasma is reproduced with high accuracy.

9. 发明专利

JPS63205043A CHANNEL TYPE SECONDARY ELECTRON MULTIPLYING DEVICE 失效
公开(公告)号：JPS63205043A
公开(公告)日：1988-08-24
申请号：JP3706287
申请日：1987-02-20
申请人： JAPAN ATOMIC ENERGY RES INST , TOSHIBA CORP
发明人： TAKEUCHI HIROSHI , HAYASHI KAZUO
IPC分类号： H01J43/24 , H01J43/30
摘要： PURPOSE:To suppress discharge growth in an inner surface of a secondary electron multiplying device by providing a power source current detecting means for detecting an output current of a high voltage power source which accelerates secondary electrons, and a power source voltage controlling means for controlling an output voltage of the high voltage power source. CONSTITUTION:An output voltage of a high voltage power source 11 is raised by a power source voltage controlling means 15 based on a time constant set-up in advance. Next, an output current of a high voltage power source 11 is monitored by a power source current detecting means 13 so that whether creeping discharge is growing or not is determined by a rise in the output current. Accordingly, in a transient process where the output voltage of the high voltage power source 11 is gradually applied based on the time constant, raising the output voltage of the high voltage power source 11 is stopped when the output current is in excess of its prescribed value, and raising the voltage is again started when the creeping discharge disappears to make the output current the prescribed value or less, and these operations are repeated. Hence, the applied voltage can be made to attain to the prescribed level without destroying the device.

10. 发明专利

JPS5826443A NEUTRAL PARTICLE DETECTOR 失效
公开(公告)号：JPS5826443A
公开(公告)日：1983-02-16
申请号：JP12511681
申请日：1981-08-10
申请人： JAPAN ATOMIC ENERGY RES INST , TOKYO SHIBAURA ELECTRIC CO
发明人： KIMURA TOYOAKI , TAKEUCHI HIROSHI , MATOBA TOORU , KONAGAI CHIKARA
IPC分类号： G01T1/36 , G01T1/29 , G01T3/00 , H01J47/00 , H01J49/06 , H01J49/10 , H01J49/20 , H01J49/26 , H01J49/44 , H01L31/09
摘要： PURPOSE:To obtain a captioned apparatus which permits pulse signal and pulse height to be detected and posseses a superior energy resolving power and can be miniaturized easily by converting the neutral particle beam to the charged particle beam by means of a solid charge exchanger and allowing the parallel by emitted particle beam to collide with the surface of the barrier of a semiconductor detector, in the neutral particle detector which performs mass analysis, energy analysis, and counting of particle number for neutral hydrogen particles. CONSTITUTION:A metal film 15 converts the incident neutral particle beam 12 to the positive-charged particle beam 13, preserving the momentum and the kinetic energy. The parallel by incident particle beams 17r, 17s- which form a perpendicular orbit to the charged particle beam 13 are obtained, and the surface-barrier type silicone semiconductor detectors, 19r, 19s,- are arranged so that the particle beams irradiated in parallel can be received. The beam 17r vertically collides with the metal-evaporated surface 21r of the semiconductor detector 19r and releases the kinetic energy, which is amplified by an amplifier 22r, and the pulse signal 26r having a pulse height is generated from a multi- wave-height analyzer 23r. Also the corresponding kinetic energy can be detected continuously, and the energy resolving power is improved, compared to the conventional apparatus.

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