会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 10. 发明专利
    • ION BEAM MEASURING DEVICE
    • JPS6237854A
    • 1987-02-18
    • JP17588385
    • 1985-08-12
    • HITACHI LTD
    • FUKUDA SHINJIMIURA YOSHIO
    • H01J37/04H01J37/304H01J37/317
    • PURPOSE:To simultaneously measure the current density and energy density of an ion beam, by embedding an ion beam current detector and an ion beam energy detector in a bolt to secure the detectors and electrically insulate them from each other. CONSTITUTION:An ion beam is introduced into a cup 101 and collides against the bottom of the cup so that most of ions are injected into the cup and the other of them are reflected by the bottom of the cup, collide against the wall of the cup and are injected into the cup. The injected ions reach an electric input terminal 80, in the form of an ion current, through an electroconductive cylindrical sheath 701 embedded in an electroconductive bolt 102 screwed into the cup 101. The ions then flow into a measuring instrument 90 in the air. The ion current is measured by the instrument 90 to determine the current density and energy density of the ion beam in terms of the cross-sectional area of the ion beam introduced into the cup 101.