专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明专利

JPS61241944A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE 失效
公开(公告)号：JPS61241944A
公开(公告)日：1986-10-28
申请号：JP8250285
申请日：1985-04-19
申请人： HITACHI LTD , HITACHI MICROCUMPUTER ENG
发明人： ISHIKAWA MAKOTO , KITAMURA YUKINORI
IPC分类号： H01L21/3205 , H01L23/52 , H01L21/88
摘要： PURPOSE:To equalize operating currents to many IILs, to reduce the dispersion in characteristics among the IILs, and to stabilize the operation, by forming wirings, which are branched in a tree form by the multilayer wirings, and distributing and supplying the operation currents to many IILs. CONSTITUTION:A wiring 30 at the third uppermost is formed in a branched tree form. The base end part of the trunk of the wiring is connected to a constant-current circuit 1 at a current feeding point P. The branches of the wiring are separated into the branch parts having the approximately the same length. The tip of each branch part is connected to the central part of each wiring 20 at the second layer via each through hole TH2. The wirings 20 at the second layer have the equal length. Both end parts of each wiring are connected to wirings 11 at the first layer via through holes TH1. Therefore the difference in wiring length from the current feeding point P to each integrated injection logic (IIL) becomes small. The difference in wiring resistances, which are present in series between the current feeding point and the IILs, becomes also small. Thus the feeding conditions of the operating currents to many IILs become uniform. The dispersion in characteristics among the IIls is made small, and the operation can be stabilized.

2. 发明专利

JPS61220449A SEMICONDUCTOR DEVICE 失效
公开(公告)号：JPS61220449A
公开(公告)日：1986-09-30
申请号：JP6064285
申请日：1985-03-27
申请人： HITACHI LTD , HITACHI MICROCUMPUTER ENG
发明人： HAIJIMA MIKIO , ISHIKAWA MAKOTO , TAKIGAWA AKIRA , KONDO SHIZUO , TANIZAKI YASUNOBU
IPC分类号： H01L21/822 , H01L21/8226 , H01L27/02 , H01L27/04 , H01L27/082
摘要： PURPOSE:To obtain a highly integrated, highly reliable device, by forming a recess part in the surface of a chip, forming a thin digital circuit in the inner part, forming a thick analog circuit at the peripheral pat in a concentrated manner, implementing high speed and high performance of the digital circuit, and implementing high withstanding voltage of the analog circuit. CONSTITUTION:An n epitaxial layer 2 is provided on a p substrate 1, in which an n layer 3 is embedded. Selective etching is performed and a recess part 4 is formed at the central part. The central part 5 of the layer 2 is thin, and a peripheral part 6 is thick. A digital element such as I L is provided at the thin central part. The impurity distribution in the cross section of a transistor in the reverse direction is formed in a steep form. An operating margin is made high and the high speed I L is implemented. Meanwhile a bipolar n-p-n transistor at a linear part is formed in the thick peripheral part 50 that enough withstanding voltage is provided. In this configuration, stepped parts due to the irregularities of the surface are reduced, and wire breakdowns are decreased. This is especially useful when an organic insulating film is formed on the surface and multilayer wiring is provided.

3. 发明专利

JP2007265415A Method and apparatus for simulating microcomputer-based systems 有权
标题翻译：用于模拟基于微处理器的系统的方法和装置
公开(公告)号：JP2007265415A
公开(公告)日：2007-10-11
申请号：JP2007087090
申请日：2007-03-29
申请人： Hitachi Ltd , 株式会社日立製作所
发明人： ISHIKAWA MAKOTO , OBO SHIGERU , SAIKALIS GEORGE , MCCUNE DONALD J , BORG JONATHAN
IPC分类号： G05B17/02 , G05B13/04 , G06F11/28
CPC分类号： G05B17/02 , Y02T10/82
摘要： PROBLEM TO BE SOLVED: To provide a method and apparatus for developing microcomputer-based systems.
SOLUTION: A controller model 12 having at least one parameter is simulated and, similarly, a plant model 14 having at least one parameter and controlled by the controller model 12 is simulated. A user interface processor 30 then has access to the parameters of the controller model 12 and the plant model 14 and optionally suspends the execution of the controller model 12 and the plant model 14 in response to a trigger event. The user interface processor 30 determines the status of the controller model parameters and/or the plant model parameters at the time of the trigger without altering the controller model parameters or plant model parameters or the program code of the controller model.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供用于开发基于微处理器的系统的方法和装置。解决方案：模拟具有至少一个参数的控制器模型12，并且类似地，模拟具有至少一个参数并由控制器模型12控制的设备模型14。然后，用户界面处理器30可以访问控制器模型12和工厂模型14的参数，并且可选地中止响应于触发事件的控制器模型12和工厂模型14的执行。用户界面处理器30在触发时确定控制器模型参数和/或工厂模型参数的状态，而不改变控制器模型参数或工厂模型参数或控制器模型的程序代码。版权所有（C）2008，JPO＆INPIT

4. 发明专利

JPS6059532B2 失效
公开(公告)号：JPS6059532B2
公开(公告)日：1985-12-25
申请号：JP11786278
申请日：1978-09-27
申请人： HITACHI LTD
发明人： INOE KATSU , ISHIKAWA MAKOTO
IPC分类号： G01J3/42 , G01J1/24

5. 发明专利

JPS6026169B2 失效
公开(公告)号：JPS6026169B2
公开(公告)日：1985-06-22
申请号：JP6331577
申请日：1977-06-01
申请人： HITACHI LTD
发明人： ISHIKAWA MAKOTO , TAIJI YOSHIO
IPC分类号： G01J3/06 , G01J3/08 , G01J3/12 , G01J3/18

6. 发明专利

JPS5752832A Infrared spectro-photometer 失效
标题翻译：红外光谱仪
公开(公告)号：JPS5752832A
公开(公告)日：1982-03-29
申请号：JP12725680
申请日：1980-09-16
申请人： Hitachi Ltd
发明人： ISHIKAWA MAKOTO , SHIMAZAKI TSUNEO
IPC分类号： G01J3/42 , G01J1/16
CPC分类号： G01J1/16
摘要： PURPOSE:To enhance measuring accuracy in a simple constitution, by directly comparing the optical quntity in a corresponding light path and the optical quantity in a specimen light path electically, and obtaining the transmittance of the specimen. CONSTITUTION:The light from the corresponding light path 2 and the light from the specimen light path 3 are taken out by a rotary mirror 26 under the state the phase difference of 90 deg. is substantially exists. The light from the rotary mirror 26 is divided by a spectroscope 7 and sensed by a heat type infrared sensor 8. The output of the sensor 8 is sent to synchronous rectifying amplifier 24 via a low frequency amplifier 9, and the corresponding output signal and the specimen output signal are obtained. Said signals are given to a rate computing amplifier 25, and the rate computation of both signal is carried out. The result is given to a recording pen 18 via recording amplifier, and the transmittance of the specimen 5 is recorded on recording paper 19.
摘要翻译：目的：为了通过直接比较对应的光路中的光学质量和电子样本光路中的光学量，并且获得样品的透射率，以简单的结构提高测量精度。构成：在90度的相位差的状态下，来自相应光路2的光和来自检体光路3的光被旋转镜26取出。基本上存在。来自旋转镜26的光由分光镜7分开，并由热式红外传感器8感测。传感器8的输出经由低频放大器9发送到同步整流放大器24，相应的输出信号和样品输出信号。所述信号被提供给速率计算放大器25，并且执行两个信号的速率计算。结果通过记录放大器给予记录笔18，并且将样本5的透射率记录在记录纸19上。

7. 发明专利

JPS5692431A TABLET MOLDING EQUIPMENT FOR INFRARED SPECTROPHOTOMETER 失效
公开(公告)号：JPS5692431A
公开(公告)日：1981-07-27
申请号：JP16835379
申请日：1979-12-26
申请人： HITACHI LTD
发明人： ISHIKAWA MAKOTO , TAIJI YOSHIO
IPC分类号： G01N21/35 , B30B11/08 , G01N1/28 , G01N1/36 , G01N21/01
摘要： PURPOSE:To make handling easy, by mounting a tablet support metallic jig, which produces tablets directly internally, onto a sample holder. CONSTITUTION:Tablet support metallic jig 15 is prepared which has such outside form that it can be mounted on sample holder 12 and has the center hole to which base mold 4 and upper mold 5 can be fitted. Tablet support metallic jig 15 with base mold 4 fitted is put on exhaust stand 13, and the mixed powder of raw materials is put on base mold 4, and upper mold 5 is fitted, and external cylinder 14 with pressure bar 3 is put on exhaust stand 13 through O ring 8a, and the mixed powder is molded into tablet 6 by pressure. Next, tablet support metallic jig 15 to which tablet 6 is fixed is removed from exhaust stand 13 and is mounted on sample holder 12 directly. As a result, since it is unnecessary to put tablet 6 into another tablet holder or the like afresh for the purpose of mounting tablet 6 onto sample holder 12 after generating tablet 6 by pressure molding, handling is facilitated, and the break of tablet 6 is prevented.

8. 发明专利

JPS5548625A DOUBLE LUMINOUS FLUX SPECTROPHOTOMETER 失效
公开(公告)号：JPS5548625A
公开(公告)日：1980-04-07
申请号：JP12244978
申请日：1978-10-03
申请人： HITACHI LTD
发明人： INOUE TSUYOSHI , ISHIKAWA MAKOTO , TAIJI YOSHIO
IPC分类号： G01J3/42
摘要： PURPOSE:To obtain the accurate spectrum free from the disturbance absorption which is proper to the solvent by giving correction to the reference spectrum with the correction coefficient with which the coincidence is secured between the sample and reference spectra at the waveform position where no absorption is caused by the sample. CONSTITUTION:The cell containing the sample and the solvent is placed in the sample luminous flux after memorizing the reference spectrum into memory device 85. And change-over switches 82 and 92 are set to the input and output sides of divider 86 each. In accordance with the waveform scanning of the spectroscope, the signal of the sample spectrum received the logarithm conversion is supplied to divider 86 along with the reference spectrum synchronized with the wavelength scanning within device 85, and the ratio between them is obtained to be recorded via output converter 87. The spectrum features nearly 1 of the absorption luminance ratio with the wave number which is free from absorption caused by the sample. Then the spectroscope is set to the wave number with switch 91 turned on, and the ratio of the both spectra at that wave number is registered to coefficient register 84. And switch 92 is set toward the output side of subtractor 87 to carry out the waveform scanning. In this way, the accurate sample spectrum can be obtained.

9. 发明专利

JPS53149373A FILTER CHANGEOVER MECHANISM OF SPECTROPHOTOMETER 失效
公开(公告)号：JPS53149373A
公开(公告)日：1978-12-26
申请号：JP6331577
申请日：1977-06-01
申请人： HITACHI LTD
发明人： ISHIKAWA MAKOTO , TAIJI YOSHIO
IPC分类号： G01J3/06 , G01J3/08 , G01J3/12 , G01J3/18
摘要： PURPOSE:To provide a changeover device of high reliability with simple constitution by using a multistage cam.

10. 发明专利

JPS5367484A OPTICS SYSTEM FOR TWO LIGHT FLUX SPECTROPHOTOMETER 失效
公开(公告)号：JPS5367484A
公开(公告)日：1978-06-15
申请号：JP14222676
申请日：1976-11-29
申请人： HITACHI LTD
发明人： ISHIKAWA MAKOTO , INOUE TSUYOSHI
IPC分类号： G01J3/42 , G01N21/31
摘要： PURPOSE:To enable to carry out the measurement stabilizeed base line with a high accuracy, by providing a couple of single optical system, constituted so as the image of light source to be formed between the first and second concave mirror and at the situation of incidence slit.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式