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    • 4. 发明专利
    • Braking device of automobile, controller thereof, and control program thereof
    • 汽车制动装置,其控制器及其控制程序
    • JP2003048523A
    • 2003-02-18
    • JP2001234917
    • 2001-08-02
    • Hitachi Ltd株式会社日立製作所
    • SATO KAZUHIKOKOJIMA TAKAOMINOWA TOSHIMICHI
    • B60N3/06B60T7/04B60T8/96
    • PROBLEM TO BE SOLVED: To accurately perform acceleration and deceleration of a vehicle in accordance with driver's intention even if a footrest function is uncontrollable. SOLUTION: A braking device of the automobile its provided with wheel braking force addition mechanisms 4, 6, 9, 10a to 10d for applying a braking force to each wheel by inputting a braking command in accordance with an additional force applied to a brake pedal 1, a footrest mechanism 3 for adding a reaction force to the brake pedal 1, a pedal additional force sensor 2 for detecting an additional force applied to the brake pedal 1, and a control unit 8 for adding a braking force to each wheel by outputting a braking command to an active brake booster 4 of the wheel braking force addition mechanism when an additional force detected by the sensor 2 exceeds a value determined in advance while the footrest mechanism 3 functions.
    • 要解决的问题:即使脚踏功能不可控,也可以根据驾驶员的意图精确地执行车辆的加速和减速。 解决方案:汽车的制动装置具有车轮制动力添加机构4,6,9,10a至10d,用于通过根据施加到制动踏板1的附加力输入制动指令向每个车轮施加制动力 ,用于向制动踏板1添加反作用力的脚踏机构3,用于检测施加到制动踏板1的附加力的踏板附加力传感器2,以及用于通过输出制动踏板1向每个车轮添加制动力的控制单元8 当传感器2检测到的附加力超过了搁脚机构3起作用时预先确定的值时,制动指令到车轮制动力添加机构的主动制动助力器4。
    • 10. 发明专利
    • ELECTRON BEAM LITHOGRAPHY SYSTEM
    • JPH1079335A
    • 1998-03-24
    • JP23391296
    • 1996-09-04
    • HITACHI LTD
    • KATO MAKOTOMATSUZAKA TAKASHISATO KAZUHIKO
    • G03F7/20H01J37/305H01L21/027
    • PROBLEM TO BE SOLVED: To mount a batch pattern on the second mask as much as possible without wastefullness by a method wherein an aperture part is selected from the first mask having the aperture parts of a plurality of kinds of sizes in conformity with the size of the batch pattern to be formed by the second mask. SOLUTION: A batch pattern is selected by a batch pattern selecting mechanism, and a lithography pattern is projected on the material to be processed. At this point, the first mask 17, having a plurality of kinds of aperture parts 18, 19 and 20, is used. As a result, aperture parts 22, 23 and 24, having the pitch optimum to the respective size, can be arranged without waste on the second mask 21. Although a mechanical selective structure is shown on an aperture selective structure, and also an example of an electromagnetic selective structure is shown on a batch pattern, the combination of thereof can be made freely. Also, the aperture part of the first mask 17 illustrates the case of three kinds, but any number of kinds may be used. Besides, the batch patterns 22, 23 and 24 indicate by a constant pitch respectively, but a random pitch may be used.