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    • 3. 发明专利
    • Apparatus and method for measuring particle shape, and apparatus and method for determining asbestos
    • 用于测量颗粒形状的装置和方法,以及用于测定ASBESTOS的装置和方法
    • JP2009002751A
    • 2009-01-08
    • JP2007162960
    • 2007-06-20
    • Graduate School For The Creation Of New Photonics Industries学校法人光産業創成大学院大学
    • ISHII KATSUHIRO
    • G01N15/14
    • PROBLEM TO BE SOLVED: To provide a particle shape measuring apparatus for suitably obtaining the shape of particles to be measured called, for example, as nano-particles.
      SOLUTION: The apparatus includes a light irradiation part 2 for irradiating particles Z to be measured, provided at a position (t) to be irradiated, with irradiation light L with a predetermined wavelength having polarization components independent in three directions to produce Rayleigh scattering, a light detection part 3 for separating scattered light, which is produced by irradiating the particles Z to be measured with the irradiation light L to produce Rayleigh scattering, into different polarization components in six directions to detect the light intensities of the respective polarization components and a polarizability component operation part 4c for calculating the polarizability component of the particles Z to be measured on the basis of the light intensities of the different polarization components in three directions of the irradiation light L and the light intensities of the different polarization components in six directions of the scattered light. The shape of the particles Z to be measured is calculated on the basis of the polarizability component of the particles Z to be measured calculated in the polarizability component operation part 4c.
      COPYRIGHT: (C)2009,JPO&INPIT
    • 要解决的问题:提供一种用于适当地获得称为例如纳米颗粒的被测量颗粒的形状的颗粒形状测量装置。 解决方案:该装置包括:用于照射被照射的位置(t)的被照射粒子Z的光照射部分2具有预定波长的具有偏振分量独立于三个方向的预定波长的照射光L产生瑞利 散射,用于分离散射光的光检测部3,其通过用照射光L照射待测量的颗粒Z以产生瑞利散射而产生,以在六个方向上分别成为不同的偏振分量,以检测各偏振分量的光强度 以及极化率分量运算部4c,用于根据照射光L的三个方向的不同偏振分量的光强度和六种不同偏振分量的光强度,计算待测粒子Z的极化率分量 散射光的方向。 基于在极化率分量运算部4c计算出的待测粒子Z的极化率分量来计算要测量的粒子Z的形状。 版权所有(C)2009,JPO&INPIT
    • 6. 发明专利
    • Wavelength sensor
    • 波长传感器
    • JP2009128193A
    • 2009-06-11
    • JP2007303561
    • 2007-11-22
    • Graduate School For The Creation Of New Photonics Industries学校法人光産業創成大学院大学
    • ISHII KATSUHIROHANAYAMA RYOHEI
    • G01J9/02G01J3/26
    • PROBLEM TO BE SOLVED: To provide a wavelength sensor with simple constitution, while having high resolution. SOLUTION: The wavelength sensor detecting the wavelength of light includes: a collimate lens 1; an interference instrument 4 which emits interference light due to the interference with the light from the collimate lens 1, which includes two facing reflecting surfaces, and in which the distance between the reflecting surfaces varies continuously; a photodetector 5 for detecting the interference light transmitted through the interference instrument 4; and a reflecting surface adjustment mechanism for adjusting the distance between the reflecting surfaces and the angle between reflecting plates. COPYRIGHT: (C)2009,JPO&INPIT
    • 要解决的问题:提供具有简单结构的波长传感器,同时具有高分辨率。 检测光的波长的波长传感器包括:准直透镜1; 干涉仪4,其由于与来自准直透镜1的光的干涉而发射干涉光,该准直透镜1包括两个相对的反射面,反射面之间的距离连续变化; 用于检测透过干涉仪4的干涉光的光检测器5; 以及用于调节反射面之间的距离和反射板之间的角度的反射面调节机构。 版权所有(C)2009,JPO&INPIT