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    • 1. 发明专利
    • Packet transfer circuit in ip over atm
    • ATM中的IP分组传输电路
    • JP2004080334A
    • 2004-03-11
    • JP2002237347
    • 2002-08-16
    • Fujitsu LtdNippon Telegr & Teleph Corp 富士通株式会社日本電信電話株式会社
    • KOTANI KUNIHIROSUZUKI KAZUYUKIOMOTANI MASAAKIUGA MASANORISHIOMOTO KOHEI
    • H04L12/951H04L12/66H04L13/08H04L12/56
    • PROBLEM TO BE SOLVED: To obtain a packet transfer circuit in IP over ATM exhibiting a maximum packet transfer capacity by performing read, write and refresh within a predetermined period using an SDRAM. SOLUTION: A packet processing section comprises a buffer memory consisting of a plurality (n) of SDRAMs accessible in parallel, a serial/parallel converter receiving input packets in series and delivering them in parallel, and a parallel/serial converter for storing a plurality of parallel signals read out from the buffer memory and generating an output packet. Three operations, i.e. an operation for storing packets in the serial/parallel converter and writing them simultaneously in parallel into respective SDRAMs, an operation for storing signals read out from the SDRAMs in the parallel/serial converter, and a refresh operation, are performed within the refresh period. COPYRIGHT: (C)2004,JPO
    • 要解决的问题:通过使用SDRAM在预定时段内执行读,写和刷新,以获得具有最大分组传送容量的ATM中的IP中的分组传送电路。 解决方案:分组处理部分包括由可并行访问的多个(n个)SDRAM组成的缓冲存储器,串行/并行传输输入数据包的串行/并行转换器,以及并行传送它们的并行/串行转换器 从缓冲存储器读出的多个并行信号并产生输出分组。 三个操作,即将串行/并行转换器中的数据包存储在各个SDRAM中并行并行写入的操作,用于存储从并行/串行转换器中的SDRAM读出的信号的操作和刷新操作, 刷新周期。 版权所有(C)2004,JPO
    • 3. 发明专利
    • Atm device provided with header conversion function
    • JP2004343422A
    • 2004-12-02
    • JP2003137520
    • 2003-05-15
    • Fujitsu Ltd富士通株式会社
    • SUZUKI KAZUYUKI
    • H04L12/70H04L12/56
    • PROBLEM TO BE SOLVED: To perform the housing change of an input identifier (address value) including the change of the using length of the VPI/VCI of an input cell in an online state (cell conducting state) and to quicken the housing change relating to an ATM device provided with a header conversion function using the input identifier for which input header information is degenerated. SOLUTION: The ATM device is provided with means 1-2a and 1-2b for holding input identifier generation information for generating two kinds of the input identifiers from the VPI/VCI of the input cell, means 1-1a and 1-1b for generating the two kinds of the input identifiers according to the two kinds of the input identifier generation information, a means 1-3 for selecting and outputting one of the two kinds of the input identifiers, a header information storage memory 1-6 having two surfaces of address spaces corresponding to the two kinds of the input identifiers and storing header information data after header conversion with the respective input identifiers as addresses, and means 1-7 and 1-8 for transferring stored data between the surfaces for the header conversion information storage memory. COPYRIGHT: (C)2005,JPO&NCIPI
    • 7. 发明专利
    • TEST SYSTEM FOR EXTERNAL STORAGE DEVICE
    • JPH03126147A
    • 1991-05-29
    • JP26460889
    • 1989-10-11
    • FUJITSU LTD
    • SUZUKI KAZUYUKI
    • G06F12/16G06F11/22
    • PURPOSE:To save a memory and to shorten a test time by suppressing write of check bits to write only data at the time of reading out data written in an external storage device to write it in the test data area of the memory and detecting data error at the time of reading out data from the test data area by a processor. CONSTITUTION:Data to be written in an external storage device 12 is generated in a test data area of a memory means 13 by a processor 11 and is written in the external storage device 12; and when written data is read out and is written in the test data area 21 of the memory means 15, write of data bits is suppressed by a suppressing means 17 and only data is written in a data part 14 of the memory means 13. When the processor 11 reads out the test data area 21 of the memory means 13, data error is detected in an error detecting means 16 by noncoincidence between the data part 14 of the memory means 13 and a check bit part 15 in the case of abnormality of data. The external storage device 12 is tested in this manner. Since it is sufficient if one test data area 21 is reserved, the memory is saved and the test time is shortened.