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    • 1. 发明专利
    • Electric power source noise measuring instrument, integrated circuit, and semiconductor device
    • 电力源噪声测量仪器,集成电路和半导体器件
    • JP2008076356A
    • 2008-04-03
    • JP2006259211
    • 2006-09-25
    • Fujitsu Ltd富士通株式会社
    • TAKEMOTO TAKAHITOHARADA AKIHIKOFURUYA KAZUHIRO
    • G01R31/28H01L21/822H01L27/04
    • G01R31/31709G01R31/31708G01R31/31721
    • PROBLEM TO BE SOLVED: To accurately measure an electric power source noise generated in an inside of an integrated circuit.
      SOLUTION: This electric power source noise measuring instrument is provided with: a mutual induction inductor pair 2 comprising the first inductor arranged in an inside of the integrated circuit 10 and connected between electric power source voltages of the integrated circuit 10, and the second inductor with both ends connected to external output terminals 15a, 15b of the integrated circuit 10 and opposed to the first inductor; and an electric power source noise measuring part 5 measuring electric power source noise in the integrated circuit 10, based on a voltage waveform output from the second inductor of the mutual induction inductor pair 2 via the external output terminals 15a, 15b.
      COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:精确测量集成电路内部产生的电源噪声。 解决方案:该电源噪声测量仪器设有:互感电感器对2,包括布置在集成电路10的内部并连接在集成电路10的电源电压之间的第一电感器, 第二电感器的两端连接到集成电路10的外部输出端子15a,15b并与第一电感器相对; 以及基于从互感电感器对2的第二电感器经由外部输出端子15a,15b输出的电压波形,测量集成电路10中的电源噪声的电源噪声测量部件5。 版权所有(C)2008,JPO&INPIT