会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 6. 发明专利
    • MASK ROM
    • JPS62287661A
    • 1987-12-14
    • JP13143786
    • 1986-06-06
    • FUJITSU LTD
    • SUZUKI YASUOTAKEMAE YOSHIHIRO
    • H01L21/8246H01L27/10H01L27/112
    • PURPOSE:To construct a memory cell, not accompanying any particular difficulties in manufacturing or in sense, for a 2-bit data memorizing mask ROM by a method wherein low-concentration diffusion is accomplished into a portion of a substrate just under a gate in the vicinity of a source and drain of a cell transistor. CONSTITUTION:In the process of constructing a memory cell of this design, a gate oxide film GI and gate electrode G are attached to a substrate SUB, impurity diffusion is accomplished for the formation by self-alignment of source.drain regions S, D, impurity ions same as the substrate in conductivity type are implanted into the gate-side ends of the source.drain regions, and then a heat treatment is performed for the formation of a p -region provided with an extension as indicated in the figure. Whether the p region is to be formed or not depends upon the data present in storage. Of the source.drain regions, the left-side one will be used as a source in some cases and, in other cases, the right.side one will be used as a source. This means that p -regions must take one of four positions: neither on the left side nor on the right side, on the left side, on the right side, or on both left and right sides. In this way, a memory cell is capable of a 2-bit function, replacing a 4-value level cell.
    • 9. 发明专利
    • MEMORY EXCLUSIVE FOR MULTI-LEVEL READING
    • JPS6061997A
    • 1985-04-09
    • JP17079483
    • 1983-09-16
    • FUJITSU LTD
    • SUZUKI YASUOHIRAO HIROSHISUZUKI YASUAKI
    • G11C16/04G11C11/56G11C29/00H01L27/10
    • PURPOSE:To read accurately the storage data of a multi-value memory even in case the resistance of a ground line is not negligible, by producing the reference voltage of an accurate level after compensating a voltage drop. CONSTITUTION:When a memory cell MC is selected by a column address CA and a row address RA, a current flows in a route of a power supply V, a bit line BL, a cell MC and a ground line 10. Then the output of a load circuit 32 is compared with a reference voltages S1-S3 by sense amplifiers 34-38. A cell group 44 for generation of reference voltage consists of the same transistor Q as a memory cell group. A current flows from the power supply V through the transistor Q selected by a column decoder 46 and the line 10, and a load circuit 50 produces an output S1. The voltage drop produced at the position of the selected transistor is equal to the variation of the read output voltage produced at the position of a cell of a memory cell group. Then the output S1 is set at the reference voltage to correct the difference of voltage drop due to positions. This ensures the reading with no error.
    • 10. 发明专利
    • SENSE AMPLIFIER CIRCUIT
    • JPS58114394A
    • 1983-07-07
    • JP22070882
    • 1982-12-16
    • FUJITSU LTD
    • SUZUKI YASUO
    • G11C11/409G11C11/4091
    • PURPOSE:To obtain a sense amplifier circuit which has a small amount of power consumption, by connecting a driver transistor in series to a load transistor in which each bit line is connected to the gate to form an FF circuit and at the same time providing a sense transistor. CONSTITUTION:Transistors TRQ1 and Q2 function as a load TR of a circuit, and the gate of the TRQ1 is connected to a bit line BL1 with the gate of the TRQ2 connected to a bit line BL2 respectively. A driver TRQ3 is connected in series to the TRQ1, and a driver TRQ4 is connected in series to the TRQ2. An FF circuit is formed with the TRQ3 and TRQ4. Furthermore a TRQ5 is connected between the line BL1 and the drain of the TRQ3, and the gate of a TRQ5 is connected to the gate of the TRQ3 as well as to the drain of the TRQ4. Then the TRQ6 is connected between the line BL2 and the drain of the TRQ4, and the gate of the TRQ6 is connected to the gate of the TRQ4 as well as to the drain of the TRQ3. The TRQ5 and Q6 cut off the load TR at the side of ''0'' when the sense amplifier is working. Thus the power consumption is reduced.