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    • 1. 发明专利
    • Electronic controller and manufacturing method therefor
    • 电子控制器及其制造方法
    • JP2014175132A
    • 2014-09-22
    • JP2013046099
    • 2013-03-08
    • Hitachi Automotive Systems Ltd日立オートモティブシステムズ株式会社
    • SAKAMOTO EIJIKOYAMA HIROSHIYAMASHITA SHIROSAITO MASATOABE HIROYUKIKAMOSHITA MASARU
    • H01R13/03H01R43/02
    • PROBLEM TO BE SOLVED: To solve the problem that when a connector pin is joined using a bismuth (Bi)-containing tin (Sn) solder, copper (Cu) on the connector side and tin (Si) in the solder react, causing a bismuth (Bi) phase saturated in the solder to successively separate out as a result of growth of a thick copper (Cu)-tin(Sn) compound (mainly CuSn) in the surface layer of the connector pin, the bismuth (Si) phase eventually becoming the starting point of a crack and the crack propagating, whereby the joining strength is reduced.SOLUTION: Provided is a method for manufacturing an electronic controller, wherein the method for manufacturing an electronic controller includes an electronic component, a circuit board on which the electronic component is mounted, a connector, and a step of joining a connector pin for joining the circuit board and the connector and containing zinc (Zn) in the surface of part of it with the circuit board by a flow process using a bismuth (Bi)-added solder.
    • 要解决的问题为了解决当使用含铋(Bi)的锡(Sn)焊料将连接器引脚接合时,连接器侧的铜(Cu)和焊锡中的锡(Si)反应的问题, 铋(铋)相在焊料中饱和,由于在连接器针的表面层中生长厚铜(Cu)-tin(Sn)化合物(主要是CuSn),铋(Si)相 最终成为裂缝的起点和裂纹扩展,从而降低了接合强度。解决方案:提供一种电子控制器的制造方法,其中电子控制器的制造方法包括电子部件,电路板,电路板 安装电子部件,连接器和连接用于接合电路板和连接器的连接器针脚并将其部分表面中的锌(Zn)与电路板接合的步骤,通过使用铋( Bi)焊锡。
    • 6. 发明专利
    • Semiconductor device manufacturing method and semiconductor device
    • 半导体器件制造方法和半导体器件
    • JP2014053462A
    • 2014-03-20
    • JP2012197201
    • 2012-09-07
    • Hitachi Automotive Systems Ltd日立オートモティブシステムズ株式会社
    • KOYAMA HIROSHIYAMASHITA SHIROSAKAMOTO EIJIHATA SHOHEISAITO MASATOTAKASE KOSUKEABE HIROYUKIKAMOSHITA MASARU
    • H05K3/34
    • PROBLEM TO BE SOLVED: To provide a technology relevant to a manufacturing method including solder connection of a semiconductor device such as an ECU to inhibit and prevent deformation of a housing part caused by heat transfer at the time of a flow process.SOLUTION: A manufacturing method of an ECU 100 (Electronic Control Unit) having a connector integrated housing 50 comprises: a first process of connecting surface mounting components (12, 14) on a printed circuit board 11 by reflow by using a first solder 41; and a second process of connecting connector pins 52 as insertion mounting components on the printed circuit board 11 by flow by using a second solder 42. The second solder 42 has a composition obtained by addition of Bi or In to the first solder 41 thereby to lower a melting point. In the second process, when heat applied to a connection part 31 is transferred from a connector housing part 53 to a cover 54 through a connector pin 52, a temperature of the cover 54 becomes not more than a softening temperature of a material of the cover 54.
    • 要解决的问题:提供与包括ECU等半导体装置的焊接连接的制造方法相关的技术,以抑制和防止在流动过程中由热传递引起的壳体部分的变形。解决方案:制造 具有连接器集成外壳50的ECU 100(电子控制单元)的方法包括:通过使用第一焊料41通过回流将表面安装部件(12,14)连接在印刷电路板11上的第一工序; 以及通过使用第二焊料42将连接器引脚52作为插入安装部件连接到印刷电路板11上的第二工序。第二焊料42具有通过在第一焊料41中添加Bi或In而获得的组成,从而降低 一个熔点。 在第二过程中,当连接部分31的热量通过连接器销52从连接器壳体部分53传递到盖54时,盖54的温度变得不超过盖的材料的软化温度 54。
    • 7. 发明专利
    • Double side cooling type semiconductor power module
    • 双面冷却型半导体功率模块
    • JP2013069825A
    • 2013-04-18
    • JP2011206785
    • 2011-09-22
    • Hitachi Automotive Systems Ltd日立オートモティブシステムズ株式会社
    • YAMASHITA SHIROSAKAMOTO EIJIYOSHINARI HIDETOKUME TAKASHI
    • H01L23/36H01L25/07H01L25/18
    • H01L24/33H01L2924/1305H01L2924/13055H01L2924/181H01L2924/00
    • PROBLEM TO BE SOLVED: To prevent short circuits from occurring between lead frames and in a semiconductor chip surface due to overflowing solder while inhibiting the deterioration of heat radiation performance and the reliability of a semiconductor chip in a double side cooling type semiconductor power module.SOLUTION: A double side cooling type semiconductor power module includes: a semiconductor element; a first lead frame where a first protruding surface is connected with an electrode part formed on one surface of the semiconductor element by solder; a second lead frame where the one surface of the semiconductor element is connected with an electrode part formed on a surface at the opposite side of the one surface by solder; a first heat radiation member thermally connecting with the first lead frame; and a second heat radiation member thermally connecting with the second lead frame. In the double side cooling type semiconductor power module, the first protruding surface has a shape smaller than the electrode part which is formed on the one surface of the semiconductor element and is connected with the first protruding surface by the solder. The dimension differences between the shapes of the first protruding surface and the electrode part are configured to differ in the direction of the first protruding surface.
    • 要解决的问题:为了防止引线框架和半导体芯片表面中由于溢出焊料而发生短路,同时抑制双侧冷却型半导体电源中的散热性能的劣化和半导体芯片的可靠性 模块。 解决方案:双面冷却型半导体功率模块包括:半导体元件; 第一引线框架,其中第一突出表面通过焊料与形成在半导体元件的一个表面上的电极部分连接; 第二引线框架,其中所述半导体元件的一个表面与通过焊料在所述一个表面的相对侧的表面上形成的电极部分连接; 与第一引线框架热连接的第一散热构件; 以及与所述第二引线框架热连接的第二散热构件。 在双面冷却型半导体功率模块中,第一突出面的形状比形成在半导体元件的一个面上的电极部的形状小,并且通过焊料与第一突出面连接。 第一突出表面和电极部分的形状之间的尺寸差异被构造成在第一突出表面的方向上不同。 版权所有(C)2013,JPO&INPIT
    • 8. 发明专利
    • Power module having highly reliable solder-bonded part
    • 具有高可靠焊接部分的电源模块
    • JP2011143442A
    • 2011-07-28
    • JP2010005871
    • 2010-01-14
    • Hitachi Automotive Systems Ltd日立オートモティブシステムズ株式会社
    • YAMASHITA SHIROHATA SHOHEI
    • B23K35/26C22C13/00H01L25/07H01L25/18
    • PROBLEM TO BE SOLVED: To enable Pb-free and heat-resistable solder-bonding when bonding a Cu-metalized electrode on a substrate to a Cu-metalized lead terminal or a Cu-metalized terminal of a semiconductor component.
      SOLUTION: A Cu-metalized electrode 9 and a Cu-metalized lead terminal are bonded with a solder 7 containing 0.7-2.5 wt.% Cu, 1.5-9.8 wt.% Ni, and the balance Sn. An alloy layer 8 is formed between the solder 7 and the metalized part 9 of the electrode or of the terminal. In the alloy layer 8, Cu
      3 Sn is formed in the side of the Cu-metalized part 9, and Cu
      6 Sn
      5 is formed in the side of the solder 7. The Cu
      3 Sn layer, having a problem of mechanical reliability, of the alloy layer 8 is thinly formed, so that the bonded part is kept high in reliability.
      COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:为了在将基板上的Cu金属化电极接合到半导体部件的Cu金属化引线端子或Cu金属化端子时实现无铅和耐热焊接。 解决方案:Cu金属化电极9和Cu金属化引线端子用含有0.7-2.5重量%Cu,1.5-9.8重量%Ni和余量Sn的焊料7接合。 在焊料7和电极或端子的金属化部分9之间形成合金层8。 在合金层8中,在Cu金属化部分9的侧面形成Cu 3 S 3 Sn,形成Cu Sn 5 在焊料7的侧面。合金层8的具有机械可靠性问题的Cu 3 S 3 Sn层被薄薄地形成,使得粘接部分保持高可靠性。 版权所有(C)2011,JPO&INPIT