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    • 76. 发明专利
    • DIVERSITY RADIO EQUIPMENT
    • JPH10107712A
    • 1998-04-24
    • JP25855996
    • 1996-09-30
    • TOSHIBA CORP
    • SEKINE SHUICHIKAYANO HIROYUKIYOSHIDA HIROSHIOTAKA SHOJIMAEDA TADAHIKO
    • H04B7/02
    • PROBLEM TO BE SOLVED: To improve the polarization efficiency by employing an equipment provided with a portable radio equipment antenna consisting of a rectangular conductor ground plate, a radio unit, a monopole antenna, a conductor linear element, a variable reactance element and a control unit for the diversity radio equipment. SOLUTION: An inverted-F antenna 12 is used for this radio equipment and placed at one side of an end of a short-side A of a conductor ground plate 11. A linear element 13 is formed to be the same shape as that of the inverted-F antenna 12. The antenna 12 is fed from a radio circuit unit 14 on the conductor ground plate 11 via a high frequency line 21. Furthermore, the linear element 13 is connected to a variable reactance element 15 inserted to a connecting point of the conductor ground plate 11. The element 15 is connected to a control circuit unit 16 via a control signal line 22 and a control signal is fed to the element 15 via an element that has a high impedance for high frequencies and a low impedance for low frequencies such as an inductor 17.
    • 78. 发明专利
    • LIQUID CRYSTAL ELEMENT EVALUATING METHOD AND EVALUATING DEVICE
    • JPH09105703A
    • 1997-04-22
    • JP26421695
    • 1995-10-12
    • TOSHIBA CORP
    • URANO TAEKOMACHIDA SHIGERUSANO KENJIYOSHIDA HIROSHI
    • G01N21/88G01M11/00G01N21/17G01N21/59G02F1/13
    • PROBLEM TO BE SOLVED: To easily carry out detection, identification, and quantitative determination of an electric field responsive impurity in a liquid crystal element with high sensitivity by analyzing slope of an electric field response curve when pulse electric fields, which are different from each other in polarity, are impressed to the liquid crystal element. SOLUTION: A pulse signal generated in a pulse generator 1 is impressed to a liquid crystal cell 10. On the other hand, infrared light from an infrared light source 2 is dispersed in an infrared spectroscope 3, and an infrared light of a specific wavelength area is taken out so as to irradiate the cell 10 via a polarizer 4, and then, the infrared light transmitted through the cell 10 is detected by means of a MCT detector 5 so as to be transduced into an electric signal. This electric signal is amplified by means of a preamplifier 6 and a main amplifier 7 so as to be inputted to a digital sampling oscilloscope 8, and then, integration is carried out after time resolution. The whole of an estimating device is controlled by means of a computer 9. Light in excessive wavelength areas other than a measured objective wavelength area can be cut out by means of the spectroscope 3. Therefore, temperature increase in the cell 10 can be suppressed, and a condition adequate for measurement of an electric field response curve can be maintained.
    • 80. 发明专利
    • SEMICONDUCTOR EXPOSING DEVICE AND EXPOSING METHOD
    • JPH02232917A
    • 1990-09-14
    • JP5288689
    • 1989-03-07
    • TOSHIBA CORP
    • YOSHIDA HIROSHI
    • H01L21/30G03F7/20H01L21/027
    • PURPOSE:To eliminate the standing wave effect in a resist, and to make it possible to form a highly precise microscopic pattern using a circularly polarized coherent light which passes through a 1/4 wave-length board. CONSTITUTION:The phase of the single color coherent laser beam L1, to be emitted from an excimer laser device 3, is rotated at an angle of 90 degrees by a lambda/4 wavelength plate 4, the laser beam advances 90 degrees, it is turned into a circular polarized light L2, it comes into a mask 7 passing through a reflecting mirror 5 and an eye-glass 6, then the laser beam is made incident on a wafer 11 after passing through a trapezoid mirror 8, a concave mirror 9 and a convex mirror 10, the resist 1 on a semiconductor substrate 2 is exposed, and a pattern determined by a mask 7 is developed. The phase of the circularly polarized light projected on the resist 1 is changed by the reflection of the substrate 2, but as it is reflected as a circularly polarized light, it shows no standing wave effect in the resist 1. When a homogenous light is made to irradiate, the maximum value and the minimum value are revealed in odd multiplication and even multiplication of 1/4 wavelength, but if it is a circularly polarized light, one of them becomes the polarized beam which is shifted by a 1/4 wavelength from the other light, and as a result, one of them shows a maximum value, the other one shows a minimum value, and a fixed value, having the valanced intensity of the minimum and the maximum values can be obtained at all times.