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    • 72. 发明专利
    • ELECTRON EMITTING ELEMENT
    • JP2000208026A
    • 2000-07-28
    • JP500499
    • 1999-01-12
    • MATSUSHITA ELECTRIC IND CO LTD
    • KITAHATA MAKOTODEGUCHI MASAHIROITO KUNIOKUZUMAKI TOORU
    • H01J9/02C01B31/02H01J1/304
    • PROBLEM TO BE SOLVED: To provide a high efficient electron emitting element by drawing a cylinder having a substance containing at least carbon n-tubes on the inside thereof to orient the carbon n-tubes contained in the substance arranged on the inside of the cylinder in one direction. SOLUTION: A cylinder 3 having a substance 1 containing carbon n-tubes on the inside thereof is thinly extended. The carbon n-tubes are drawn in longitudinal direction thereof, and gradually become the same direction with the cylinder extended in its longitudinal direction to orient the carbon n-tubes 4 in one direction. Then, the directions of the carbon n-tubes 4 which have been faced in arbitrary directions are set in the same direction, and an average value of angles in the longitudinal direction of the cylinder to the longitudinal direction of the n-tube 1 vertically disposed to an end surface 7 becomes 30 degrees or less, for instance. Thereby, directions of field emitting electrons become the same, so that spread of an electron stream is reduced to obtain an advantageous element. As for metal composed the cylinder having the substance 1 containing the carbon n-tube on the inside thereof, the metal which does not form carbide such as copper and those alloys are desirable.
    • 75. 发明专利
    • DEVICE FOR GROWING CRYSTAL AND GROWTH OF CRYSTAL
    • JPH11157988A
    • 1999-06-15
    • JP32774997
    • 1997-11-28
    • MATSUSHITA ELECTRIC IND CO LTD
    • UCHIDA MASAOKITAHATA MAKOTOKITAGAWA MASATOSHI
    • C30B25/08C23C16/44C30B29/36H01L21/205
    • PROBLEM TO BE SOLVED: To provide a device for growing a crystal, capable of growing the crystal having a uniform crystal film thickness and a uniform crystallinity at a high rate by disposing a growth chamber having a space for setting a substrate therein, a casing for covering the growth chamber, a heating device, a gas-supplying system for supplying gases into the growth chamber and the casing, and a gas-exhausting system for exhausting the gases, and supplying the gases from the lower side of the growth chamber. SOLUTION: This device is used for growing a crystal such as the crystal of silicon carbide which is a semiconductor material applied to power devices or devices operated at high temperatures. The device has a structure for efficiently thermally decomposing a reaction gas supplied into a growth chamber and supplying the reaction gas to a substrate in a high density, and is formed so that the gas is homogeneously distributed, while preventing the turbulent flow of the gas. The device for growing the crystal comprises a growth chamber 10a made from a carbon material and coated with silicon carbide, a shaft 10b used for supplying the reaction gas and simultaneously supporting the growth chamber, a quartz casing 11 and a heating coil 12. The reaction gas and an inert gas are supplied from the directions of the allows 15 and 16, respectively.
    • 79. 发明专利
    • MANUFACTURE OF SILICON CARBIDE THIN FILM
    • JPH0982643A
    • 1997-03-28
    • JP23748895
    • 1995-09-14
    • MATSUSHITA ELECTRIC IND CO LTD
    • KITAHATA MAKOTO
    • C30B23/06H01L21/20H01L21/203
    • PROBLEM TO BE SOLVED: To provide a forming method of single phase 2C-SiC single crystalline thin film developing less crystalline defect on an Si wafer by heteroepitaxially growing a thin film on an Si substrate surface. SOLUTION: In this method of manufacturing silicon carbide thin film having the first step of forming silicon carbide carbonizing the Si substrate surface by feeding carbon and heating the surface, and the second step of growing the silicon carbide by feeding the carbon and silicon after the carbonization, multiple terraces 5 and steps 6 exist on the offcut substrate surface of Si, because different surface reactivities are displayed in the P direction 8 of long continuous atomic row in parallel with step edges 10 as well as in the N direction 7 of atomic row in short terrace dicided by the step edges 10 perpendicular to the same 10. In such a constitution, because of this anisotropy, a single phase SiC single crystalline thin film developing less crystalline defect containing no antiphase boundary(APB) at all can be formed.