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    • 51. 发明专利
    • Scintillator panel and radiation detector
    • 扫描面板和辐射探测器
    • JP2014021003A
    • 2014-02-03
    • JP2012161766
    • 2012-07-20
    • Hamamatsu Photonics Kk浜松ホトニクス株式会社
    • UENISHI HIDENORISHIKIDA MUNEYOSHIKUSUYAMA YASUSHI
    • G21K4/00G01T1/20
    • G01T1/2006G01T1/2018G01T1/202G21K4/00G21K2004/10G21K2004/12Y10T428/239
    • PROBLEM TO BE SOLVED: To provide a scintillator panel capable of ensuring flexibility while preventing a chip or a crack of a glass substrate from being generated, and a radiation detector using the same.SOLUTION: A scintillator panel 2A can obtain excellent radiolucency and flexibility and can also alleviate a problem of a heat expansion coefficient, due to that a glass substrate 11 having the thickness of 150 μm or less functions as a support unit. Also, the scintillator panel 2A is formed with an organic resin layer 12 so that one surface 11a side and sides 11c of the glass substrate 11 are covered, and an organic resin layer 15 is formed to cover the other surface 11b side and the sides 11c of the glass substrate 11 formed with the organic resin layer 12. Therefore, a chip or a crack of an edge part can be effectively prevented from being generated. Further, stray light from a side 11c of the glass substrate 11 can be prevented, and due to that a whole surface is covered with the organic resin layers 12, 15, warpage of the glass substrate 11 can be also prevented.
    • 要解决的问题:提供一种能够确保灵活性同时防止产生玻璃基板的芯片或裂纹的闪烁体面板,以及使用其的放射线检测器。解决方案:闪烁体面板2A可以获得优异的放射性和柔性, 由于厚度为150μm以下的玻璃基板11作为支撑单元,因此也可以减轻热膨胀系数的问题。 此外,闪烁体面板2A由有机树脂层12形成,使得玻璃基板11的一个表面11a侧和侧面11c被覆盖,并且形成有机树脂层15以覆盖另一个表面11b侧和侧面11c 形成有机树脂层12的玻璃基板11.因此,能够有效地防止边缘部的切屑或裂纹的产生。 此外,可以防止来自玻璃基板11的侧面11c的杂散光,并且由于整个表面被有机树脂层12,15覆盖,因此也可以防止玻璃基板11的翘曲。
    • 52. 发明专利
    • Scintillator panel and radiation detector
    • 扫描面板和辐射探测器
    • JP2014021002A
    • 2014-02-03
    • JP2012161762
    • 2012-07-20
    • Hamamatsu Photonics Kk浜松ホトニクス株式会社
    • UENISHI HIDENORISHIKIDA MUNEYOSHIKUSUYAMA YASUSHI
    • G21K4/00G01T1/20
    • G01N21/64C03C17/3405C03C2217/70G01T1/2002G01T1/2018G01T1/202G21K4/00G21K2004/10Y10T428/239
    • PROBLEM TO BE SOLVED: To provide a scintillator panel capable of ensuring flexibility while preventing a chip or a crack of a glass substrate from being generated, and a radiation detector using the same.SOLUTION: A scintillator panel 2A can obtain excellent radiolucency and flexibility due to that a glass substrate 11 having the thickness of 150 μm or less functions as a support unit. The scintillator panel 2A is also formed with an organic resin layer 12 so that the whole surface of the glass substrate 11 is covered, therefore the glass substrate 11 is reinforced to prevent a chip or a crack of an edge part from being generated. Further, stray light from a side 11c of the glass substrate 11 can be prevented, and due to the formation of the organic resin layer 12 on the whole surface, warpage of the glass substrate 11 caused by internal stress after formation of a scintillator layer 13 can be also prevented.
    • 要解决的问题:提供一种能够确保柔性,同时防止产生玻璃基板的芯片或裂纹的闪烁面板,以及使用其的放射线检测器。解决方案:闪烁体面板2A可以获得优异的放射性和柔性, 具有150μm以下的厚度的玻璃基板11用作支撑单元。 闪烁体面板2A也形成有机树脂层12,使得玻璃基板11的整个表面被覆盖,因此玻璃基板11被加强以防止产生边缘部分的芯片或裂缝。 此外,可以防止来自玻璃基板11的侧面11c的杂散光,并且由于在整个表面上形成有机树脂层12,在形成闪烁体层13之后由内部应力引起的玻璃基板11的翘曲 也可以防止。
    • 53. 发明专利
    • measuring device
    • 测量工具
    • JP2014020876A
    • 2014-02-03
    • JP2012158793
    • 2012-07-17
    • Hamamatsu Photonics Kk浜松ホトニクス株式会社
    • YAMAMOTO HIROOMIZUNO SEIICHIROKITAURA RYUSUKE
    • G01J1/46G01J1/44
    • PROBLEM TO BE SOLVED: To provide a measuring device capable of obtaining an amount of input energy to a resistive element in a short time.SOLUTION: A measuring device 1 includes a reference resistor 11, a resistive element 12, switches 21 and 22, and a signal reading unit 30. The resistance value of the resistive element 12 changes depending on an amount of input energy. The resistance value of the reference resistor 11 is fixed. The signal reading unit 30 includes a switch 31, an amplifier 32, an NMOS transistor 33, an integral capacity element 34, a switch 35, a buffer 36, and a sample hold unit 37. The sample hold unit 37 samples a voltage value output from the buffer 36 at the time when a predetermined time has elapsed from the start time of a charge accumulation operation in the integral capacity element 34, and holds and outputs the sampled voltage value.
    • 要解决的问题:提供能够在短时间内获得电阻元件的输入能量的测量装置。解决方案:测量装置1包括参考电阻器11,电阻元件12,开关21和22,以及 信号读取单元30.电阻元件12的电阻值根据输入能量的量而变化。 参考电阻器11的电阻值是固定的。 信号读取单元30包括开关31,放大器32,NMOS晶体管33,积分电容元件34,开关35,缓冲器36和采样保持单元37.采样保持单元37对电压值输出 从积分电容元件34中的电荷累积动作的开始时刻开始经过规定时间时,从缓冲器36输出,并保持并输出采样电压值。
    • 54. 发明专利
    • Thrombus removal device
    • THROMBUS移除装置
    • JP2014004219A
    • 2014-01-16
    • JP2012142999
    • 2012-06-26
    • Hamamatsu Photonics Kk浜松ホトニクス株式会社
    • TAMAOKI YOSHIAKIKATO YOSHINORIKAWASHIMA TOSHIYUKI
    • A61B18/20
    • PROBLEM TO BE SOLVED: To provide a thrombus removal device, capable of detecting breakage of an optical fiber with high accuracy.SOLUTION: A thrombus removal device 1 is a device which radiates light to thrombus in a blood vessel to thereby remove the thrombus. The thrombus removal device 1 includes: a light source 11; a polarization beam splitter 12, a λ/4 plate 13; a photo detector 14; an optical fiber 15; a connector 16; an optical fiber 17; a catheter 18; and a window member 19. A reflection reducing film is formed on the end face of a second end 17b of the optical fiber 17. A reflection reducing film for reducing reflection of light when the blood contacts is formed on a second face 19b of the window member 19. The reflectance Ra in the first face 19a of the window member 19 and the reflectance Rb in the second face 19b of the window member 19 when the gas contacts the second face 19b of the window member 19 are respectively set to predetermined values.
    • 要解决的问题:提供一种能够以高精度检测光纤的断裂的血栓消除装置。解决方案:血栓去除装置1是将光照射到血管中的血栓,从而去除血栓的装置。 血栓去除装置1包括:光源11; 偏振分束器12,λ/ 4板13; 光检测器14; 光纤15; 连接器16; 光纤17; 导管18; 和窗构件19.在光纤17的第二端17b的端面上形成反射降低膜。当在窗口的第二面19b上形成血液接触时减少光的反射的反射减少膜 窗构件19的第一面19a中的反射率Ra和窗构件19的第二面19b中的反射率Rb分别设定为预定值。
    • 55. 发明专利
    • Solid state imaging device
    • 固态成像装置
    • JP2013243197A
    • 2013-12-05
    • JP2012114331
    • 2012-05-18
    • Hamamatsu Photonics Kk浜松ホトニクス株式会社
    • KOBAYASHI HIRONARIMURAMATSU MASAHARU
    • H01L27/14H01L31/0232H04N5/335
    • H01L27/1464H01L27/14618H01L27/14621H01L27/14625H01L31/02162H01L31/0232H01L31/02327H01L2224/48091H01L2924/10158H01L2924/00014
    • PROBLEM TO BE SOLVED: To provide a solid state imaging device capable of inhibiting decrease in resolution even when a back-illuminated semiconductor light detection element is employed.SOLUTION: In a solid state imaging device, a part 41 of a fiber optic plate 40 on a light-emission end face 40b side includes a first part 41a corresponding to a periphery 23 of a semiconductor light detection element 20 and a second part 41b corresponding to a thin part 25 of the semiconductor light detection element 20, the second part 41b projecting toward the semiconductor light detection element 20. A height of a level difference formed by the first part 41a and the second part 41b of the fiber optic plate 40 is smaller than a height of a level difference formed by the thin part 25 and the periphery 23 of the semiconductor light detection element 20. The semiconductor light detection element 20 and the fiber optic plate 40 are fixed by a resin 45 in a manner that the first part 41a and the periphery 23 come in contact with each other and the second part 41b and the thin part 25 are separated from each other.
    • 要解决的问题:提供即使在使用背照式半导体光检测元件时也能够抑制分辨率降低的固态成像装置。解决方案:在固态成像装置中,光纤板40的部分41在 发光端面40b侧包括对应于半导体光检测元件20的周边23的第一部分41a和对应于半导体光检测元件20的薄部分25的第二部分41b,第二部分41b朝向 半导体光检测元件20.由光纤板40的第一部分41a和第二部分41b形成的电平差的高度小于由薄部分25和外围部分23形成的电平差的高度 半导体光检测元件20.半导体光检测元件20和光纤板40通过树脂45固定,使得第一部分41a和外围 y 23彼此接触并且第二部分41b和薄部分25彼此分离。
    • 56. 发明专利
    • Glass welding method, glass welding apparatus, and glass welding body
    • 玻璃焊接方法,玻璃焊接设备和玻璃焊接体
    • JP2013203629A
    • 2013-10-07
    • JP2012076725
    • 2012-03-29
    • Hamamatsu Photonics Kk浜松ホトニクス株式会社
    • MATSUMOTO SATOSHI
    • C03C27/06
    • PROBLEM TO BE SOLVED: To provide a glass welding method and a glass welding apparatus that can obtain a glass welding body in which occurrence of a crack in a glass layer is suppressed, and the glass welding body.SOLUTION: There is provided a glass welding method for manufacturing a glass welding body by welding plate-like glass members 4, 5 to each other. The method includes: a process of overlaying a glass member 5 on a glass member 4 having a glass layer 3 arranged along an annularly extending welding scheduled line across the glass layer 3, and deforming at least one of the glass members 4, 5 so that the distance between the glass members 4, 5 at annular parts 4c, 5c is larger than the distances at center parts 4m, 5m and at outer edge parts 4f, 5f; and a process of welding the glass members 4, 5 to each other along the welding scheduled region by irradiating the glass layer 3 with laser light L along the welding scheduled region while deforming at least one of the glass members 4, 5.
    • 要解决的问题:提供一种玻璃焊接方法和玻璃焊接装置,该玻璃焊接方法和玻璃焊接装置可以获得抑制玻璃层中出现裂纹的玻璃焊接体和玻璃焊接体。解决方案:提供一种玻璃焊接 通过将板状玻璃构件4,5彼此焊接来制造玻璃焊接体的方法。 该方法包括:将玻璃构件5覆盖在玻璃构件4上,该玻璃构件4具有玻璃层3,该玻璃构件4沿着环状延伸的焊接预定线布置在玻璃层3上,并使玻璃构件4,5中的至少一个变形,使得 玻璃构件4,5之间在环形部分4c,5c处的距离大于中心部分4m,5m和外边缘部分4f,5f处的距离; 以及通过沿着焊接调度区域照射玻璃层3而具有激光L,同时使玻璃构件4,5中的至少一个变形而使玻璃构件4,5沿着焊接调度区域彼此焊接的工序。
    • 58. 发明专利
    • Distance sensor and distance image sensor
    • 距离传感器和距离图像传感器
    • JP2013178121A
    • 2013-09-09
    • JP2012041317
    • 2012-02-28
    • Hamamatsu Photonics Kk浜松ホトニクス株式会社
    • MASE MITSUTOSUZUKI TAKASHIHIRAMITSU JUN
    • G01S17/10G01C3/06G01S7/481H01L27/146H01L31/10
    • G01C3/08G01S7/4863G01S17/10G01S17/89H01L27/14609H01L27/1461H01L27/14623H01L27/1464H01L27/14641
    • PROBLEM TO BE SOLVED: To provide a distance sensor and a distance image sensor capable of improving precision of distance detection.SOLUTION: A first semiconductor region FD1 is disposed inside a charge generating region so as to be surrounded by the charge generating region where electrical charge is generated according to incident light, and collects signal charge from the charge generating region. A third semiconductor region FD3is disposed outside the charge generating region so as to surround the charge generating region, and collects unnecessary charge from the charge generating region. A photo-gate electrode PG1 is disposed on the charge generating region. A first gate electrode TX1 is disposed between the first semiconductor region FD1 and the charge generating region, and makes the signal charge from the charge generating region flow into the first semiconductor region FD1 according to an input signal. A third gate electrode TX3is disposed between the third semiconductor region FD3and the charge generating region, and makes the unnecessary charge from the charge generating region flow into the third semiconductor region FD3according to an input signal.
    • 要解决的问题:提供能够提高距离检测精度的距离传感器和距离图像传感器。解决方案:第一半导体区域FD1设置在电荷产生区域内,以便被电荷产生区域包围,其中电荷 根据入射光产生,并从电荷产生区收集信号电荷。 第三半导体区域FD3设置在电荷产生区域的外侧,以围绕电荷产生区域,并从电荷产生区域收集不必要的电荷。 光电栅极PG1设置在电荷产生区上。 第一栅电极TX1设置在第一半导体区域FD1和电荷产生区域之间,并且使来自电荷产生区域的信号电荷根据输入信号流入第一半导体区域FD1。 第三栅极TX3设置在第三半导体区域FD3和电荷产生区域之间,并且根据输入信号使来自电荷产生区域的不需要的电荷流入第三半导体区域FD3。
    • 59. 发明专利
    • Laser apparatus
    • 激光装置
    • JP2013174812A
    • 2013-09-05
    • JP2012040447
    • 2012-02-27
    • Osaka Univ国立大学法人大阪大学Hamamatsu Photonics Kk浜松ホトニクス株式会社
    • MIYANAGA NORIAKIKURITA TAKASHIKAWASHIMA TOSHIYUKI
    • G02F1/39H01S3/10H01S5/065
    • H01S3/1106G02F1/39H01S3/005H01S3/0085H01S3/0092H01S3/1307
    • PROBLEM TO BE SOLVED: To provide a laser apparatus capable of generating a high output pulse laser beam.SOLUTION: A laser apparatus 1 divides seed light Linto a plurality of laser beams L, and then performs continuous light amplification on the plurality of laser beams Lwith an amplification device 14. For this reason, a higher amplification factor can be set in comparison with the case when a pulse laser beam is amplified. In addition, the phase of each laser beam Lis controlled so that, when amplified laser beams Lare respectively multiplexed by a diffraction grating 16 to generate multiplexed light L, output peaks of the multiplexed light Lat a focusing position Pare repeatedly generated by a predetermined time interval. This enables the pulse laser beam to be generated from the laser beams Lamplified at a high amplification factor, at the focusing position P. Thus, the laser apparatus 1 can generate high output pulse laser beams.
    • 要解决的问题:提供能够产生高输出脉冲激光束的激光装置。解决方案:激光装置1将种子光Lin分割成多个激光束L,然后对多个激光束L进行连续的光放大 放大装置14.为此,与脉冲激光束被放大的情况相比,可以设定更高的放大系数。 此外,每个激光束的相位Lis被控制,使得当放大的激光束由衍射光栅16分别复用以产生多路复用光L时,多路复用光Lat的输出峰值聚焦位置Pare重复产生预定的时间间隔 。 这样就可以在聚焦位置P以高放大倍数从放大倍数的激光束产生脉冲激光束。因此,激光装置1可以产生高输出脉冲激光束。
    • 60. 发明专利
    • X-ray analyzer
    • X射线分析仪
    • JP2013170880A
    • 2013-09-02
    • JP2012034030
    • 2012-02-20
    • Hamamatsu Photonics Kk浜松ホトニクス株式会社
    • NAKANO TOMOYASUOBA AKIRAONODA SHINOBUOSUGA SHINJI
    • G01N23/223
    • PROBLEM TO BE SOLVED: To provide an X-ray analyzer capable of performing high-efficiency X-ray analysis.SOLUTION: An X-ray analyzer 1 comprises an X-ray source 10, a slit 20, a condenser 30, a holder 40, a detector 50, a scanner 60, a scintillator 70, an imager 80 and a controller 90 and analyzes contained components of a sample S held by the holder 40. The condenser 30 emits from an X-ray emitting terminal an X-ray outputted from the X-ray source 10 and made incident through an opening of the slit 20 to an X-ray incident terminal and converges the X-ray into linear shape that is long in an x direction and short in a y direction. In the case where the sample S is linear, the holder 40 holds the sample S in such a manner that a length direction (x direction) in the case where the X-ray emitted from the X-ray emitting terminal of the condenser 30 is converged into linear shape, is matched with a length direction of the sample S.
    • 要解决的问题:提供能够进行高效X射线分析的X射线分析装置。解决方案:X射线分析装置1包括X射线源10,狭缝20,冷凝器30,保持器40 ,检测器50,扫描器60,闪烁体70,成像器80和控制器90,并且分析由保持器40保持的样本S的包含分量。冷凝器30从X射线发射端发射X射线 从X射线源10通过狭缝20的开口入射到X射线入射端子,并将X射线收敛成x方向长且在ay方向短的线状。 在样品S是线性的情况下,保持器40保持样品S,使得从冷凝器30的X射线发射端射出的X射线的长度方向(x方向)为 收敛成线状,与样品S的长度方向一致。