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    • 31. 发明专利
    • Semiconductor device and method for manufacturing semiconductor device
    • 半导体器件及制造半导体器件的方法
    • JP2009206328A
    • 2009-09-10
    • JP2008047834
    • 2008-02-28
    • Renesas Technology Corp株式会社ルネサステクノロジ
    • KURATOMI BUNJISHIMIZU FUKUMISUGIYAMA MICHIAKI
    • H01L21/56H01L25/10H01L25/11H01L25/18
    • H01L25/0657H01L2224/48225H01L2224/48227H01L2225/06568H01L2924/10253H01L2924/15311H01L2924/15331H01L2924/00
    • PROBLEM TO BE SOLVED: To solve the problem that although a sealed body to be sealed becomes thin as a semiconductor device becomes thinner recently and an air vent for discharging air in a cavity to the outside so as to improve charging property for a resin is provided to a metal mold, the air vent becomes smaller as the semiconductor becomes thinner to make the air vent portion apt to be clogged with the resin, and then the formed sealed body includes an uncharged region (absent region) to increase the possibility of production of a product defective. SOLUTION: In a method for manufacturing the semiconductor device, a detection pattern portion including a metal pattern is provided nearby outside a corner portion of a nearly rectangular resin sealed region, where a semiconductor chip on a wiring board is sealed, corresponding to the air vent portion of the metal mold, thereby when a resin charging state is observed by making an observation nearby outside the corner portion with reflected light by using an optical system. COPYRIGHT: (C)2009,JPO&INPIT
    • 解决的问题为了解决近来半导体器件变薄时密封体密度变薄的问题,以及用于将空腔中的空气向外部排出的排气口,以改善对于 树脂被提供到金属模具中,随着半导体变薄而使排气口变小,使得通气部分易于被树脂堵塞,然后形成的密封体包括不带电区域(不存在区域)以增加可能性 的产品有缺陷。 解决方案:在制造半导体器件的方法中,在近似矩形的树脂密封区域的角部附近设置包括金属图案的检测图案部分,其中布线板上的半导体芯片被密封,对应于 从而当通过使用光学系统通过用反射光观察角落附近的观察来观察树脂充电状态时的金属模的通气部。 版权所有(C)2009,JPO&INPIT
    • 33. 发明专利
    • Semiconductor device and its manufacturing method
    • 半导体器件及其制造方法
    • JP2006196734A
    • 2006-07-27
    • JP2005007277
    • 2005-01-14
    • Renesas Technology Corp株式会社ルネサステクノロジ
    • NUMAJIRI WATARUKAWADA YOICHISUGIYAMA MICHIAKIUJIIE MIKAKO
    • H01L23/12
    • H01L2224/32145H01L2224/32225H01L2224/48091H01L2224/48227H01L2224/48465H01L2224/49113H01L2224/73265H01L2924/00014H01L2924/00
    • PROBLEM TO BE SOLVED: To provide a semiconductor device hard to cause a damage of a semiconductor chip and having a satisfactory connectivity with a mounting substrate.
      SOLUTION: The semiconductor device 1 comprises a plurality of electrode pads 7 on a first surface 2a, a plurality of external electrode terminals 4 on a second surface 2b opposite to the first surface. The electrode pad and the external electrode terminal are electrically connected by a conductor 8 provided from the first surface through the second surface. The semiconductor device 1 also comprises a first insulating layer 5 provided on the second surface apart in the predetermined distance from the external electrode terminal, and a wiring board 2 having a second insulating layer 9 and the semiconductor chip 11 having a plurality of electrtodes fixed on a second insulating layer of the first surface of the wiring board through an adhesive agent 10; a wire 17 for electrically connecting the electrodes of the semiconductor chip and the electrode pads of the wiring board; and a seal 3 comprising an insulating material covering all over the semiconductor chip and the wire, and provided over the first surface of the wiring board.
      COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题:提供一种难以引起半导体芯片的损坏并且与安装基板具有令人满意的连接性的半导体器件。 解决方案:半导体器件1包括在第一表面2a上的多个电极焊盘7,在与第一表面相对的第二表面2b上的多个外部电极端子4。 电极焊盘和外部电极端子由通过第二表面从第一表面提供的导体8电连接。 半导体器件1还包括设置在与外部电极端子隔开预定距离的第二表面上的第一绝缘层5和具有第二绝缘层9的布线板2和具有多个电极固定的半导体芯片11 布线板的第一表面的第二绝缘层通过粘合剂10; 用于电连接半导体芯片的电极和布线板的电极焊盘的导线17; 以及密封件3,其包括覆盖半导体芯片和导线上的绝缘材料,并且设置在布线板的第一表面上。 版权所有(C)2006,JPO&NCIPI