会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 32. 发明专利
    • MANUFACTURE OF SEMICONDUCTOR DEVICE
    • JPH10144723A
    • 1998-05-29
    • JP31553496
    • 1996-11-12
    • HITACHI LTDHITACHI VLSI ENGHITACHI CABLE
    • SHIMOISHI TOMOAKIAKIYAMA YUKIJIONDA MAMORU
    • H01L21/60
    • PROBLEM TO BE SOLVED: To prevent stress from remaining in a inner lead subsequent to a bonding. SOLUTION: In a connection process, a chip 10 is bonded to a tape carrier 1 with an inner lead 4 and outer leads 5, which are laid on one main surface of the chip 10, via an insulating film 8. A notch 6 is formed in the inner lead 4 at a biased position on the inner lead 4. In an inner lead bonding process, the short part 4a of the inner lead 4 is tapped with a bonding tool 13, is cut and thereafter, a cut part piece on the side of the long part 4 of the inner lead 4 is curved by the tool 13 and is thermally pressure-bonded to an electrode pad 12. In a resin sealing process, a silicone rubber is potted in a window hold 3 formed in a carrier main body 2 and a resin-sealed part 14 is formed. Bumps 15 are respectively formed on bump formation holes 7 formed in the outer leads 5. Accordingly, as a stress can be prevented from remaining in the inner lead subsequent to the bonding, the inner lead can be prevented from being disconnected by a thermal stress to act on a CSB(chip size package) and an IC.