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    • 31. 发明专利
    • Memory device
    • 内存设备
    • JP2003085121A
    • 2003-03-20
    • JP2001270518
    • 2001-09-06
    • Elpida Memory Incエルピーダメモリ株式会社
    • SENBA SEIJINISHIO YOJI
    • G06F3/00G06F12/00G06F13/16G11C5/06G11C7/00G11C7/10G11C11/401G11C11/4093H03K19/0175G11C11/409
    • G11C7/1048G11C5/063G11C7/10G11C11/4093
    • PROBLEM TO BE SOLVED: To provide a memory device capable of reducing waveform distortion by reflection caused at high speed operation time in the memory device for mounting a controller on a mother board together with a plurality of memory modules.
      SOLUTION: This memory device is obtained with the constitution for arranging an active terminator in the controller and a memory unit since signal reflection is caused at writing and reading time of the memory unit on the memory modules by the controller. The active terminator is arranged in response to a data bus and/or a clock bus. The active terminator is arranged for terminating a line in the memory unit corresponding to the data bus and the clock bus. The active terminator arranged in the controller and the memory unit may be controlled in a nonoperating state when becoming the data receiving side.
      COPYRIGHT: (C)2003,JPO
    • 要解决的问题:提供一种能够在用于将控制器与多个存储器模块一起安装在母板上的存储装置中在高速操作时间引起的反射减少波形失真的存储装置。 解决方案:由存储器单元的写入和读取时间由控制器在存储器模块上引起信号反射,从而获得用于将有源终端器布置在控制器中的结构和存储单元的存储器件。 有源终端器响应于数据总线和/或时钟总线被布置。 有源终端器被安排用于终止对应于数据总线和时钟总线的存储器单元中的一行。 布置在控制器和存储器单元中的有源终端器在成为数据接收侧时可以被控制在非操作状态。
    • 32. 发明专利
    • Inverter apparatus
    • 逆变器装置
    • JP2009254056A
    • 2009-10-29
    • JP2008096698
    • 2008-04-03
    • Hitachi Ltd株式会社日立製作所
    • SENBA SEIJI
    • H02M1/08H02M1/00H02M7/48H03K17/16H03K17/56
    • PROBLEM TO BE SOLVED: To effectively avoid inverse surge between a reference potential terminal of a signal for driving a high potential side IGBT and a reference potential terminal of a gate drive IC even in an inverter apparatus which feeds a large current to a power module. SOLUTION: An inverter apparatus comprises: an IGBT module 113 having a high potential side IGBT 121 and a low potential side IGBT 123; a gate drive IC 101 for driving the high potential side IGBT 121 and the low potential side IGBT 123; a capacitor 128 provided between a reference potential terminal 106 for high potential side IGBT driving signal of the gate drive IC 101 a collector terminal 117 of the low potential side IGBT 123; and a resistor 127 provided between the reference potential terminal 106 for high potential side IGBT driving signal of the gate drive IC 101 and an emitter terminal 116 of the high potential side IGBT 121. COPYRIGHT: (C)2010,JPO&INPIT
    • 要解决的问题:为了有效地避免用于驱动高电位侧IGBT的信号的参考电位端子与栅极驱动IC的基准电位端子之间的反向浪涌,即使在向大电流馈电的逆变器装置中 电源模块 解决方案:逆变器装置包括:具有高电位侧IGBT 121和低电位侧IGBT 123的IGBT模块113; 用于驱动高电位侧IGBT 121和低电位侧IGBT 123的栅极驱动IC 101; 设置在栅极驱动IC101的高电位侧IGBT驱动信号的基准电位端子106和低电位侧IGBT123的集电极端子117之间的电容器128; 以及设置在栅极驱动IC101的高电位侧IGBT驱动信号的基准电位端子106和高电位侧IGBT 121的发射极端子116之间的电阻器127.(C)2010,JPO&INPIT
    • 33. 发明专利
    • INPUT/OUTPUT CIRCUIT, REFERENCE VOLTAGE GENERATING CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT
    • JP2003133943A
    • 2003-05-09
    • JP2001331397
    • 2001-10-29
    • ELPIDA MEMORY INC
    • SENBA SEIJI
    • H03K19/0175H03F1/56H03F3/62H03K19/0185H04L25/02
    • PROBLEM TO BE SOLVED: To provide an input/output circuit equipped with a termination circuit which restrains increase in the chip area. SOLUTION: The circuit is provided with an output buffer, an input buffer 10 and a control circuit 20. The output buffer consists of a 1st series circuit comprised of a transistor MP11 and a resistor R11, and a 2nd series circuit comprised of a transistor MP12 and a resistor R13 which are connected in parallel between a high-level side power supply VDDQ and an input/output terminal DQ, a 3rd series circuit comprised of a transistor MN11 and a resistor R12, and a 4th series circuit comprised of a transistor MN12 and a resistor R14 which are connected in parallel between a low-level side power supply GND and the input/output terminal DQ. The input buffer 10 where its input terminal is connected to the input/output terminal DQ. The control circuit 20 which controls at output, common supply of the signal that is obtained by inverting output data to the gates of the transistors MP11, MP12, MN11, and MN12, and at input, applying the VDDQ and the GND power supply voltages respectively to the gates of the transistors MP11 and MN11, and applying the GND and the VDDQ power supply voltages respectively to the control terminals of the transistor MP12 and the MN12.
    • 35. 发明专利
    • CIRCUIT DATA DISPLAY METHOD AND CIRCUIT DATA INPUT METHOD USING THE SAME
    • JPH07129652A
    • 1995-05-19
    • JP27805893
    • 1993-11-08
    • HITACHI LTD
    • SENBA SEIJIYOKOMIZO KOICHI
    • G06F17/50
    • PURPOSE:To simultaneously display a circuit diagram and circuit characteristics on one screen by displaying the circuit characteristics by the positions of nodes and the shape and size of element symbols in the circuit diagram. CONSTITUTION:The input of the circuit diagram is performed by arranging the element symbols and connecting terminals by wiring elements. Then, the nodes are arranged so as to be lined in a vertical direction on the screen. in this case, the screen is composed of a scale b4 for expressing the correspondence of a node voltage and the vertical direction on the screen, a result display b3 and a means b8 for specifying the analysis time. Before and after the result display, the positions of the nodes in the vertical direction on the screen in the circuit diagram are changed. In the result display, a transient analysis result at the time of 6.2 nanoseconds is indicated and it is indicated that the voltage of the node b5 is 15V, the voltage of the node b6 is 5V and the voltage of the node b7 is 2V. In the case of referring to a circuit simulation result at the other analysis time, by shifting the slider of the b8, the time is changed and the display is performed.
    • 39. 发明专利
    • METHOD FOR SUPPORTING CIRCUIT DESIGN
    • JPH08161363A
    • 1996-06-21
    • JP30457594
    • 1994-12-08
    • HITACHI LTD
    • SENBA SEIJIYOKOMIZO KOICHIKANBARA SHIRO
    • G06F17/50
    • PURPOSE: To save the handling time of repeating element circuit design where an errorneous specification is allotted by preventing the errorneous specification from being allotted to an element circuit. CONSTITUTION: This system is provide with a processing for reading the specification of the whole circuit and an arithmetic expression to roughly calculate whole circuit performance more than element circuit performance as inputs, a database 12 including the design data of the element circuit having variation both in the input and a function and performance, an element circuit combination retrieval processing 13b retrieving the combination of the element circuits meeting the whole circuit specification from the database 12 and an element circuit output processing 14 executing an output when the relevant element circuit exists. An element circuit extraction processing extracting the element circuit with a performance value equal to below a fixed reference value from the database 12 is also provided.