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    • 22. 发明专利
    • Die device
    • DIE设备
    • JP2003001378A
    • 2003-01-07
    • JP2001189535
    • 2001-06-22
    • Mitsubishi Electric Corp三菱電機株式会社
    • TANAKA SHIGEYUKIKASHIBA YOSHIHIROWATANUKI KAORU
    • B22D18/04B22C9/06B22D17/22B29C33/04B29C45/73
    • B29C45/73
    • PROBLEM TO BE SOLVED: To provide a die device capable of improving a cooling effect of a die even the die reaches a high temperature.
      SOLUTION: In the die device, a cavity face 12 is formed in a mobile side die 11 along a shape of a forming body, a space part 13 is provided on a back face side of the cavity face 12, and a fitting tool 15 for a mobile side die for fitting the mobile side die 11 to a die device seat 14 so as to surround the space part 13. An extrusion member 16 for separating the forming body from the cavity face 12 is fitted to a hydraulic cylinder 18 with a fitting tool for an extrusion member. A pipe 19b having a plurality of jetting nozzles 19a is inserted inside the space part 13 at the opposed position against a back face side 11a of the cavity face 12 from the fitting tool 15 and connected to a pump 21 for feeding a cooling liquid through a valve 20.
      COPYRIGHT: (C)2003,JPO
    • 要解决的问题:为了提供一种能够提高模具的冷却效果的模具,即使模具达到高温。 解决方案:在模具装置中,沿着成形体的形状在移动侧模具11中形成空腔面12,在空腔面12的背面侧设置有空间部13,以及用于 用于将移动侧模具11装配到模具装置座14以便围绕空间部分13的移动侧模具。用于将成形体与腔体表面12分离的挤出构件16被装配到具有配件的液压缸18 用于挤压构件的工具。 具有多个喷射喷嘴19a的管19b在相对位置处插入到空腔部13的相对位置处,从配合工具15抵靠空腔面12的背面侧11a,并连接到泵21,供给冷却液通过 阀门20。
    • 26. 发明专利
    • SEMICONDUCTOR DEVICE
    • JPH1032218A
    • 1998-02-03
    • JP18618296
    • 1996-07-16
    • MITSUBISHI ELECTRIC CORP
    • NAKAJIMA YASUSHIKASHIBA YOSHIHIRO
    • H01L23/36H01L21/60
    • PROBLEM TO BE SOLVED: To provide a semiconductor device in which the life of a junction part until peel-off break is prolonged and which has high reliability, by joining a peripheral portion of a surface electrode of a semiconductor element with an external electrode through a wire. SOLUTION: A semiconductor device has a semiconductor element 1 having an electrode 6 formed on the surface thereof, an external electrode 5 provided on the outside of the semiconductor element 1, and a plurality of wires 7 for joining the surface electrode 6 with the external electrode 5. Each of the wires 7 joins the peripheral portion of the surface electrode 6 with the external electrode 5. For example, the semiconductor element 1 is fixed on an insulating radiation board 2, and the insulating radiation board 2 is fixed on a heat sink 8. Each of the wires 7 continuously joins two positions on the peripheral portion of the surface electrode 6 on the semiconductor element 1 and the external electrode 5 on the insulating radiation board 2. Thus, since the junction parts of the wires 7 may avoid a high-temperature region of the semiconductor element 1 so as to enable reduction in thermal stress, the life of the junction parts may be prolonged.