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11. 发明专利

JPS5454664A MEASURING APPARATUS FOR THICKNESS OF BILLET SOLIDIFICATION IN CONTINUOUS CASTING 失效
公开(公告)号：JPS5454664A
公开(公告)日：1979-05-01
申请号：JP12052477
申请日：1977-10-08
申请人： NIPPON STEEL CORP
发明人： SUZUKI HISAO , KAWASHIMA KATSUHIRO , MUROTA SHIYOUJI , NAKAMORI YUKIO
IPC分类号： G01B7/14 , B22D11/16 , G01B7/00
摘要： PURPOSE:To make casting conditions optimum, and achieve the improvement in the productivity and quality in continuous casting by generating ultrasonic waves directly in billets through mutual action of electricity and magnetism and measuring the thikness of solidified layers from the propagation time of the ultrasonic waves. CONSTITUTION:When pulse currents are flowed in an ultrasonic wave generating coil 9 from a high frequency pulse power source 10, ultrasonic waves are generated and transmit through the portions of the solidified layer and unsolidified layer 3 of a billet 4, arriving at the opposite face. Eddy currents are generated in the surface of the billet 4 by the vibrating force of the ultrasonic waves having arrived and the magnetic fields produced in an iron core 6. The eddy currents are then detected with a coil 17 and amplified and detected with an amplification detection circuit 18. As a result, time pulses are passed by a gate circuit 20 during the time from the generation of the ultrasonic waves up to their detection and are counted in a counter circuit 22. The time signal of the counter circuit 22, the temperature singal of the billet 4 of a temperature setter 23 and the overall billet thickness signal of an overall billet thickness setter 27 are sent to an arithmetic circuit 28, whereby the solidified thickness are computed.

12. 发明专利

JPS53124486A TEMPERATURE MEASURING APPARATUS BY ULTRASONIC WAVES 失效
公开(公告)号：JPS53124486A
公开(公告)日：1978-10-30
申请号：JP3905977
申请日：1977-04-07
申请人： NIPPON STEEL CORP
发明人： NAKAMORI YUKIO , KAWASHIMA KATSUHIRO , EZAKI AKIRA , HATSUTORI YAHEIJI
IPC分类号： G01K11/22 , G01K11/24
摘要： PURPOSE:To make possible high accuracy measurement even for high temperatures by performing transmission and reception of ultrasonic waves by welding a delay bar contacting a probe to the body to be measured.

13. 发明专利

JPS5368293A ELECTROMAGNETIC ULTRASONIC INSPECTING METHOD 失效
公开(公告)号：JPS5368293A
公开(公告)日：1978-06-17
申请号：JP14384876
申请日：1976-11-30
申请人： NIPPON STEEL CORP
发明人： KAWASHIMA KATSUHIRO , SUZUKI HISAO , MUROTA SHIYOUJI , NAKAMORI YUKIO
IPC分类号： G01N29/04
摘要： PURPOSE:To detect surface defects in a contactless state by generating surface ultrasonic waves with the mutual action of the eddy currents induced on a conductive material surface and the magnetic field by the current flow in a coil and detecting the ultrasonic waves reflected from the surface defects.

14. 发明专利

JPS531078A COIL FOR GENERATING AND DETECTING ELECTROMAGNETIC ULTRASONIC WAVE 失效
公开(公告)号：JPS531078A
公开(公告)日：1978-01-07
申请号：JP7510976
申请日：1976-06-25
申请人： NIPPON STEEL CORP
发明人： SUZUKI HISAO , KAWASHIMA KATSUHIRO , MUROTA SHIYOUJI , NAKAMORI YUKIO
IPC分类号： G01N27/90 , G01N29/04 , H01F5/00
摘要： PURPOSE:To plan to realize small size and precision, by employing two spiral coils formed on upper surface of insulation board with printing technique.

15. 发明专利

JPS5270882A INSPECTING TUBE FOR RADIATION THERMOMETER 失效
公开(公告)号：JPS5270882A
公开(公告)日：1977-06-13
申请号：JP14761275
申请日：1975-12-09
申请人： NIPPON STEEL CORP , KAWASOU DENKI KOUGIYOU KK
发明人： NAKAMORI YUKIO , KAKIMOTO SUMITADA , FUJITA JIYUNICHI , SAKAGUCHI IKUHEI , SHIBATA TOMOO
IPC分类号： G01J5/04 , G01J5/06
摘要： PURPOSE:To provide an inspection tube for a radiation thermometer, which is equipped the radiation thermometer at its upper end and which is formed at its upper portion with a low pressure air supply port and at the expanded outer perphery of its lower end with a high pressure air supply port so that the surface temperature of an object may be measured while removing the water film or droplets thereon without being lowered.

16. 发明专利

JP2000275032A TAPE CARRIER DEFECT INSPECTION DEVICE 失效
公开(公告)号：JP2000275032A
公开(公告)日：2000-10-06
申请号：JP7949799
申请日：1999-03-24
申请人： NIPPON STEEL CORP , NIPPON INTER CONNECTION SYSTEM
发明人： MATSUI HIDEKI , IDEMOTO HIROSHI , NAKAMORI YUKIO
IPC分类号： G01B11/30
摘要： PROBLEM TO BE SOLVED: To provide a tape carrier defect inspection device capable of managing the inspected result of products by a frame unit. SOLUTION: A CCD camera 31a picks up the image of a tape carrier carried to a prescribed inspection area by a carrying device 10, a defect inspection part 20a inspects a defect generated in the respective products of the tape carrier based on the obtained image and a storage part 80 stores the inspected result for the respective products of respective frames. A general controller 70 manages the inspected result and obtains the yield of the product for the respective frames for instance. Also, in the case of inspecting both surfaces of the tape carrier, the general controller 70 reads the inspected result of one surface from the storage part 80 after one of the front and back surfaces is inspected, specifies the product judged as normal based on the inspected result and controls the defect inspection part 20a so as to inspect only the specified product for the other surface.

17. 发明专利

JP2000227402A TAPE CARRIER DEFECT INSPECTION SYSTEM, TAPE CARRIER DEFECT INSPECTION METHOD, AND TAPE CARRIER DEFECT INSPECTION DEVICE 失效
公开(公告)号：JP2000227402A
公开(公告)日：2000-08-15
申请号：JP2996499
申请日：1999-02-08
申请人： NIPPON STEEL CORP , NIPPON INTER CONNECTION SYSTEM
发明人： IDEMOTO HIROSHI , MATSUI HIDEKI , NAKAMORI YUKIO
IPC分类号： G01N21/89 , G01N21/88 , G01N21/892 , G01N21/93 , G06T1/00 , G06T7/00
摘要： PROBLEM TO BE SOLVED: To provide a tape carrier defect inspection system capable of setting inspection information even under operation of an inspection device. SOLUTION: A setting.verifying device B is connected each other to plural inspection devices A1, A2...AN for inspecting a defect generated in each product in a tape carrier. The device B displays on a display an image provided by image-picking up a sample piece in the tape carrier by an image picking-up means for setting, and sets, on the display, inspection information a kind by a kind of the tape carrier based on a direction input from an input means. The image-picking-up means for the setting has an optical system same to inspecting image-picking-up means for the inspection devices A1, A2,...AN, and image-picks up the sample piece under the circumstance same to a circumstance at the time of image picking-up by the inspecting image-picking-up means. Each of the inspection devices A1, A2...AN reads out the inspection information for the kind of the desirable tape carrier from the setting.verifying device B to conduct inspection using the read-out inspection information.

18. 发明专利

JPH01205517A METHOD AND APPARATUS FOR VAPOR GROWTH 失效
公开(公告)号：JPH01205517A
公开(公告)日：1989-08-17
申请号：JP3012188
申请日：1988-02-12
申请人： NIPPON STEEL CORP
发明人： FUJII SATOSHI , FUJITA YUKIHISA , INAI TORU , NAKAMORI YUKIO
IPC分类号： C30B25/16 , C23C16/18 , C23C16/52 , H01L21/205 , H01L21/263
摘要： PURPOSE:To obtain a thin film whose film thickness and composition ratio are uniform as compared with a conventional method by a method wherein a concentration value of a raw material gas inside a reaction tube is monitored easily during a growth operation, on the spot and without disturbing the flow of the raw material gas and a growth condition is controlled by feeding back an obtained data to a growth apparatus. CONSTITUTION:A thin film crystal is grown on a substrate 12 by a metal organic vapor growth method. During this process, one or two or more modulated light beams of a prescribed wavelength are incident into a reaction tube 9; an intensity ratio of a transmitted beam is found. A molar concentration value of an MO gas inside the reaction tube 9 is detected from the intensity ratio of the transmitted beam and from an absorption cross-sectional area obtained from an absorption spectrum which is inherent in the MO gas with reference to the wavelength. On the basis of a change with the passage of time of the mol concentration value of the MO gas, the amount of hydrogen gas is controlled so as to make the MO gas near the substrate 12 constant. By this setup, it is possible to obtain a thin film whose film thickness and composition ratio are uniform as compared with a conventional method.

19. 发明专利

JPS63315854A METHOD OF CONTROLLING HOT WATER SURFACE AND HOT WATER TEMPERATURE IN BATH TUB OF RESIN CONTAINER 失效
公开(公告)号：JPS63315854A
公开(公告)日：1988-12-23
申请号：JP14793687
申请日：1987-06-16
申请人： NIPPON STEEL CORP
发明人： NAKAMORI YUKIO , HOSHINO TAIZO
IPC分类号： G01F23/26 , F24H1/00 , F24H9/20
摘要： PURPOSE:To enable the hot water level and the hot water temperature to be controlled with a convenient method by a method wherein a sensor is fixed to a wall of a bath tub. CONSTITUTION:One or more temperature sensors are arranged either at an outer wall of a bath tub or at a corner part within the bath tub and a mean temperature of hot water temperature is accurately assumed in combination with a water level meter in response to a measured temperature value. The hot water level detection is performed such that an AC oscillator 3 is connected to one electrode, a current amplifier 4 is connected to another electrode and an electrostatic capacitance between the electrodes is measured. Electrostatic capacitance type detectors 1-5 and 1-6 are fixed to a wall of a bath tub 20. The detector 1-5 corresponds to a position of a target hot water level and the detector 1-6 is used for preventing a non-water firing. When no water is present within the bath tub 20, an electrostatic capacitance of the bath tub 20 itself is 3-6 of a dielectric constant of a resin system. As the hot water surface level rises up to a position of a detecting end, the electrostatic capacitance becomes more than ten times due to the fact that a dielectric constant of water is 70-80. Measurement of hot water temperature within the bath tub is performed under an arrangement in which a temperature detector, for example, a thermocouple or a thermistor ro the like is fixed in series against an outer wall of the bath tub at 1-1-1-4. Thus, a means hot water temperature can easily be measured.

20. 发明专利

JPS63303315A SCANNER OF CASSEGRAIN OPTICAL SYSTEM 失效
公开(公告)号：JPS63303315A
公开(公告)日：1988-12-09
申请号：JP13826487
申请日：1987-06-03
申请人： NIPPON STEEL CORP
发明人： MATSUMURA ATSUKI , NAKAMORI YUKIO , INAI TORU , HOSHINO TAIZO
IPC分类号： G01J5/08 , G01J5/58 , G02B26/10
摘要： PURPOSE:To make measurement at a high speed with high accuracy and to expand the range of measurement by periodically oscillating the two mirrors of a Cassegrain optical system combined with a main mirror (concave mirror) and auxiliary mirror (convex mirror) in the directions orthogonal with each other to scan a sample surface. CONSTITUTION:A reflecting mirror 7 is inserted on the optical axis and while a sample 2 is kept monitored by a CRT 11, the sample is set in a prescribed position and thereafter, the mirror 7 is removed from the optical axis and the measurement is started. Namely, the light radiated from the sample 2 is reflected by the main mirror 3 and auxiliary mirror 4 of the Cassegrain optical system and is entered to a detector 18 via a reflecting mirror 12, a chopper 13, a cavity 15 for calibrating the sensor, a pinhole 16 and the Cassegrain optical system 17. This light is converted to an electric signal corresponding to the intensity thereof, which signal is inputted to a synchronous control mechanism 20. Respectively 50Hz and 0.5Hz signals are impressed to respective driving mechanisms 6, 5 of the auxiliary mirror 4 and the main mirror 3 from the control mechanism 20 to scan the mirror 4 and the mirror 3 respectively in the directions X, Y of the sample 2 in the case of measuring the surface of the sample 2 at, for example, 100 lines, 100 points per, line, and total 100 points. The scanning of one image plane in about 2sec is then possible.

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