会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 12. 发明专利
    • Manufacture of photoelectric converter element
    • 光电转换元件的制造
    • JPS5918685A
    • 1984-01-31
    • JP12812182
    • 1982-07-21
    • Matsushita Electric Ind Co Ltd
    • TAKEDA YOSHIYAHOTSUTA TEIKICHICHIKAMURA TAKAOYANO KOUSAKUMIYATA YUTAKAFUJIWARA SHINJI
    • H01L27/146H01L31/0248H01L31/20
    • H01L31/202Y02E10/50Y02P70/521
    • PURPOSE:To obtain an element, which has a stopper type structure, high resolution, and low dark currents, by forming a non-single crystal semiconductor film layer on one or both sides of a non-single crystal semiconductor film made by a reactive sputtering method by using a plasma CVD method. CONSTITUTION:Under the state a transparent electrode 2 is formed on a glass substrate 1, amorphous Si 3 including hydrogen is formed by a plasma CVD method. Amorphous Si 4 including hydrogen is formed thereon by a reactive sputtering method. Since this is used as a target for an image pickup tube, an Sb2S3 layer 5 is formed on the Si 4. The amorphous semiconductor made by the reactive sputtering method can be made to have higher resistance readily in comparison with the plasma CVD method. The sputtering method is promising as an image pickup device which requires high resolution. Since the discharges power of the method is large, it has the defect of giving damages to the substrate. Therefore, by using both methods, the photoelectric converter element having excellent quality can be obtained.
    • 目的:通过在由反应溅射制成的非单晶半导体膜的一面或两面上形成非单晶半导体膜层,以获得具有塞子型结构,高分辨率和低暗电流的元件 方法。 构成:在该状态下,在玻璃基板1上形成透明电极2,通过等离子体CVD法形成包含氢的非晶Si 3。 通过反应溅射法在其上形成包含氢的无定形Si 4。 由于将其用作图像拾取管的目标,所以在Si 4上形成Sb 2 S 3层5.与等离子体CVD法相比,通过反应溅射法制成的非晶半导体可以容易地具有更高的电阻。 溅射法作为需要高分辨率的图像拾取装置是有希望的。 由于该方法的放电功率大,所以具有对基板造成损害的缺点。 因此,通过使用这两种方法,可以获得具有优良品质的光电转换元件。
    • 17. 发明专利
    • SOLID STATE PICKUP DEVICE
    • JPS5527772A
    • 1980-02-28
    • JP10109578
    • 1978-08-18
    • MATSUSHITA ELECTRIC IND CO LTD
    • CHIKAMURA TAKAOOGAWA KAZUFUMITERUI YASUAKIFUJIWARA SHINJIFUKAI SHIYOUICHI
    • H01L27/146H01L31/00H04N5/30H04N5/335H04N5/351H04N5/355H04N5/359H04N5/369H04N5/372H04N5/374
    • PURPOSE:To eliminate the picture disturbance to the intensive light and thus to enable the picking- up by applying the DC bias voltage to the electrode on the photo conductor in order to give the functin to reduce the blooming phenomenon as well as the function to control the light sensitivity. CONSTITUTION:The diode of n -type region 11 is formed on n-type semiconductor substrate 10, and then p -type region 12 is formed to secure the function of the potential barrier which blocks the electron injection from region 11 in the case of the CCD action, along with n -type region 13 which functions as the potential well in the case of the BBD action. Furthermore, gate oxide film 16 functioning as the insulator film is formed on substrate 10 and between substrate 10 and 1st gate electrode 14 along with electrode 14 formed on substrate 10. At the same time, 1st electrode 17 of the diode connected electrically to region 11 is formed along with insulator layer 16 which give an electric isolation between electrode 17, substrate 10 and electrode 14 respectively. Then the positive potential is applied to transparent electrode 20 formed on the upper surface of photo conductor 19 from voltage source 21, and the output of the optical signal is detected by source 21. And the output signal is converted into the DC voltage and then fed back to source 21. Thus the blooming phenomenon can be reduced along with the control secured for the light sensitivity.
    • 20. 发明专利
    • IMAGE PICKUP TUBE TARGET
    • JPH01115036A
    • 1989-05-08
    • JP27186687
    • 1987-10-29
    • MATSUSHITA ELECTRIC IND CO LTD
    • CHIKAMURA TAKAOFUKAI SHOICHIMIYATA YUTAKA
    • H01J29/45
    • PURPOSE:To make it possible to realize high sensitivity achieved by avalanche multiplication at a low bias voltage by forming, on a photoelectric conversion film, two or more layers of thin film in which a forbidden band varies in the thickness direction. CONSTITUTION:In the direction of film thickness, there are a photoelectric conversion film 12a with a band gap changed in a thickness-wise direction, and a hole blocking layer 12b. A hole 17a and an electron 17b are excited in the photoelectric conversion film 12a due to incident light 14, and the electron 17b travels via an electric field, finally reaching the side of a transparent electrode 11. On the other hand, the hole 17a moves within the photoelectric conversion film 12a. However, strong potential is internally formed within the photoelectric conversion film 12a and the hole 17a receives acceleration energy enough to excite a space between bands. Consequently, the hole 17a travels within the photoelectric conversion film 12a, causing the double generation of avalanche, and reaches an electron blocking layer 13. This hole 17a modulates potential charged with an electron beam 15 and turns to be a signal current. In this way, the fully excited hole 17a generates a doubled avalanche and, therefore, high sensitivity is available.