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    • 18. 发明专利
    • Device for detecting defect in painted film
    • 用于检测印刷膜中的缺陷的装置
    • JPS59162451A
    • 1984-09-13
    • JP3598083
    • 1983-03-07
    • Hitachi Eng Co LtdHitachi Ltd
    • SUMIDA NOBUOITOU HISAOSAITOU TAKASHIOONAKA NORIYUKISHIYOUJI SABUROUHASHIMOTO HISAMASAKOBAYASHI MASATO
    • G01N29/04G01N29/24
    • G01N29/2418
    • PURPOSE:To detect the defect in a painted film nondestructively and readily, by periodically emitting light to the painted film, and detecting elastic waves generated on the film. CONSTITUTION:The light emitted from a xenon lamp 24 is intermittently projected on a measuring cell 16 by way of a condenser lens 12, an interference filter 26, and a light chopper 28. Elastic waves generated by the expansion and contraction of a painted film are detected by a microphone 34 and inputted to a lock in amplifier 20. The input signal from the microphone 34 is turned with the signal from a photocoupler 36, which is synchronized with the light chopper 28, and amplified by the amplifier 20. The result is displayed on a recorder 22. Thus the defects in the painted film are readily detected nondestructively.
    • 目的:通过周期性地向涂漆膜发光,并且检测在胶片上产生的弹性波,以非破坏性和容易地检测涂膜中的缺陷。 构成:从氙灯24发出的光通过聚光透镜12,干涉滤光器26和光斩波器28间歇地投影在测量单元16上。由涂膜的伸缩产生的弹性波为 由麦克风34检测并输入到放大器20中的锁定。来自麦克风34的输入信号与来自与光斩波器28同步并由放大器20放大的光电耦合器36的信号转动。结果是 显示在记录器22上。因此,涂膜的缺陷容易被非破坏地检测。