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    • 93. 发明专利
    • METHOD AND APPARATUS FOR REMOVING BACKGROUND AND RADIATION MEASURING APPARATUS
    • JPH08122440A
    • 1996-05-17
    • JP25376694
    • 1994-10-19
    • ARAKI HARUMI
    • ARAKI HARUMI
    • G01V5/00G01T1/167G01T1/17G01T1/20
    • PURPOSE: To remove background from a measurement of γ-value by subtracting the radiation dose in high energy band contiguous to some energy band from the radiation dose detected in that band. CONSTITUTION: A subtractor 14 in a correction circuit 12 subtracts a Compton scattering component C3 from the output value thoron Tn from a γ-ray detector 10 and outputs a corrected value, i.e., the detected thoron value from which the Compton scattering component of background is removed. Similarly, a Compton scattering component C2 is subtracted 16 from a radon Rn and a corrected radon value is outputted. A divider 18 divides the radon Rn by the thoron Tn and multiplies 20 the qoutient by the component C. Furthermore, potassium K is multiplied by 4/3 and a subtractor 24 subtracts the output 20 therefrom thus outputting a corrected value, i.e., a detected value of potassium from which the background is removed. A coefficient unit 26 (28) multiplies the Compton scattering component C1 (scattered γ-ray γs ) by 4/5 (4/3) and a subtractor 30 subtracts the output 26 from the output 28 thus outputting a corrected value, i.e., a detected value of scattered γ-ray from which the background is removed.
    • 94. 发明专利
    • WASTE DISPOSAL METHOD
    • JPH0815493A
    • 1996-01-19
    • JP14790094
    • 1994-06-29
    • NIPPON ISOTOPE KYOKAINGK INSULATORS LTD
    • FURUKAWA OSAMUSHIBATA MINORU
    • G01N23/04B03B13/06B07C5/346G01V5/00G21F9/32
    • PURPOSE:To automatically separate a bag-filled glass from lead which is not suitable and protect an operation rate of an incineration from being lowered by irradiating bag-filled waste with an X-ray, image-processing an irradiation image, counting the total number of pixels of a part of a specified range in accordance with metal and glass light receiving part gradation and comparing it with the predetermined number. CONSTITUTION:Bag-filled waste immediately before a charge inlet 9 of an incinerator 8 is irradated with an X-ray from an X-ray irradiation device 15. X-ray intensity indicates metal light receiving part gradation shows 140-160, and the number of pixels corresponding thereto indicates 10-1000. For instance, X-ray generation voltage is set at about 65KV and X-ray generation current at about 2mA so that glass light receiving part gradation may indicate 160-180 and the number of the pixels corresponding thereto may show 1000-3000. And an obtained irradation ray image is successively read along a scanning ray and a signal level is found. After noise is removed by smoothing processing from the signal level and the image is stressed, the total number of pixels is found, compared with a threshold and metal and glass are removed. Thereby a filter is filled with gasificated lead and refractories are protected from deteriorating by molten glass.
    • 98. 发明专利
    • X-RAY INSPECTION DEVICE
    • JPH06138252A
    • 1994-05-20
    • JP28988292
    • 1992-10-28
    • TOSHIBA CORP
    • KOSUGE HIDEOUYAMA KIICHIRO
    • B07C5/346G01N23/04G01V5/00G21K1/02
    • PURPOSE:To equalize inspection resolution over the whole scanning range of X-ray beams. CONSTITUTION:An opening formed by a fixed slit 2 and a rotating slit 3 makes a round trip in the longitudinal direction of the slit 3 as a rotary disc 4 rotates within the whole range of the angle of deflection of X-ray beams. At a position where the angle of rotation of the disc 4 is different by phi0 in + or - direction, the X-rays pass the same position of the slit 3. The inside surface of the slit 3 is formed into two slopes 3a, 3b of inclination matching the distance from the center O of the disc 4 so that the apparent area of the opening is always uniform relative to changes in the angle theta of deflection of the X-rays, and the slopes 3a, 3b are in symmetry with respect to the center of the slit 3. Therefore, the apparent area of the opening is changed in such a way as to be held constant relative to changes in the angle theta of deflection of the beams and so inspection resolution can be equalized over the whole scanning range of the X-ray beams.