会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 96. 发明专利
    • LOGIC LSI
    • JPH07334267A
    • 1995-12-22
    • JP12529894
    • 1994-06-07
    • HITACHI LTD
    • NOGUCHI YOSHIKINISHIOKA KIYOKAZUOBA SHINYANARITA SUSUMU
    • G06F1/04G06F1/08G06F1/10G06F1/32H01L21/82
    • PURPOSE:To reduce power consumption and to accelerate a response at the same time by selecting an internal clock signal based on the designation information of an operating frequency to be changed out of plural internal clock signals while being interlocked with an operation inside a module. CONSTITUTION:The module is composed of peripheral circuits such as a CPU 1 of the processor of a software, memory 2 and timer 3. A clock generating circuit (CPG) 4 outputs a reference clock signal 9 to be used for generating the plural internal clock signals at the respective modules. The changing command of the operating frequency is transmitted to all the modules as the object of an operating frequency change, and any designated module fetches the information of the operating frequency to be changed, selects the internal clock signal based on the designation information of the operating frequency to be changed out of the plural internal clock signal at good timing while being interlocked with the operation inside that module and changes the internal clock signal to be used inside the module.
    • 99. 发明专利
    • SINGLE CHIP MICROCOMPUTER INCORPORATED WITH SELF-TEST FUNCTION
    • JPH06162225A
    • 1994-06-10
    • JP30674792
    • 1992-11-17
    • HITACHI LTD
    • OSUGA HIROSHINOGUCHI YOSHIKIKATO KANJI
    • G06F11/22G06F13/00G06F15/78
    • PURPOSE:To automatically detect a fault of a built-in peripheral module by retaining a result obtained at the time when it is assumed that there is no fault at the time of test operation of the inside of the peripheral module, and comparing this expected value with the result of operation. CONSTITUTION:To a peripheral module 102, a test operation setting means 205, an expected value retaining means 206 and a comparing means 207 are added, and the expected value retaining means 206 retains a result obtained at the time when it is assumed that there is no fault at the time of test operation. In such a state, when the peripheral module 102 is in a test operation state, the test operation setting means 205 fetches a test operation set value sent from a CPU 100, a control means 201 generates a control signal of a data bus 200 based on this set value, and the data bus outputs the result of execution of a test. The comparing means 207 compares this result of execution and an expected value outputted from the expected value retaining means 206, and outputs a fault detecting signal to an interruption control circuit 103, in the case of noncoincidence. Accordingly, the fault of the peripheral module can be detected in the course of operation of a microcomputer.