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    • 2. 发明公开
    • Aliasing sampler for plasma probe detection
    • Aliasing-Probennehmer zur Detektion mit einer Plasmasonde
    • EP0753876A2
    • 1997-01-15
    • EP96301451.9
    • 1996-03-04
    • ENI, A DIVISION OF ASTEC AMERICA, INC.
    • Keane, Anthony Richard Alan
    • H01J17/32H05H1/36H03B19/00G01R19/255G01R21/133G01R31/24
    • H05H1/0081
    • An aliasing sampler probe (22, Fig. 1) for detecting plasma RF voltage and current employs a sampling signal with a sampling rate slower that the RF fundamental frequency selected to produce an aliasing waveform at an aliasing frequency that is several orders of magnitude below the RF fundamental frequency. In one embodiment, the RF power is applied at 13.56 MHz (Fig. 3A), and sampling pulses have a sampling rate of 2.732 MHz (Fig. 3B) to produce replicas of the RF voltage and current waveforms (Fig. 4) at an aliasing frequency of about 100 KHz. The aliasing replicas preserve phase and harmonic information with an accuracy that is not available from other sampling techniques.
    • 在等离子体布置中,RF发生器以预定的RF频率产生RF电波并且包含影响RF波形的谐波信息,该电波通过RF匹配网络提供给等离子体的功率输入 电波产生等离子体的腔室。 检测器在等离子体室的输入处对RF电波进行采样,以确定施加到等离子体室的RF电功率的测量。 检测器包括用于以低于预定RF频率的预定采样速率对RF波的振幅进行采样的采样装置,以及用于合成采样幅度以在明显低于预定RF频率的预定混叠频率产生混叠波形的装置 ,其中混叠波形保留RF波的谐波信息。