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    • 3. 发明公开
    • SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
    • HERBLEITERBAUEMENT UND HERSTELLUNGSVERFAHRENFÜREIN HALBLEITERBAUELEMENT
    • EP2372771A4
    • 2014-01-15
    • EP09830153
    • 2009-11-25
    • SHOWA DENKO KK
    • SUGAI AKIHIKOSAKAGUCHI YASUYUKI
    • H01L21/316H01L21/04H01L29/861H01L29/872
    • H01L21/0465H01L21/0485H01L29/6603H01L29/872
    • A method of manufacturing a semiconductor device is provided in which a substrate is thinned and a semiconductor region made of a fine pattern is formed. The method of manufacturing of a semiconductor device (101) includes: a fine pattern forming step of forming p-type impurity regions (3, 4) and surface ohmic contact electrodes (5), which are made of fine patterns, using a photolithography method in which a stepper is used, after forming an N-type epitaxial layer (2) on a SiC single-crystal substrate (1); a protective film planarizing step of forming a protective film so as to cover the surface ohmic contact electrodes (5) and performing planarization of the protective film; a substrate thinning step of thinning the SiC single-crystal substrate (1); a backside ohmic contact electrode forming step of forming a backside ohmic contact electrode (7) on the SiC single-crystal substrate (1); a surface Schottky contact electrode forming step of forming a Schottky metal portion (8) connected to the p-type impurity regions (3, 4) and the surface ohmic contact electrodes (5); and a step of forming a surface pad electrode (9) that covers the Schottky metal portion (8).
    • 提供了一种制造半导体器件的方法,其中衬底被薄化并且形成由精细图案制成的半导体区域。 制造半导体器件(101)的方法包括:使用光刻法形成由精细图案制成的p型杂质区(3,4)和表面欧姆接触电极(5)的精细图案形成步骤 在SiC单晶衬底(1)上形成N型外延层(2)之后使用步进器; 保护膜平坦化步骤,形成保护膜以覆盖表面欧姆接触电极(5)并进行保护膜的平坦化; 减薄SiC单晶衬底(1)的衬底稀化步骤; 在SiC单晶衬底(1)上形成背面欧姆接触电极(7)的背面欧姆接触电极形成步骤; 表面肖特基接触电极形成步骤,形成连接到p型杂质区(3,4)和表面欧姆接触电极(5)的肖特基金属部分(8)。 以及形成覆盖肖特基金属部分(8)的表面焊盘电极(9)的步骤。