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    • 2. 发明公开
    • ELEMENTARY ELEMENT
    • 元素元素
    • EP3121146A1
    • 2017-01-25
    • EP14886203.0
    • 2014-03-17
    • Mabuchi, Mahito
    • ASHIDA, Yu
    • B82B1/00B82Y30/00H01J1/304H01L29/66
    • H01J1/3044B82Y30/00H01J37/073H01J2237/06383
    • The present invention designs an elementary element which operates by low-energy particles less susceptible to influence on an S/N ratio by the particles pseudo-one-dimensionally structuring a particle movement portion of particles including electromagnetic waves, electrons, holes, atoms, and molecules between emission and absorption sources of the particles. The present invention designs an elementary element which comprises a modification portion for allowing the particle movement portion coming and going of particles between another elementary element and the elementary element, an interaction, a chemical reaction, and the like between these particles, and time dependent mechanical/electromagnetic force, and controls the emission/absorption of low-energy particles less susceptible to the influence of atomic/molecular species of a constituent material of the particle movement portion, the stereo structure or lattice thereof, the disorders thereof, or the heat of the device thereof on the S/N ratio, and a device constructed from a plurality of elementary elements, which enables much better readiness of a catalytic action not only to control electrons and holes of a transistor and the oxidation-reduction reaction of a fuel cell but also to control the input/output of neutral or ionized atoms than conventional catalysts, tolerance to external field noise including external radiation, and a reduction in energy consumption required to operate the transistor and the like at low temperatures. A device, a module, and a system are constructed from elements including the elementary elements and others.
    • 本发明设计了一种基本元素,其由低能粒子对S / N比影响较小,该粒子假一维构造包括电磁波,电子,空穴,原子的粒子的粒子运动部分, 颗粒的发射和吸收源之间的分子。 本发明设计了一种基本元件,其包括修改部分,用于允许颗粒移动部分在另一个元素和基本元素之间来回移动,这些颗粒之间的相互作用,化学反应等,以及时间依赖的机械 /电磁力,并且控制对能量粒子移动部分的构成材料的原子/分子物质的影响,其立体结构或晶格,其紊乱或其发热的影响的低能粒子的发射/吸收 其器件的S / N比,以及由多个基本元件构成的器件,其能够更好地准备催化作用,不仅可以控制晶体管的电子和空穴以及燃料电池的氧化还原反应 而且还要控制中性或电离原子的输入/输出比常规催化剂,对外部的耐受性 l场噪声,包括外部辐射,以及降低在低温下操作晶体管等所需的能量消耗。 设备,模块和系统由包括基本元素等的元件构成。
    • 5. 发明公开
    • ELECTRON MICROSCOPE
    • ELEKTRONENMIKROSKOP
    • EP2555222A1
    • 2013-02-06
    • EP11762411.4
    • 2011-02-22
    • National University Corporation Nagoya University
    • TANAKA NobuoNAKANISHI TsutomuTAKEDA YoshikazuASANO HidefumiSAITOH KohUJIHARA ToruKUWAHARA Makoto
    • H01J37/26H01J1/34H01J37/073
    • H01J37/26H01J37/073H01J37/265H01J37/266H01J2237/06333H01J2237/06383H01J2237/24557
    • An electron microscope is provided, which utilizes a polarized electron beam and can obtain an image with high contrast by recording an intensity distribution of an electron beam that transmitted through a sample. This electron microscope includes: a laser 2; a polarization apparatus 11 that polarizes a laser beam into a circularly polarized laser beam and that is capable of reversing the direction of the circular polarization over time; a semiconductor photocathode 16 that is provided with a strained superlattice semiconductor layer that generates a polarized electron beam when irradiated with the circularly polarized laser beam; a transmission electron microscope 24 that utilizes the polarized electron beam; an electron beam intensity distribution recording apparatus 34 that is arranged at a face reached by the polarized electron beam that has transmitted through a sample; a reversal instruction apparatus 40 that sends a signal to the polarization apparatus to reverse the direction of the circular polarization, and also sends in synchronization therewith a signal to the electron beam intensity distribution recording apparatus. The electron beam intensity distribution recording apparatus records an intensity distribution before and after the electron beam is reversed, and a difference acquisition apparatus 36 calculates a difference therebetween.
    • 提供一种电子显微镜,其使用偏振电子束,并且可以通过记录透射通过样品的电子束的强度分布来获得具有高对比度的图像。 该电子显微镜包括:激光器2; 将激光束偏振成圆偏振激光束并且能够随着时间推移使圆偏振方向反转的偏光装置11; 设置有当被圆偏振激光束照射时产生极化电子束的应变超晶格半导体层的半导体光电阴极16; 使用偏振电子束的透射电子显微镜24; 电子束强度分布记录装置34,被布置在透过样品的偏振电子束所达到的面上; 反转指令装置40,其向偏振装置发送信号以反转圆偏振的方向,并且同步地向电子束强度分布记录装置发送信号。 电子束强度分布记录装置记录电子束反转之前和之后的强度分布,并且差值获取装置36计算它们之间的差。
    • 8. 发明公开
    • CHARGED PARTICLE VORTEX WAVE GENERATION
    • 带电粒子涡旋波产生
    • EP2795656A1
    • 2014-10-29
    • EP12813340.2
    • 2012-12-19
    • Universiteit Antwerpen
    • VERBEECK, JohanVAN TENDELOO, Gustaaf
    • H01J37/26
    • H01J37/04H01J3/02H01J3/021H01J37/06H01J37/08H01J37/256H01J37/261H01J2237/06383H01J2237/2614
    • A device (100) for imparting an orbital angular momentum to a charged particle wave propagating along a beam axis (104) in a charged particle beam generating apparatus is described. The device comprises a support element (106) having a target region (108) adapted for transmitting a charged particle wave propagating along a beam axis (104) and an induction means (112) for inducing a magnetic flux along an elongated profile having a free end portion located in said target region (108) and the induction means (112) is adapted for providing a magnetic flux in said elongated profile in order to induce an angular gradient, relative to the beam axis (104), of the phase of the charged particle wave when transmitted through said target region (108). A corresponding method is also disclosed, as well as the use thereof in electron microscopy.
    • 描述了一种用于向在带电粒子束产生装置中沿射束轴线(104)传播的带电粒子波施加轨道角动量的装置(100)。 该装置包括支撑元件(106),该支撑元件具有适于传输沿着射束轴线(104)传播的带电粒子波的目标区域(108)和用于沿具有自由空间的细长轮廓感应磁通量的感应装置(112) 以及位于所述目标区域(108)中的所述端部,并且所述感应装置(112)适于在所述细长轮廓中提供磁通量,以便相对于所述束轴线(104)感生所述相位 当透射通过所述目标区域(108)时带电粒子波。 还公开了相应的方法,以及其在电子显微镜中的用途。