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    • 5. 发明公开
    • Structured polarizer and method for manufacturing the same
    • Strukturierter Polarisator和Verfahren zur Herstellung davon
    • EP2993498A1
    • 2016-03-09
    • EP14183595.9
    • 2014-09-04
    • Codixx AG
    • Volke, AndrèStalmashonak, Andrei
    • G02B5/30G01J3/02G03F7/20B29D11/00C03C14/00C03C23/00
    • G02B5/3008B29D11/00644C03C14/006C03C17/09C03C23/0025C03C23/007C03C2214/08C03C2217/252C03C2218/33C03C2218/34G01J3/0224G02B5/3058G02B27/286G03F7/70
    • The present invention relates to a structured polarizer and method for manufacturing the same.
      A structured polarizer according to the invention comprises a substrate (10) being formed of a dielectric material in which elongated metal particles (21, 22, 23, 24) are embedded such to form a polarizing layer (10), the polarizing layer (10) comprising a plurality of first polarizing regions (11) having first elongated metal particles (21) being collectively aligned along a first direction and a plurality of second regions (12) having second metal particles (21), wherein the first polarizing regions (11) and the second regions (12) are arranged side by side such to adjoin each other, wherein the first metal particles (21) of the first polarizing regions (11) are arranged in the same plane (X) of the polarizing layer (10) as the second metal particles (23) of the second regions (12), a degree of polarization with respect to the first direction in the first polarizing regions (11) at a distance between 0.5 µm and 1 µm from a boundary (15) between the first polarizing regions (11) and the second regions (12) is more than 90%, and a degree of polarization with respect to the first direction in the second regions (12) at a distance between 0.5 µm and 1 µm from the boundary (15) between the first polarizing regions (11) and the second regions (12) is less than 10%.
    • 本发明涉及一种结构化偏振器及其制造方法。 根据本发明的结构偏振器包括:基底(10),其由介电材料形成,其中嵌入细长金属颗粒(21,22,23,24)以形成偏振层(10),偏振层(10) )包括具有沿第一方向共同排列的第一细长金属颗粒(21)的多个第一偏振区域(11)和具有第二金属颗粒(21)的多个第二区域(12),其中所述第一偏振区域 )和所述第二区域(12)并排布置成彼此邻接,其中所述第一偏振区域(11)的所述第一金属颗粒(21)布置在所述偏振层(10)的同一平面(X)中 )作为第二区域(12)的第二金属颗粒(23),在距第一偏振区域(11)中距离边界(15)0.5μm至1μm之间的距离处的相对于第一方向的偏振度 在第一偏振区域(11)和 所述第二区域(12)大于90%,并且所述第二区域(12)中的距离所述第一偏振区域(12)之间的边界(15)的距离为0.5μm至1μm之间的第一方向的偏振度 (11)和第二区域(12)小于10%。
    • 7. 发明公开
    • LAYOUT METHOD, MARK DETECTION METHOD, LIGHT EXPOSURE METHOD, MEASUREMENT APPARATUS, LIGHT EXPOSURE APPARATUS, AND METHOD FOR MANUFACTURING DEVICE
    • 布局方法,标记检测方法,光线曝光方法,测量装置,光线曝光装置和制造装置的方法
    • EP3291011A1
    • 2018-03-07
    • EP16768934.8
    • 2016-03-25
    • Nikon Corporation
    • SHIBAZAKI, Yuichi
    • G03F9/00G03F7/20H01L21/68
    • G03F9/7088G03F7/20G03F7/70G03F9/00G03F9/708H01L21/68
    • On a substrate conforming to a layout method for a plurality of marks for detection using a plurality of mark detection systems (AL1, AL2 1 to AL2 4 ) of which the detection centers are arranged at a predetermined spacing along an X-axis direction, a plurality of shot areas Si (i=1, 2, ...) are formed in both an X-axis direction and a Y-axis direction orthogonal thereto in an XY plane, and sets including at least two marks (WMj) (j=1, 2, 3, 4, 5) separated in the X-axis direction are repeatedly arranged along the X-axis direction at spacing of a length (w) in the X-axis-direction of each shot area (Si), and the marks belonging to each set are separated from each other in the X-axis direction by a spacing determined based arrangement in the X-axis direction of the plurality of mark detection systems (AL1, AL2 1 to AL2 4 ) and the length (w). It is thereby possible to reliably detect a plurality of marks on a substrate using a plurality of mark detection systems.
    • 在使用检测中心沿着X轴方向以预定间隔布置的多个标记检测系统(AL1,AL21至AL24)的符合用于多个用于检测的标记的布局方法的衬底上, 在XY平面上在X轴方向和与其正交的Y轴方向上均形成有至少两个标记(WMj)(j = 1)的拍摄区域Si(i = 1,2,...) ,2,3,4,5)沿X轴方向以每个照射区域(Si)的X轴方向上的长度(w)的间隔重复布置,并且在X轴方向 通过基于多个标记检测系统(AL1,AL21至AL24)的X轴方向上的间隔确定的排列和长度(w),将属于每个集合的标记在X轴方向上彼此分开。 由此可以使用多个标记检测系统可靠地检测基板上的多个标记。