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    • 6. 发明公开
    • Scanning Probe System
    • 扫描探针系统
    • EP2287624A3
    • 2011-03-23
    • EP10190901.8
    • 2003-03-31
    • Xerox Corporation
    • Hantschel, ThomasChow, Eugene M.Fork, David
    • G01Q70/06G01Q70/10G01Q70/16
    • G01Q70/10G01Q70/06G01Q70/16G01R1/06727Y10S977/873
    • A scanning probe system (100) for probing a sample (115), the scanning probe system comprising a stage (110) having a surface for mounting the sample; a probe assembly (120) including a substrate (122) and a spring probe (125) having a fixed end (210) attached to the substrate, a central section (220) separated from the substrate, and a free end (230) including a probe tip (235) positioned adjacent to the stage surface; and a measurement device (160) for measuring deformation of the spring probe caused by interaction between the probe tip and the sample, wherein the spring probe comprises a stress-engineered spring material film (520) having an internal stress gradient.
    • 1。一种用于探测样本(115)的扫描探针系统(100),所述扫描探针系统包括具有用于安装所述样本的表面的台(110) 包括衬底(122)和弹簧探针(125)的探针组件(120),所述弹簧探针具有附接到所述衬底的固定端(210),与所述衬底分离的中央部分(220)以及自由端(230),所述自由端包括 位于所述台面附近的探针尖端(235) 和测量装置(160),用于测量由探针尖端和样本之间的相互作用引起的弹簧探针的变形,其中弹簧探针包括具有内部应力梯度的应力设计的弹簧材料膜(520)。
    • 7. 发明公开
    • Scanning Probe System
    • Federsonde Rastersondenvorrichtung
    • EP2287624A2
    • 2011-02-23
    • EP10190901.8
    • 2003-03-31
    • Xerox Corporation
    • Hantschel, ThomasChow, Eugene M.Fork, David
    • G01Q70/06G01Q70/10G01Q70/16
    • G01Q70/10G01Q70/06G01Q70/16G01R1/06727Y10S977/873
    • A scanning probe system (100) for probing a sample (115), the scanning probe system comprising a stage (110) having a surface for mounting the sample; a probe assembly (120) including a substrate (122) and a spring probe (125) having a fixed end (210) attached to the substrate, a central section (220) separated from the substrate, and a free end (230) including a probe tip (235) positioned adjacent to the stage surface; and a measurement device (160) for measuring deformation of the spring probe caused by interaction between the probe tip and the sample, wherein the spring probe comprises a stress-engineered spring material film (520) having an internal stress gradient.
    • 1.一种用于探测样品(115)的扫描探针系统(100),所述扫描探针系统包括具有用于安装样品的表面的台(110) 包括衬底(122)和具有附接到所述衬底的固定端(210)的弹簧探针(125)的探针组件(120),与所述衬底分离的中心部分(220)以及包括 位于所述台表面附近的探针尖端(235); 以及测量装置(160),用于测量由探针尖端和样品之间的相互作用引起的弹簧探针的变形,其中弹簧探针包括具有内部应力梯度的应力工程弹簧材料膜(520)。