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1. 发明授权

EP0962762B1 Method and apparatus of automatically selecting Bragg reflections and method and system of automatically determining crystallographic orientation 有权
标题翻译：用于自动选择布拉格反射和用于自动地确定的结晶取向的方法和装置
公开(公告)号：EP0962762B1
公开(公告)日：2006-05-31
申请号：EP99304293.6
申请日：1999-06-02
申请人： Rigaku Corporation
发明人： Yokoyama, Ryoichi , Harada, Jimpei
IPC分类号： G01N23/20
CPC分类号： G01N23/20058

2. 发明公开

EP1273906A3 X-ray analysis apparatus with an X-ray generator 审中-公开
标题翻译：具有X射线发生器的X射线分析装置
公开(公告)号：EP1273906A3
公开(公告)日：2004-02-11
申请号：EP02014738.5
申请日：2002-07-03
申请人： Rigaku Corporation
发明人： Hayashi, Seiichi , Harada, Jimpei , Takahashi, Sadayuki , Kuribayashi, Masaru
IPC分类号： G21K1/06
CPC分类号： G01N23/00
摘要： Apparatus for X-ray analysis has a combination of a rotating target X-ray tube (10) and a composite monochromator (22). The composite monochromator (22) has a first and a second elliptic monochromators (26, 28) joined with each other side by side. Each of the elliptic monochromators (26, 28) has a first focal point (F1) at which an X-ray focal spot (24) on a target (12) of the X-ray tube (10) is disposed. Each of the elliptic monochromators (26, 28) has a synthetic multilayered thin film whose d-spacing varies continuously along an elliptic-arc. The shortest distance (L1) between the X-ray focal spot (24) and the composite monochromator (22) is set to 40 to 100 mm. Under the shortest distance condition, the effective focal spot size (t) on the target (12) is set to 40 to 100 micrometers to obtain the maximum X-ray intensity on a sample to be analyzed.

3. 发明授权

EP0959345B1 Diffraction condition simulation device, diffraction measurement system, and crystal analysis system 有权
$Diffraction condition simulation device, diffraction measurement system, and crystal analysis system$
标题翻译：衍射条件模拟装置，衍射测量系统和晶体分析系统
公开(公告)号：EP0959345B1
公开(公告)日：2010-03-24
申请号：EP99303849.6
申请日：1999-05-18
申请人： Rigaku Corporation
发明人： Yokoyama, Ryouichi , Endo, Kamihisa , Ozawa, Tetsuya , Harada, Jimpei
IPC分类号： G01N23/20 , G06F17/00
CPC分类号： G01N23/20

4. 发明公开

EP1310786A3 Method for measuring powder x-ray diffraction data using one- or two-dimensional detector 审中-公开
$Method for measuring powder x-ray diffraction data using one- or two-dimensional detector$
标题翻译：使用一维或二维检测器测量粉末X射线衍射数据的方法
公开(公告)号：EP1310786A3
公开(公告)日：2003-07-02
申请号：EP02025043.7
申请日：2002-11-11
申请人： Japan Synchrotron Radiation Research Institute , Rigaku Corporation , RIKEN
发明人： Takata, Masaki , Nishibori, Eiji, Japan Synchrotron Radiation , Sakata, Makoto, Japan Synchrotron Radiation , Harada, Jimpei
IPC分类号： G01N23/20 , G01N23/207
CPC分类号： G01N23/2055 , G01N23/2076
摘要： High-resolution powder diffraction is performed using high-energy synchrotron radiation as an x-ray source in such a way that a detector mounted on a measuring instrument such as a diffractometer is moved by smaller distances than the distance between adjacent x-ray detection units (pixels) in order to measure data for interpolation between pixels and the obtained interpolating data are put together to thereby improve the spatial resolution in measurement that has been limited by the detection unit in the detector.
摘要翻译：使用高能同步加速器辐射作为X射线源进行高分辨率粉末衍射，使得安装在诸如衍射仪之类的测量仪器上的检测器移动的距离小于相邻X射线检测单元之间的距离（像素），以测量用于像素之间的内插的数据和所获得的内插数据，从而提高已由检测器中的检测单元限制的测量中的空间分辨率。

5. 发明公开

EP0959345A2 Diffraction condition simulation device, diffraction measurement system, and crystal analysis system 有权
$Diffraction condition simulation device, diffraction measurement system, and crystal analysis system$
标题翻译： Diffraktionsbedingungssimulationsvorrichtung，Diffraktionsmessvorrichtung和晶体分析系统
公开(公告)号：EP0959345A2
公开(公告)日：1999-11-24
申请号：EP99303849.6
申请日：1999-05-18
申请人： Rigaku Corporation
发明人： Yokoyama, Ryouichi , Endo, Kamihisa , Ozawa, Tetsuya , Harada, Jimpei
IPC分类号： G01N23/20
CPC分类号： G01N23/20
摘要： A novel diffraction condition simulation device for calculating a reciprocal lattice to a crystal sample and displaying, on a computer screen, a Bragg reflection condition of X rays caused by the crystal sample, characterized in that a section where a plurality of reciprocal lattice points in a limiting sphere which rotates with rotation of a crystal intersect a diffraction plane is displayed with a section of the limiting sphere on the computer screen, is provided, thereby realizing quick and easy calculation and display of a desired Bragg reflection satisfying various diffraction conditions necessary for structure analysis and characterization of structure of a crystal, without any limitation as to diffraction conditions, diffraction information and the like.

6. 发明授权

EP0943914B1 Apparatus for X-ray analysis 有权
标题翻译： X射线分析装置
公开(公告)号：EP0943914B1
公开(公告)日：2008-04-09
申请号：EP99105004.8
申请日：1999-03-19
申请人： Rigaku Corporation
发明人： Hayashi, Seiichi , Harada, Jimpei , Omote, Kazuhiko
IPC分类号： G01N23/20 , G21K1/06
CPC分类号： G21K1/06

7. 发明公开

EP1273906A2 X-ray analysis apparatus with an X-ray generator 审中-公开
标题翻译： Röntgenstrahlenanalysevorrichtungmit einemRöntgengenerator
公开(公告)号：EP1273906A2
公开(公告)日：2003-01-08
申请号：EP02014738.5
申请日：2002-07-03
申请人： Rigaku Corporation
发明人： Hayashi, Seiichi , Harada, Jimpei , Takahashi, Sadayuki , Kuribayashi, Masaru
IPC分类号： G01N23/00
CPC分类号： G01N23/00
摘要： Apparatus for X-ray analysis has a combination of a rotating target X-ray tube (10) and a composite monochromator (22). The composite monochromator (22) has a first and a second elliptic monochromators (26, 28) joined with each other side by side. Each of the elliptic monochromators (26, 28) has a first focal point (F1) at which an X-ray focal spot (24) on a target (12) of the X-ray tube (10) is disposed. Each of the elliptic monochromators (26, 28) has a synthetic multilayered thin film whose d-spacing varies continuously along an elliptic-arc. The shortest distance (L1) between the X-ray focal spot (24) and the composite monochromator (22) is set to 40 to 100 mm. Under the shortest distance condition, the effective focal spot size (t) on the target (12) is set to 40 to 100 micrometers to obtain the maximum X-ray intensity on a sample to be analyzed.
摘要翻译：用于X射线分析的装置具有旋转靶X射线管（10）和复合单色仪（22）的组合。复合单色仪（22）具有彼此并排连接的第一和第二椭圆形单色仪（26,28）。每个椭圆形单色仪（26,28）具有设置在X射线管（10）的靶（12）上的X射线焦点（24）的第一焦点（F1）。每个椭圆形单色仪（26,28）具有合成的多层薄膜，其d-间距沿椭圆弧连续变化。 X射线焦斑（24）和复合单色仪（22）之间的最短距离（L1）设定为40〜100mm。在最短距离条件下，目标（12）上的有效焦点尺寸（t）设定为40〜100微米，以获得待分析样品上的最大X射线强度。

8. 发明公开

EP0959345A3 Diffraction condition simulation device, diffraction measurement system, and crystal analysis system 有权
$Diffraction condition simulation device, diffraction measurement system, and crystal analysis system$
标题翻译：衍射条件模拟装置，衍射测量系统和晶体分析系统
公开(公告)号：EP0959345A3
公开(公告)日：2001-10-17
申请号：EP99303849.6
申请日：1999-05-18
申请人： Rigaku Corporation
发明人： Yokoyama, Ryouichi , Endo, Kamihisa , Ozawa, Tetsuya , Harada, Jimpei
IPC分类号： G01N23/20 , G06F17/00
CPC分类号： G01N23/20
摘要： A novel diffraction condition simulation device for calculating a reciprocal lattice to a crystal sample and displaying, on a computer screen, a Bragg reflection condition of X rays caused by the crystal sample, characterized in that a section where a plurality of reciprocal lattice points in a limiting sphere which rotates with rotation of a crystal intersect a diffraction plane is displayed with a section of the limiting sphere on the computer screen, is provided, thereby realizing quick and easy calculation and display of a desired Bragg reflection satisfying various diffraction conditions necessary for structure analysis and characterization of structure of a crystal, without any limitation as to diffraction conditions, diffraction information and the like.
摘要翻译：一种新颖的衍射条件模拟装置，用于计算晶体样品的倒易点阵，并在计算机屏幕上显示由该晶体样品引起的X射线的布拉格反射条件，其特征在于，一个区域中的多个倒易格点通过在计算机屏幕上的限制球的截面显示随着晶体的旋转而旋转的极限球与衍射面相交的结构，从而实现满足结构所需的各种衍射条件的所需布拉格反射的快速且容易的计算和显示分析和表征晶体的结构，对衍射条件，衍射信息等没有任何限制。

9. 发明公开

EP1310786A2 Method for measuring powder x-ray diffraction data using one- or two-dimensional detector 审中-公开
$Method for measuring powder x-ray diffraction data using one- or two-dimensional detector$
标题翻译：一种用于测量粉末衍射方法是指一维或二维检测器的
公开(公告)号：EP1310786A2
公开(公告)日：2003-05-14
申请号：EP02025043.7
申请日：2002-11-11
申请人： Japan Synchrotron Radiation Research Institute , Rigaku Corporation , RIKEN
发明人： Takata, Masaki , Nishibori, Eiji, Japan Synchrotron Radiation , Sakata, Makoto, Japan Synchrotron Radiation , Harada, Jimpei
IPC分类号： G01N23/20 , G01N23/207
CPC分类号： G01N23/2055 , G01N23/2076
摘要： High-resolution powder diffraction is performed using high-energy synchrotron radiation as an x-ray source in such a way that a detector mounted on a measuring instrument such as a diffractometer is moved by smaller distances than the distance between adjacent x-ray detection units (pixels) in order to measure data for interpolation between pixels and the obtained interpolating data are put together to thereby improve the spatial resolution in measurement that has been limited by the detection unit in the detector.
摘要翻译：高分辨率粉末衍射是用高能量同步加速器辐射作为X射线源执行。在寻求一种方式做了安装在测量仪器的检测器：诸如衍射仪是由比相邻的X射线检测单元之间的距离较小的距离移动（像素），以便测量对于像素和被放在一起，从而提高测量的空间分辨率内插获得的数据之间的内插数据并已在检测器被限制由检测单元。

10. 发明公开

EP0943914A3 Apparatus for X-ray analysis 有权
标题翻译： X射线分析装置
公开(公告)号：EP0943914A3
公开(公告)日：2002-11-20
申请号：EP99105004.8
申请日：1999-03-19
申请人： Rigaku Corporation
发明人： Hayashi, Seiichi , Harada, Jimpei , Omote, Kazuhiko
IPC分类号： G01N23/20 , G21K1/06
CPC分类号： G21K1/06
摘要： Specific incident monochromator means (52) and a microfocus X-ray source (32) with an apparent focal spot size of less than 30 micrometers are combined to accomplish that the X-ray source (32) can be close to the monochromator means (52) and the intensity of X-rays focused on a sample (50) is greatly increased. A side-by-side composite monochromator (52) is arranged between the X-ray source (32) and the sample (50). The composite monochromator (52) has a first and a second elliptic monochromators (38, 40) each having a synthetic multilayered thin film with graded d-spacing. The first elliptic monochromator (38) has one side which is connected to one side of the second elliptic monochromator (40). A preferable apparent focal spot size D of the X-ray source (32) may be 10 micrometers. Because the invention provides a high focusing efficiency for X-rays, it is not required to use a high-power X-ray tube. The X-ray tube in the embodiment has a stationary-anode, whose power may be about 7 Watts.

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