专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

EP3745122B1 X-RAY ANALYZER 有权
公开(公告)号：EP3745122B1
公开(公告)日：2024-05-01
申请号：EP20176853.8
申请日：2020-05-27
IPC分类号： G01N23/225 , G01N23/207 , G01N23/223 , G01N23/2209
CPC分类号： G01N23/2076 , G01N23/2209 , G01N23/225

2. 发明公开

EP3137885A1 VERFAHREN UND ANORDNUNG ZUR IDENTIFIKATION KRISTALLINER PHASEN SOWIE EIN ENTSPRECHENDES COMPUTERPROGRAMM UND EIN ENTSPRECHENDES COMPUTERLESBARES SPEICHERMEDIUM 有权
标题翻译：方法和系统识别晶相和相应的计算机程序和相应的计算机可读存储介质
公开(公告)号：EP3137885A1
公开(公告)日：2017-03-08
申请号：EP15713482.6
申请日：2015-03-31
申请人： Bruker Nano GmbH
发明人： SCHWAGER, Thomas
IPC分类号： G01N23/203 , G01N23/22 , G01N23/225
CPC分类号： G01N23/2206 , G01N23/203 , G01N23/2076 , G01N23/2252 , G01N2223/605
摘要： The invention relates to a method for identifying crystalline phases in a polycrystalline sample, comprising the method steps: a) for each crystal structure that is suspected in the sample, determining a normalized vector p(i) for the chemical composition of the crystal structure, wherein the basis of the vector represents elements and/or compounds and thus the coordinates of the vector comprise details about the concentration of the elements and/or compounds inside the crystal structure; b) at each measurement point of the sample, (i) recording of a spectrum by means of energy-dispersive X-ray spectroscopy (EDX spectrum) and determining of the chemical composition and (ii) recording of an electron diffraction image and determining of the diffraction bands; c) determining of a normalized vector v for the chemical composition at the measurement point, the coordinates whereof comprise details about the concentration of the elements and/or compounds at the measurement point; d) comparison of the normalized vector v for the chemical composition at the measurement point with each of the normalized vectors p(i) of the suspected crystal structures by issuing an evaluation factor s(i) for correlating each vector; e) comparison of the diffraction bands determined at the measurement point with the diffraction bands of the suspected crystal structures by issuing an evaluation factor n(i) for correlating the diffraction bands; and f) determining an overall quality from the two evaluation factors s(i) and n(i) and attributing the crystal structure with the highest overall quality to the measurement point.
摘要翻译：本发明涉及一种用于确定多晶样品中的结晶相的方法，包括步骤：a）为每个晶体结构没有样品的，确定性的采矿归一化的向量p（i）以用于晶体结构的化学组成被怀疑， worin向量darstellt元素和/或化合物，因此矢量的坐标包括关于元素和/或晶体结构内化合物的浓度细节的基础; b）在所述样品的各测量点，（i）在能量色散型X射线光谱（EDX谱）和化学组成的确定性采矿和（ii）的电子衍射图像的记录和确定性采矿手段的光谱的记录衍射带; c）为测量点的化学组成的归一化矢量v的确定性采矿，WHEREOF包含约在测量点处的元件和/或化合物的浓度细节的坐标; D）通过用于相关每个向量的评估因子序列s（i）发出用于在与每个疑似晶体结构的归一化矢量P（i）的测量点的化学组成的归一化矢量v的比较; e）通过用于相关的衍射带的评估因子n（I）的发出在与疑似晶体结构的衍射带的测定点开采的衍射带的确定性比较; 和f）在整体质量N（I）确定的采矿来自两个评价因子S（i）和具有最高总体质量测量点归因晶体结构。

3. 发明授权

EP2685247B1 WAVELENGTH-DISPERSIVE X-RAY FLUORESCENCE ANALYSIS DEVICE 有权
标题翻译：与波长色散射线荧光分析装置
公开(公告)号：EP2685247B1
公开(公告)日：2015-11-18
申请号：EP12788736.2
申请日：2012-04-03
申请人： Rigaku Corporation
发明人： KATAOKA, Yoshiyuki , INOUE, Hisashi , KAWAKYU, Kosuke
IPC分类号： G01N23/223
CPC分类号： G01N23/223 , G01N23/2076 , G01N2223/076

4. 发明公开

EP2769207A4 A METHOD FOR 3D MINERAL MAPPING OF A ROCK SAMPLE 审中-公开
标题翻译：方法岩石样本的3D图片矿物
公开(公告)号：EP2769207A4
公开(公告)日：2015-05-20
申请号：EP11874149
申请日：2011-10-18
申请人： SCHLUMBERGER HOLDINGS , SCHLUMBERGER TECHNOLOGY BV , PRAD RES & DEV LTD , SERVICES PÉTROLIERS SCHLUMBERGER
发明人： KOROTEEV DMITRY ANATOLIEVICH , MUTINA ALBINA RISHATOVNA , NADEEV ALEXANDER NIKOLAEVICH , GURPINAR OMER M
IPC分类号： G01N23/083
CPC分类号： G01N23/046 , G01N23/2076 , G01N23/223 , G01N33/24 , G01N2223/04 , G01N2223/402 , G01N2223/419 , G01N2223/616

5. 发明公开

EP2772752A1 X-RAY SPECTROMETRY DETECTOR DEVICE 有权
标题翻译： DETEKTORVORRICHTUNGFÜRDIERÖNTGENSPEKTROMETRIE
公开(公告)号：EP2772752A1
公开(公告)日：2014-09-03
申请号：EP12844011.2
申请日：2012-08-21
申请人： Hamamatsu Photonics K.K.
发明人： SOEJIMA Hiroyoshi
IPC分类号： G01N23/223 , G01N23/225
CPC分类号： G01N23/2076 , G01N23/223 , G01N2223/076
摘要： An X-ray spectrometric detection device 1A includes a dispersive crystal 20 and a two-dimensional X-ray detector 30, spectrally resolves characteristic X-rays 2 emitted from a micro analysis spot P having a diameter of 100 µm or less on a surface of a sample 10 irradiated with X-rays or an electron beam, and detects the resolved X-rays by wavelength. The dispersive crystal 20 has a flat diffractive reflection surface 20a for receiving the characteristic X-rays 2 emitted from the micro analysis spot P and diffracts and reflects a wavelength component corresponding to an incident angle to the diffractive reflection surface 20a in wavelength components included in the characteristic X-rays 2, so as to spectrally resolve the characteristic X-rays 2 by wavelength. The detector 30 has a light-receiving surface 30a for receiving the characteristic X-rays 2 diffracted and reflected by the dispersive crystal 20, and generates data concerning an incident position and intensity of the characteristic X-rays 2 incident on the light-receiving surface 30a.
摘要翻译： X射线光谱检测装置1A包括分散晶体20和二维X射线检测器30，对从直径为100μm以下的微分析点P发出的特征X射线2进行光谱分解，用X射线或电子束照射的样品10，并通过波长检测分辨的X射线。分散晶体20具有平坦的衍射反射表面20a，用于接收从微分析点P发射的特征X射线2，并将与衍射反射表面20a的入射角相对应的波长成分衍射并反射到包含在特征X射线2，以便通过波长对特征X射线2进行光谱分解。检测器30具有用于接收由分散晶体20衍射和反射的特征X射线2的光接收表面30a，并且生成关于入射在受光面上的特征X射线2的入射位置和强度的数据 30A。

6. 发明公开

EP2769207A1 A METHOD FOR 3D MINERAL MAPPING OF A ROCK SAMPLE 审中-公开
标题翻译：方法岩石样本的3D图片矿物
公开(公告)号：EP2769207A1
公开(公告)日：2014-08-27
申请号：EP11874149.5
申请日：2011-10-18
申请人： Schlumberger Holdings Limited , Schlumberger Technology B.V. , PRAD Research and Development Limited , Services Pétroliers Schlumberger
发明人： KOROTEEV, Dmitry Anatolievich , MUTINA, Albina Rishatovna , NADEEV, Alexander Nikolaevich , GURPINAR, Omer, M.
IPC分类号： G01N23/083
CPC分类号： G01N23/046 , G01N23/2076 , G01N23/223 , G01N33/24 , G01N2223/04 , G01N2223/402 , G01N2223/419 , G01N2223/616
摘要： The method for 3D mineral mapping of a rock sample comprises the steps of defining a total mineral content of a sample and calculating X-ray attenuation coefficients for the defined minerals. X-ray micro/nanoCT scanning of the sample is performed and its three-dimensional microstructure image in gray scale is obtained. Characteristic grayscale levels in the image corresponding to calculated X-ray attenuation coefficients and accordingly to the minerals are allocated and the 3D mineral map of the interior of the sample is provided.

7. 发明公开

EP2538185A3 A method and system for spectrum data analysis 审中-公开
标题翻译：频谱数据分析的方法和系统
公开(公告)号：EP2538185A3
公开(公告)日：2013-10-30
申请号：EP12166979.0
申请日：2009-02-06
申请人： FEI Company
发明人： Corbett, Daniel , Gottlieb, Paul , Menzies, Andrew , Owen, Michael
IPC分类号： G01J3/28 , G01J3/30 , G01J3/46 , G01N23/223 , G01N23/207
CPC分类号： G01N23/2076 , H01J37/28
摘要： A method and system for spectrum data analysis. The method comprises the steps of collecting a spectrum of an unknown material; providing a set of element data templates; calculate optical least squares weights for the element data templates in approximating the spectrum; removing one or more of the templates having negative weights in approximating the spectrum; and re-calculating an approximation of the spectrum with said one or more templates removed.
摘要翻译：频谱数据分析的方法和系统。该方法包括收集未知材料的光谱的步骤; 提供一组元素数据模板; 计算近似谱中的元素数据模板的光学最小二乘权重; 在接近光谱的情况下去除具有负权重的一个或多个模板; 以及用移除的所述一个或多个模板重新计算频谱的近似值。

8. 发明公开

EP2250474A2 A METHOD AND SYSTEM FOR SPECTRUM DATA ANALYSIS 审中-公开
标题翻译：频谱数据分析的方法和系统
公开(公告)号：EP2250474A2
公开(公告)日：2010-11-17
申请号：EP09707645.9
申请日：2009-02-06
申请人： FEI Company
发明人： CORBETT, Daniel Roy , GOTTLIEB, Paul , OWEN, Michael James , MENZIES, Andrew Harley
IPC分类号： G01J3/28 , G01J3/30 , G01J3/46
CPC分类号： G01N23/2076 , H01J37/28
摘要： A method and system for spectrum data analysis. The method comprises the steps of collecting a spectrum of an unknown material; providing a set of element data templates; calculate optical least squares weights for the element data templates in approximating the spectrum; removing one or more of the templates having negative weights in approximating the spectrum; and re-calculating an approximation of the spectrum with said one or more templates removed.
摘要翻译：频谱数据分析的方法和系统。该方法包括收集未知材料的光谱的步骤; 提供一组元素数据模板; 计算近似谱中的元素数据模板的光学最小二乘权重; 在接近光谱的情况下去除具有负权重的一个或多个模板; 以及用移除的所述一个或多个模板重新计算频谱的近似值。

9. 发明公开

EP2132558A1 DISPOSITIF D'ANALYSE D'UN ECHANTILLON PAR RAYONS X COMPRENANT UN SYSTEME ANALYSEUR PAR DIFFRACTION FILTRANT EN ENERGIE ET EN ANGLE 有权
标题翻译： DISPOSITIF D'ANALYSE D'UN ECHANTILLON PAR RAYONS X COMPEENANT UNE SYSTEME ANALYSEUR PAR衍射过滤器EN ENERGIE ET EN ANGLE
公开(公告)号：EP2132558A1
公开(公告)日：2009-12-16
申请号：EP08718263.0
申请日：2008-03-27
申请人： Centre National de la Recherche Scientifique (CNRS)
发明人： HODEAU, Jean-Louis , BORDET, Pierre, Henri, Michel , GIANONCELLI, Alessandra , ORTEGA, Luc , PRAT, Alain , WALTER, Philippe , SALOMON, Joseph , DOORYHE, Eric
IPC分类号： G01N23/207 , G01N23/223 , G21K1/06
CPC分类号： G01N23/2076 , G21K1/06 , G21K2201/064
摘要： The invention relates to a device for the X-ray analysis of a specimen (1), comprising: a generation means (10) for generating an X-ray beam in order to irradiate an analysis region (2) of the specimen (1), said analysis region (2) defining a mean analysis plane (4), and the X-ray beam being emitted along a direction of incidence (3), and a detection means (30), for detection along at least one dimension of the X-rays diffracted by the irradiated analysis region (2), characterized in that it further includes an analyser system (20) placed between the specimen (1) and the detection means (30) and comprising an X-ray diffracting surface (21), forming a partial surface of revolution about an axis of revolution (5) contained in the mean analysis plane (4), the axis of revolution (5) being different from the direction of incidence (3) and passing through the centre of the analysis region (2), and the diffracting surface (21) being oriented so as to diffract the X-rays towards the detection means (30).
摘要翻译：本发明涉及一种用于样品（1）的X射线分析的装置，包括：生成装置（10），用于生成X射线束以照射样品（1）的分析区域（2），所述分析区域（2）限定平均分析平面（4），并且所述X射线束沿着入射方向（3）发射;以及检测装置（30），用于沿着所述分析区域（2）衍射的X射线，其特征在于它还包括置于样品（1）和检测装置（30）之间并包括X射线衍射表面（21）的分析器系统（20），形成围绕包含在平均分析平面（4）中的旋转轴线（5）的旋转部分表面，旋转轴线（5）不同于入射方向（3）并且穿过分析中心区域（2）以及衍射表面（21）被定向以便朝向检测衍射X射线装置（30）。

10. 发明授权

EP0990140B1 X-ray monochromator comprising a crystal having a tapered width and assuming a logarithmic spiral shape 失效
标题翻译： Röntgenmonochromator由晶体切割带锥宽度，这需要一个对数螺旋的形式的
公开(公告)号：EP0990140B1
公开(公告)日：2009-11-04
申请号：EP98930291.4
申请日：1998-06-17
申请人： Molecular Metrology, Inc.
发明人： BARTON, Scott, W. , CALANDRA, Peter, M.
IPC分类号： G01N23/207 , G01J3/12 , G21K1/06
CPC分类号： B82Y10/00 , G01N23/2076 , G21K1/06 , G21K1/062
摘要： An x-ray spectrometer is provided comprising an X-ray source, a curved crystal monochromator which focuses a monochromatic x-ray beam onto a sample surface, the curved crystal monochromator comprising a shape which is substantially identical to a logarithmic spiral, and a position-sensitive x-ray detector. A method of measuring diffraction intensities from oriented samples in real time including providing an x-ray spectrometer comprising an X-ray source, a curved crystal monochromator which focuses a monochromatic x-ray beam onto a sample surface, the curved monochromator comprising the shape of a logarithmic spiral, and a position-sensitive x-ray detector; and providing a crystallographically oriented sample, exposing the sample to the focused x-ray beam of the x-ray spectrometer; and measuring the diffraction intensity at the position-sensitive detector.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式