专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

EP1368615B1 CALIBRATION OF AN ANALOGUE PROBE 有权
标题翻译：校准AN模拟探头
公开(公告)号：EP1368615B1
公开(公告)日：2013-02-27
申请号：EP02704916.2
申请日：2002-03-13
申请人： Renishaw plc
发明人： SUTHERLAND, Alexander, Tennant
IPC分类号： G01B21/04
CPC分类号： B82Y15/00 , G01B21/042

2. 发明授权

EP1086356B1 METHOD OF CALIBRATING A SCANNING SYSTEM 有权
标题翻译：方法校准扫描系统
公开(公告)号：EP1086356B1
公开(公告)日：2005-04-06
申请号：EP00919028.1
申请日：2000-04-07
申请人： RENISHAW plc
发明人： MCMURTRY, David, Roberts , SUTHERLAND, Alexander, Tennant , WRIGHT, David, Allan
IPC分类号： G01B21/04
CPC分类号： B82Y15/00 , G01B21/042
摘要： A method of calibrating a scanning system comprising a machine and a measuring probe, includes the steps of error mapping the system statically and qualifying the stylus tip so that the system will provide accurate measurements, determining the positions of a number of datum points on the surface of an artefact with the probe stylus in contact with the workpiece and at zero deflection normal to the surface, scanning the surface through the datum points at a nominal stylus deflection and at the maximum speed which provides repeatable position measurements to make a second determination of the positions of the datum points, determining the errors attributable to the scanning process by subtracting the positions obtained in the first and second determinations, and storing the error values for correction of subsequent measurements of similar artefacts.

3. 发明公开

EP1086356A1 METHOD OF CALIBRATING A SCANNING SYSTEM 有权
标题翻译：方法校准扫描系统
公开(公告)号：EP1086356A1
公开(公告)日：2001-03-28
申请号：EP00919028.1
申请日：2000-04-07
申请人： RENISHAW plc
发明人： MCMURTRY, David, Roberts , SUTHERLAND, Alexander, Tennant , WRIGHT, David, Allan
IPC分类号： G01B21/04
CPC分类号： B82Y15/00 , G01B21/042
摘要： A method of calibrating a scanning system comprising a machine and a measuring probe, includes the steps of error mapping the system statically and qualifying the stylus tip so that the system will provide accurate measurements, determining the positions of a number of datum points on the surface of an artefact with the probe stylus in contact with the workpiece and at zero deflection normal to the surface, scanning the surface through the datum points at a nominal stylus deflection and at the maximum speed which provides repeatable position measurements to make a second determination of the positions of the datum points, determining the errors attributable to the scanning process by subtracting the positions obtained in the first and second determinations, and storing the error values for correction of subsequent measurements of similar artefacts.

4. 发明授权

EP2115387B1 CALIBRATION METHOD AND APPARATUS 有权转让
标题翻译：校准和设备
公开(公告)号：EP2115387B1
公开(公告)日：2014-06-04
申请号：EP08709419.9
申请日：2008-02-18
申请人： Renishaw PLC
发明人： OULD, John, Charles , SUTHERLAND, Alexander, Tennant
IPC分类号： G01B21/04
CPC分类号： G01B21/042

5. 发明公开

EP2016370A1 DIFFERENTIAL CALIBRATION 有权
标题翻译：差分校准
公开(公告)号：EP2016370A1
公开(公告)日：2009-01-21
申请号：EP07732535.5
申请日：2007-04-24
申请人： Renishaw plc
发明人： SUTHERLAND, Alexander, Tennant
IPC分类号： G01B21/04
CPC分类号： G01B21/042
摘要： A method of calibrating a measurement probe (10) mounted on a machine is described. The measurement probe (10) has a stylus (14) with a workpiece contacting tip (16). The method comprises determining a probe calibration matrix that relates the probe outputs (a,b,c) to the machine coordinate system (x,y,z.). The method comprising the steps of scanning a calibration artefact (18) using a first probe deflection (d1) to obtain first machine data and using a second probe deflection (d2) to obtain second machine data. The first and second machine data are used to obtain a pure probe calibration matrix in which any machine errors are substantially omitted. Advantageously, the method determines the pure probe matrix numerically based on the assumption that the difference between the first and second machine position data is known.
摘要翻译：描述了校准安装在机器上的测量探头（10）的方法。测量探针（10）具有带工件接触尖端（16）的触针（14）。该方法包括确定将探头输出（a，b，c）与机器坐标系（x，y，z）相关联的探头校准矩阵。该方法包括以下步骤：使用第一探头偏转（d1）扫描校准制造品（18）以获得第一机器数据并使用第二探头偏转（d2）来获得第二机器数据。第一和第二机器数据用于获得纯粹的探针校准矩阵，其中基本上省略了任何机器误差。有利地，该方法基于假定第一和第二机器位置数据之间的差是已知的数值来确定纯探针矩阵。

6. 发明公开

EP1368615A1 CALIBRATION OF AN ANALOGUE PROBE 有权
标题翻译：校准AN模拟探头
公开(公告)号：EP1368615A1
公开(公告)日：2003-12-10
申请号：EP02704916.2
申请日：2002-03-13
申请人： Renishaw plc
发明人： SUTHERLAND, Alexander, Tennant
IPC分类号： G01B21/04
CPC分类号： B82Y15/00 , G01B21/042
摘要： A method of calibrating a probe mounted on a machine in which the probe calibration matrix which relates the probe outputs in three orthogonal axes to the machine's X, Y and Z coordinate system. A datum ball mounted on the machine is bi-directionally scanned by the probe in one or more planes. For each plane, the mean direction of two approximate probe vectors in the plane is rotated about an axis orthogonal to that plane until the apparent material condition from the scan in each direction is the same. This process may be iterative. The mean values of the directions of the probe vectors for each plane are rotated, thus forming a corrected probe calibration matrix? The datum ball is preferably bi-directionally scanned in three orthogonal planes.

7. 发明公开

EP0487683A1 MEASUREMENT OF A WORKPIECE 失效
标题翻译：测量工件
公开(公告)号：EP0487683A1
公开(公告)日：1992-06-03
申请号：EP91911418.0
申请日：1991-06-20
申请人： Renishaw plc
发明人： McMURTRY, David, Roberts 20 Tabernacle Road , SUTHERLAND, Alexander, Tennant
IPC分类号： B23Q35 , B24B49 , G01B5 , G01B11 , G05B19 , G05D3
CPC分类号： G05B19/401 , G05B2219/37193 , G05B2219/37219
摘要： Une machine de positionnement par coordonnées (20) est munie soit d'une sonde optique soit d'une sonde de mesure par contact (40). On règle le mouvement de la tête (22) de la machine permettant à la sonde (40) d'analyser une surface inconnue, en prédisant la position d'un point ultérieur vers lequel la tête de la machine doit être dirigée en fonction des trois points les plus récemment mesurés, P1, P2, P3. La prédiction du point ultérieur P4 est effectuée par la commande de la machine (30) en temps réel.
摘要翻译：坐标定位机（20）设置有光学探针或接触式测量探针（40）。允许探测器（40）分析未知表面的机器的头部（22）的移动通过预测机器头将根据三个方向指向的稍后点的位置来控制最近测量的点，P1，P2，P3。进一步点P4的预测是通过机器（30）的实时控制来执行的。

8. 发明授权

EP2016370B1 DIFFERENTIAL CALIBRATION 有权
公开(公告)号：EP2016370B1
公开(公告)日：2018-11-07
申请号：EP07732535.5
申请日：2007-04-24
申请人： Renishaw plc
发明人： SUTHERLAND, Alexander, Tennant
IPC分类号： G01B21/04
CPC分类号： G01B21/042
摘要： A method of calibrating a measurement probe (10) mounted on a machine is described. The measurement probe (10) has a stylus (14) with a workpiece contacting tip (16). The method comprises determining a probe calibration matrix that relates the probe outputs (a,b,c) to the machine coordinate system (x,y,z.). The method comprising the steps of scanning a calibration artefact (18) using a first probe deflection (d1) to obtain first machine data and using a second probe deflection (d2) to obtain second machine data. The first and second machine data are used to obtain a pure probe calibration matrix in which any machine errors are substantially omitted. Advantageously, the method determines the pure probe matrix numerically based on the assumption that the difference between the first and second machine position data is known.

9. 发明公开

EP2115387A1 CALIBRATION METHOD AND APPARATUS 有权转让
标题翻译：校准和设备
公开(公告)号：EP2115387A1
公开(公告)日：2009-11-11
申请号：EP08709419.9
申请日：2008-02-18
申请人： Renishaw PLC
发明人： OULD, John, Charles , SUTHERLAND, Alexander, Tennant
IPC分类号： G01B21/04
CPC分类号： G01B21/042
摘要： A method is described for calibrating apparatus comprising a measurement probe (4) mounted on a machine, such as a machine tool. The machine is arranged to capture machine position data (x,y,z;70;80) indicative of the position of the measurement probe and the measurement probe is arranged to capture probe data (a,b,c;72;82) indicative of the position of a surface relative to the measurement probe (4). The measurement probe (4) is an analogue or scanning probe having a deflectable stylus (14). The first step of the method involves moving the measurement probe (4) at a known speed relative to an artefact (30;40,42) whilst capturing probe data (a,b,c;72;82) and machine position data (x,y,z;70;80). In particular, the measurement probe (4) is moved along a path that enables probe data (a,b,c;72;82) to be captured that is indicative of the position of one or more points on the surface of the artefact relative to the measurement probe (4). The path includes at least one change in the direction of probe movement that can be identified from the machine position data and the probe data. A second step of the method comprises comparing the machine position data (x,y,z;70;80) and the probe data (a,b,c;72;82) and determining from that data the relative delay in capturing probe data and machine position data (i.e. the so-called system delay).

10. 发明授权

EP1051596B1 CALIBRATIONS AND ERROR MAPPINGS OF AN ANALOGUE PROBE 有权
标题翻译：校准和错误映射AN模拟探头
公开(公告)号：EP1051596B1
公开(公告)日：2002-03-27
申请号：EP99950983.9
申请日：1999-10-25
申请人： Renishaw plc
发明人： SUTHERLAND, Alexander, Tennant , WRIGHT, David, Allan
IPC分类号： G01B21/04
CPC分类号： G01B21/042

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式