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1. 发明公开

EP4302048A1 METHOD OF COMMUNICATING INFORMATION TO A MEASUREMENT PROBE AND CORRESPONDING MEASUREMENT PROBE 审中-实审
公开(公告)号：EP4302048A1
公开(公告)日：2024-01-10
申请号：EP22708207.0
申请日：2022-03-01
申请人： Renishaw PLC
发明人： BUCKINGHAM, Jamie, John , MARSHALL, Derek , OULD, John, Charles
IPC分类号： G01B5/008 , B23Q17/20 , G01B21/04

2. 发明公开

EP3423785A1 METHOD AND APPARATUS FOR CALIBRATING A SCANNING PROBE 审中-公开
公开(公告)号：EP3423785A1
公开(公告)日：2019-01-09
申请号：EP17706884.8
申请日：2017-02-22
申请人： Renishaw PLC
发明人： OULD, John, Charles
IPC分类号： G01B21/04 , B23Q17/00

3. 发明授权

EP1412826B1 A MACHINE TOOL CONTROL PROCESS AND APPARATUS THEREFOR 有权
标题翻译：过程控制机床及其装置
公开(公告)号：EP1412826B1
公开(公告)日：2009-09-30
申请号：EP02743454.7
申请日：2002-07-19
申请人： Renishaw plc
发明人： OULD, John, Charles , TETT, Kevin, James
IPC分类号： G05B19/408
CPC分类号： G05B19/408
摘要： A machine tool control process employs an N.C. and separate software e.g. operating either in a separate processor or within the N.C. Sub-programs generated by the software may be introduced into the N.C. during pauses in the N.C. e.g. for measurement type inspection or re-configuring the paths of cutting tools. The generation of the sub-programs may be carried out whilst the N.C. is operating.

4. 发明公开

EP3280974A1 PROBE DATA ANALYSIS FOR IDENTIFYING A PROPERTY OF THE SCAN PATH 有权
标题翻译：扫描数据分析用于识别扫描路径的属性
公开(公告)号：EP3280974A1
公开(公告)日：2018-02-14
申请号：EP16715048.1
申请日：2016-03-30
申请人： Renishaw PLC
发明人： MARSHALL, Derek , OULD, John, Charles
IPC分类号： G01B21/04 , B23Q17/00
CPC分类号： G05B19/401 , G01B21/042 , G01B21/047 , G05B19/4083
摘要： A method is described for analysing probe data collected by a scanning probe carried by a machine tool. The probe data is collected as the machine tool moves or scans the scanning probe along a scan path relative to a workpiece. The method includes a step of identifying a property of the scan path used by the machine tool from a characteristic of the collected probe data. In this manner, the scan path can be identified from the probe data alone without having to receive any position data from the machine tool.

5. 发明公开

EP3807593A1 MEASUREMENT METHOD AND APPARATUS 有权
公开(公告)号：EP3807593A1
公开(公告)日：2021-04-21
申请号：EP19730527.9
申请日：2019-06-10
申请人： Renishaw PLC
发明人： OULD, John, Charles , HANDFORD, Thomas, Phillip
IPC分类号： G01B21/04 , G01B5/008

6. 发明授权

EP2115387B1 CALIBRATION METHOD AND APPARATUS 有权转让
标题翻译：校准和设备
公开(公告)号：EP2115387B1
公开(公告)日：2014-06-04
申请号：EP08709419.9
申请日：2008-02-18
申请人： Renishaw PLC
发明人： OULD, John, Charles , SUTHERLAND, Alexander, Tennant
IPC分类号： G01B21/04
CPC分类号： G01B21/042

7. 发明公开

EP1412826A2 A MACHINE TOOL CONTROL PROCESS AND APPARATUS THEREFOR 有权
标题翻译：过程控制机床及其装置
公开(公告)号：EP1412826A2
公开(公告)日：2004-04-28
申请号：EP02743454.7
申请日：2002-07-19
申请人： RENISHAW plc
发明人： OULD, John, Charles , TETT, Kevin, James
IPC分类号： G05B19/408
CPC分类号： G05B19/408
摘要： A machine tool control process employs an N.C. and separate software e.g. operating either in a separate processor or within the N.C. Sub-programs generated by the software may be introduced into the N.C. during pauses in the N.C. e.g. for measurement type inspection or re-configuring the paths of cutting tools. The generation of the sub-programs may be carried out whilst the N.C. is operating.

8. 发明授权

EP2920549B1 METHOD AND APPARATUS FOR MEASURING A WORKPIECE WITH A MACHINE TOOL 有权
公开(公告)号：EP2920549B1
公开(公告)日：2020-01-08
申请号：EP13786744.6
申请日：2013-11-05
申请人： Renishaw Plc.
发明人： OULD, John, Charles , MOORE, Paul, William , REVELL, Matthew, Anthony
IPC分类号： G01B21/04

9. 发明公开

EP2920549A1 METHOD AND APPARATUS FOR MEASURING A WORKPIECE WITH A MACHINE TOOL 有权
标题翻译：方法和装置用于测量工件与机器工具
公开(公告)号：EP2920549A1
公开(公告)日：2015-09-23
申请号：EP13786744.6
申请日：2013-11-05
申请人： Renishaw Plc.
发明人： OULD, John, Charles , MARSHALL, Derek , MOORE, Paul, William , REVELL, Matthew, Anthony
IPC分类号： G01B21/04
摘要： A method of inspecting an artifact on a machine tool includes: scanning a probe mounted on the machine tool along the surface of the artifact to be inspected. The method involves supplying a flow of fluid at least at the point of interaction between the probe and the artifact during the scanning.

10. 发明公开

EP2115387A1 CALIBRATION METHOD AND APPARATUS 有权转让
标题翻译：校准和设备
公开(公告)号：EP2115387A1
公开(公告)日：2009-11-11
申请号：EP08709419.9
申请日：2008-02-18
申请人： Renishaw PLC
发明人： OULD, John, Charles , SUTHERLAND, Alexander, Tennant
IPC分类号： G01B21/04
CPC分类号： G01B21/042
摘要： A method is described for calibrating apparatus comprising a measurement probe (4) mounted on a machine, such as a machine tool. The machine is arranged to capture machine position data (x,y,z;70;80) indicative of the position of the measurement probe and the measurement probe is arranged to capture probe data (a,b,c;72;82) indicative of the position of a surface relative to the measurement probe (4). The measurement probe (4) is an analogue or scanning probe having a deflectable stylus (14). The first step of the method involves moving the measurement probe (4) at a known speed relative to an artefact (30;40,42) whilst capturing probe data (a,b,c;72;82) and machine position data (x,y,z;70;80). In particular, the measurement probe (4) is moved along a path that enables probe data (a,b,c;72;82) to be captured that is indicative of the position of one or more points on the surface of the artefact relative to the measurement probe (4). The path includes at least one change in the direction of probe movement that can be identified from the machine position data and the probe data. A second step of the method comprises comparing the machine position data (x,y,z;70;80) and the probe data (a,b,c;72;82) and determining from that data the relative delay in capturing probe data and machine position data (i.e. the so-called system delay).

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