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    • 3. 发明公开
    • Inverted microscope
    • 反转Mikroskop
    • EP1640759A1
    • 2006-03-29
    • EP05021017.8
    • 2005-09-27
    • Olympus Corporation
    • Kouno, TakayukiAono, Yasushi
    • G02B21/00
    • G02B21/0088
    • An inverted microscope (100; 100'; 100") includes a stage (102) on which a sample is disposed, a support (101x, 101y) which supports the stage (102), a base (101z) which holds the support from below the support, an objective lens (104, 104', 104") which is arranged under the sample and the stage, an imaging lens (125) which is arranged inside the base (101z) and which forms an optical image of the sample in cooperation with the objective lens (104, 104', 104"), and an optical path combining/splitting unit (134; 301; 401) which is arranged on a main optical path between the objective lens (134; 301; 401) and the imaging lens (125) and which detachably holds the optical path combining/splitting element (135; 302; 402) that combines/splits the main optical path inside the base (101z).
    • 倒置的显微镜(100; 100'; 100“)包括其上设置有样品的载物台(102),支撑载物台(102)的载体(101x,101y),将载体 位于支架下方的布置在样品和台下的物镜(104,104',104“),配置在基座(101z)内部并形成样品的光学图像的成像透镜(125) 与物镜(104,104',104“)配合的光路组合/分离单元(134; 301; 401)配置在物镜(134; 301; 401)之间的主光路上, 和成像透镜(125),并且其可拆卸地保持组合/分割基部(101z)内的主光路的光路组合/分离元件(135; 302; 402)。
    • 4. 发明公开
    • System microscope
    • Universalmikroskop
    • EP1586930A1
    • 2005-10-19
    • EP05007948.2
    • 2005-04-12
    • Olympus Corporation
    • Honda, SusumuAono, Yasushi
    • G02B21/00
    • G02B21/0088
    • A system microscope arranged to simultaneously observe a specimen in upward and downward directions has a specimen mounting part (5) which mounts a specimen, an inverted microscope (4) including an illumination path which radiates illumination light from under the specimen mounting part, and an observation optical path which acquires detection light emitted from the specimen to which the illumination light is radiated, a microscope with upright frame (7) including an illumination path which radiates illumination light from above the specimen mounting part, and an observation optical path which acquires detection light emitted from the specimen to which the illumination light is radiated, and a driving unit (2) which moves at least one of the inverted microscope and the microscope with upright frame in a plane perpendicular to the observation optical path of the inverted microscope or the microscope with upright frame.
    • 布置成以向上和向下方向同时观察样本的系统显微镜具有安装样本的样本安装部(5),包括从样本安装部下方照射照明光的照明路径的倒置显微镜(4),以及 获取从照射光照射的样本发出的检测光的观察光路,具有从样本安装部上方照射照明光的照明路径的直立框架(7)的显微镜以及取得检测用的观察光路 从照射光照射的样本发射的光以及在垂直于倒置显微镜的观察光路的平面的垂直框架中移动倒置显微镜和显微镜中的至少一个的驱动单元(2) 显微镜与直立框架。
    • 5. 发明公开
    • System microscope
    • Mikroskopsystem
    • EP1582904A1
    • 2005-10-05
    • EP05005645.6
    • 2005-03-15
    • Olympus Corporation
    • Aono, YasushiNakata, TatsuoTsuchiya, Atsuhiro
    • G02B21/00G02B21/24G02B21/18G03F7/20
    • G02B21/0088G02B21/06G02B21/248
    • A system microscope includes a microscope body (1), a stage (2) which is provided on an upper portion of the microscope body (1) and on which a sample (3) is placed, a lower objective lens (5) provided below the stage (2), an upper objective lens (29) provided above the stage (2), a portal support member (22, 24, 25) which is provided on the upper portion of the microscope body (1) so as to straddle the stage (2), a lower illumination device (7) which is provided for the microscope body (1) and illuminates the sample (3) from below, an upper illumination device (30) which is provided on the portal support member and illuminates the sample (3) from above, a lower eyepiece lens (20) which is provided for the microscope body (1) and acquires an observation image of the sample (3) from the lower objective lens (5), and an upper eyepiece lens (41) which is provided on the portal support member and acquires an observation image of the sample (3) from the upper objective lens (29).
    • 系统显微镜包括显微镜主体,设置在显微镜主体的上部并且放置样品的台架,设置在平台下方的下物镜,设置在平台上方的上物镜,门架支撑件 构件,其设置在显微镜主体的上部以跨越台面;下部照明装置,其设置用于显微镜主体并从下方照射样品;上部照明装置,其设置在门户支撑构件上;以及 从上方照亮样品,为显微镜主体提供的下目镜,并从下物镜获取样本的观察图像,以及上目镜,其设置在门架支撑构件上,并获取观察图像 来自上物镜的样品。