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1. 发明授权

EP0381113B1 Tunnel current data storage apparatus having separate lever bodies 失效
标题翻译：与单独的杆安排隧道电流数据的记录装置。
公开(公告)号：EP0381113B1
公开(公告)日：1993-12-29
申请号：EP90101723.6
申请日：1990-01-29
申请人： OLYMPUS OPTICAL CO., LTD.
发明人： Kajimura, Hiroshi , Kouchi, Toshihito , Toda, Akitoshi , Isono, Yasuo , Mimura, Yoshiyuki , Ohta, Hiroko , Shimizu, Ryouhei
IPC分类号： G11B9/00
CPC分类号： G11B9/14 , G01Q70/06 , G01Q80/00 , G11B9/1427 , G11B9/1454 , G11B11/08 , G11B11/10 , G11B17/32 , G11B17/34 , G11B21/00 , G11B21/02 , G11B21/12 , Y10S977/947

2. 发明公开

EP0382062A3 Electronic circuits including atomic probe 失效
标题翻译：包含原子探针的电子电路
公开(公告)号：EP0382062A3
公开(公告)日：1992-07-01
申请号：EP90101836.6
申请日：1990-01-30
申请人： OLYMPUS OPTICAL CO., LTD.
发明人： Toda, Akitoshi , Shimizu, Ryouhei , Ohta, Hiroko , Kajimura, Hiroshi , Mimura, Yoshiyuki , Isono, Yasuo , Kouchi, Toshihito
IPC分类号： G11B9/00 , G11B11/00 , G11B27/24 , G11B27/30 , G06F5/06 , G06F7/00 , G01N27/00
CPC分类号： G06F7/785 , B82Y10/00 , G01Q80/00 , G06F5/01 , G06F5/10 , G06F7/768 , G06F2205/104 , G11B9/14 , G11B9/1418 , G11B9/1481 , G11B27/19 , G11B27/3027 , Y10S977/861 , Y10S977/947
摘要： As a first one of electronic circuits including an atomic prob, a micro STM arithmetic circuit device is provided. The micro STM arithmetic circuit device comprises an information-rewritable micro STM recording medium (10; 34; 58; 68) and a micro STM recording apparatus which temporarily stores information on the recording medium such that the information can be read as a variation in a tunnel current. The recording apparatus has a probe (probes) (12; 36, 38, 40, 42, 44; 54, 56; 70) for writing/reading information on the recording medium and a scanner (72) for varying a position relation between the probe and the recording medium. As a second application of the electronic circuits, a micro STM recording apparatus is provided. The micro STM recording apparatus uses a recording medium having a specific format as the micro STM recording medium (86; 98; 102; 106; 110; 126) in which recorded information is read as a variation in a tunnel current. That is, the recording medium has an address area (92) in which address information is recorded and a data area (94) in which data information is recorded.

3. 发明公开

EP0444697A3 Atomic probe microscope and cantilever unit for use in the microscope 失效
标题翻译：用于显微镜的原子探针显微镜和扫帚单元
公开(公告)号：EP0444697A3
公开(公告)日：1992-02-26
申请号：EP91103102.9
申请日：1991-03-01
申请人： OLYMPUS OPTICAL CO., LTD.
发明人： Toda, Akitoshi , Mishima, Shuzo
IPC分类号： G01N27/00 , H01J37/26 , H01J37/252
CPC分类号： G01Q60/38 , G01Q70/02 , Y10S977/873
摘要： An atomic probe microscope comprises a cantilever (111) which includes a lever section (202) provided with a probe (214), a lever attaching section (215) for supporting the lever section (202), and a positioning striking section formed at the lever attaching section. A cantilever unit comprises a seat (109) for supporting the cantilever (111) and provided with a struck face (304) against which the positioning striking section is struck. The object of the present invention is to provide a cantilever unit capable of making easier the exchange of the micro-cantilever with a new one for the atomic force microscope and the like and accurately attaching the new micro-cantilever to its original position with a higher reproductiveness.

4. 发明公开

EP0400541A1 Atomic probe type microscope apparatus 失效
标题翻译： Mikroskopische Vorrichtung mit atomarem传感器。
公开(公告)号：EP0400541A1
公开(公告)日：1990-12-05
申请号：EP90110088.3
申请日：1990-05-28
申请人： OLYMPUS OPTICAL CO., LTD.
发明人： Toda, Akitoshi
IPC分类号： G12B7/00 , H01J37/252
CPC分类号： G01Q60/16 , G01Q60/58 , Y10S977/871
摘要： A scanning tunneling microscopy apparatus includes a specimen mount (45) on which a specimen (50) is located, a probe (33) for scanning the surface of the specimen (50), and a scanning unit (31, 32, 45) for two- or three-dimensionally changing a relative positional relation between the specimen (50) and the probe (33). A temperature control mechanism is located near the probe (33) and/or the specimen (50) to achieve temperature control. It is thus possible to eliminate an adverse effect upon the resolution of a microscope which results from a temperature variation and to make a measurement under any given temperature condition. The temperature control mechanism includes a Peltier element (35) as a source for heating and cooling and a temperature sensor (37).
摘要翻译：扫描隧道显微镜装置包括：试样（50）所在的试样支架（45）;用于扫描试样（50）表面的探针（33）;以及扫描单元（31,32,45），用于二维或三维地改变样本（50）和探针（33）之间的相对位置关系。温度控制机构位于探头（33）和/或试样（50）附近以实现温度控制。因此可以消除由温度变化导致的显微镜的分辨率的不利影响，并且在任何给定的温度条件下进行测量。温度控制机构包括作为加热和冷却的源的珀尔帖元件（35）和温度传感器（37）。

5. 发明公开

EP0381113A2 Tunnel current data storage apparatus having separate lever bodies 失效
标题翻译： Tunnelstromdatenaufzeichnungsgerätmit getrennten Hebelanordnungen。
公开(公告)号：EP0381113A2
公开(公告)日：1990-08-08
申请号：EP90101723.6
申请日：1990-01-29
申请人： OLYMPUS OPTICAL CO., LTD.
发明人： Kajimura, Hiroshi , Kouchi, Toshihito , Toda, Akitoshi , Isono, Yasuo , Mimura, Yoshiyuki , Ohta, Hiroko , Shimizu, Ryouhei
IPC分类号： G11B9/00
CPC分类号： G11B9/14 , G01Q70/06 , G01Q80/00 , G11B9/1427 , G11B9/1454 , G11B11/08 , G11B11/10 , G11B17/32 , G11B17/34 , G11B21/00 , G11B21/02 , G11B21/12 , Y10S977/947
摘要： A data storage apparatus includes a first lever body (10) having a piezoelectric driving section, and a second lever body (20) which is disposed to separate from and to be perpendicular to the first lever body (10), and has a piezoelectric driving section. A recording medium (22) is formed on a portion of the second lever body (20), and records desired data. A plurality of probes (12₁ to 12 n ) are disposed on a portion of the first lever body (10) to oppose the recording medium (22) at a predetermined interval, and detect a change in state at predetermined positions on the recording medium (22) as a change in tunnel current or a change in three-dimensional pattern. A voltage applying circuit (39, 40) alternately applies predetermined voltages to the piezoelectric driving sections of the first and second lever bodies (10, 20) to separately drive the plurality of probes (12₁ to 12 n ) in different directions, thereby three-dimensionally scanning the recording medium (22).
摘要翻译：数据存储装置包括具有压电驱动部分的第一杠杆体（10）和与第一杠杆体（10）分离并垂直于第一杠杆体（10）的第二杠杆体（20），并具有压电驱动部分。记录介质（22）形成在第二杠杆体（20）的一部分上，并记录所需数据。多个探针（121〜12n）设置在第一杆体（10）的与预定间隔相对的记录介质（22）的一部分上，并检测记录介质（22）上的预定位置的状态变化）作为隧道电流的变化或三维图案的变化。电压施加电路（39,40）交替地对第一和第二杠杆体（10,20）的压电驱动部分施加预定的电压，以分别驱动多个探针（121至12n）在不同方向上，从而三维地扫描记录介质（22）。

6. 发明授权

EP0382192B1 Scanning tunneling microscope memory apparatus 失效
标题翻译：扫描隧道显微镜记忆装置
公开(公告)号：EP0382192B1
公开(公告)日：1993-08-18
申请号：EP90102415.8
申请日：1990-02-07
申请人： OLYMPUS OPTICAL CO., LTD.
发明人： Mimura, Yoshiyuki , Kajimura, Hiroshi , Kouchi, Toshihito , Toda, Akitoshi , Isono, Yasuo , Ohta, Hiroko , Shimizu, Ryouhei
IPC分类号： G11B9/10 , G11C11/00
CPC分类号： G11B19/20 , B82Y10/00 , G11B5/00 , G11B9/14 , G11B9/1427 , G11B11/00 , G11B11/03 , G11B11/08 , G11B17/00 , G11B19/00 , G11B19/02 , G11B20/10 , G11B21/02 , G11B21/12

7. 发明公开

EP0382192A1 Scanning tunneling microscope memory apparatus 失效
标题翻译： Rastertunnelmikroskop-Speichergerät。
公开(公告)号：EP0382192A1
公开(公告)日：1990-08-16
申请号：EP90102415.8
申请日：1990-02-07
申请人： OLYMPUS OPTICAL CO., LTD.
发明人： Mimura, Yoshiyuki , Kajimura, Hiroshi , Kouchi, Toshihito , Toda, Akitoshi , Isono, Yasuo , Ohta, Hiroko , Shimizu, Ryouhei
IPC分类号： G11B9/10 , G11C11/00
CPC分类号： G11B19/20 , B82Y10/00 , G11B5/00 , G11B9/14 , G11B9/1427 , G11B11/00 , G11B11/03 , G11B11/08 , G11B17/00 , G11B19/00 , G11B19/02 , G11B20/10 , G11B21/02 , G11B21/12
摘要： A scanning tunneling microscope memory apparatus comprises first and second IC substrates (10, 12). First and second cantilevers (100, 200), which can be moved by piezoelectric elements, are arranged on first and second IC substrates (10, 12), respectively. Tunnel current probes (112) are provided on a end portion of the first cantilever (100), and a recording element (212) is provided on a end portion of the second cantilever (200). The first and second cantilevers (100, 200) are made to cross each other at a distance, such that the tunnel current probes (112) face the recording element (212). The first or second substrate (10, 12) includes a CCD circuit (14), a control circuit (16) for controlling the CCD circuit (14), cantilevers (100, 200), etc., and a drive circuit (18) having a preamplifier, a write circuit, a servo circuit, etc.
摘要翻译：扫描隧道显微镜存储装置包括第一和第二IC基板（10,12）。可以分别通过压电元件移动的第一和第二悬臂（100,200）分别布置在第一和第二IC基板（10,12）上。隧道电流探针（112）设置在第一悬臂（100）的端部上，并且记录元件（212）设置在第二悬臂（200）的端部上。第一和第二悬臂（100,200）被制成一定距离，使得隧道电流探针（112）面对记录元件（212）。第一或第二基板（10,12）包括CCD电路（14），用于控制CCD电路（14）的控制电路（16），悬臂（100,200）等以及驱动电路（18）具有前置放大器，写入电路，伺服电路等

8. 发明公开

EP0381158A2 Memory device 失效
标题翻译： Speichervorrichtung。
公开(公告)号：EP0381158A2
公开(公告)日：1990-08-08
申请号：EP90101835.8
申请日：1990-01-30
申请人： OLYMPUS OPTICAL CO., LTD.
发明人： Isono, Yasuo , Kouchi, Toshihito , Toda, Akitoshi , Kajimura, Hiroshi , Mimura, Yoshiyuki , Ohta, Hiroko , Shimizu, Ryouhei
IPC分类号： G11B9/00 , G11B11/03 , G11C11/00 , G11B17/00 , G11B19/00 , G11B21/00 , G11B19/02 , G11C7/00
CPC分类号： G11C13/0014 , B82Y10/00 , G11B9/14 , G11B9/149 , G11B11/03 , G11B17/00 , G11B19/00 , G11B21/00 , G11C13/04 , Y10S977/849 , Y10S977/861 , Y10S977/881 , Y10S977/94 , Y10S977/943 , Y10S977/947
摘要： A memory device comprises a base plate (10) with a memory element supporting layer (14), a probe (18) with a pointed tip portion, and a fine scan element (20) for causing the probe (18) to scan over the surface of the memory element supporting supporting layer (14). When the probe (18) is approached to the surface of the memory element supporting layer (14) and a suitable bias voltage is applied across the probe (18) and the memory element supporting layer (14), a tunnel current is cause to flow therebetween and a specific region of the surface of the supporting layer (14) is excited. The excited region can adsorb a memory element (16), such as one molecule di-(2-ethylhexyl) phthalate. By causing the memory element (16) to be adsorbed selectively on the memory element supporting layer (14), data is recorded in the form of a projection-and-recess pattern. The recorded data can be read out by observing the surface configuration of the supporting layer (14) in accordance with the principle of an STM (scanning tunneling microscope).
摘要翻译：存储器件包括具有存储元件支撑层（14）的基板（10），具有尖端部分的探针（18）和用于使探针（18）扫过存储元件支撑支撑层（14）的表面。当探针（18）靠近存储元件支撑层（14）的表面并且跨越探针（18）和存储元件支撑层（14）施加合适的偏置电压时，使隧道电流流动并且支撑层（14）的表面的特定区域被激发。激发区域可以吸附记录元件（16），例如一分子邻苯二甲酸二（2-乙基己基）酯。通过使存储元件（16）选择性地吸附在存储元件支撑层（14）上，数据以投影凹部图案的形式被记录。可以通过根据STM（扫描隧道显微镜）的原理观察支撑层（14）的表面构造来读出记录数据。

9. 发明公开

EP0297254A1 Fine surface profile measuring apparatus 失效
标题翻译： Vorrichtung zum Messen feinerOberflächenprofile。
公开(公告)号：EP0297254A1
公开(公告)日：1989-01-04
申请号：EP88107513.9
申请日：1988-05-10
申请人： OLYMPUS OPTICAL CO., LTD.
发明人： Sato, Eiichi , Koshiishi, Kiyozo , Shigetomi, Sadao , Tanaka, Syunpei , Yoshinaga, Makoto , Morita, Terumasa , Nagano, Chikara , Kobayashi, Shohei , Sato, Chiaki , Toda, Akitoshi , Kubo, Mitunori , Tofukuji, Ikuo
IPC分类号： G01B11/24 , G01B11/30
CPC分类号： G01B11/24 , G01B9/04
摘要： A fine surface profile meter includes an X-Y stage, supported by a leaf spring, for supporting a sample thereon, a piezoelectric actuator for two-dimensionally scanning the X-Y stage, a positioning table, disposed below the X-Y stage, for positioning the X-Y stage at an arbitrary position, an objective lens disposed above the X-Y stage, an observation optical system for allowing an operator to observe an enlarged sample image, a measurement optical system, an optical axis of which is aligned with an optical path of the objective lens through a beam splitter, the measurement optical system for emitting a laser beam onto the sample through the objective lens and to receive the laser beam reflected by the sample, a calculator circuit for calculating height information of the sample using an output from the measurement optical system and for obtaining a two-dimensional distribution of the height information, a cover for shielding the X-Y stage, the positioning means, the objective lens, the beam splitter, the observation optical system, and the measurement optical system from an outer atmosphere, a detachable measurement unit for integrally holding the objective lens, the beam splitter, and the measurement optical system, a supporting plate supported on the X-Y stage through columns, and an arm, mounted on the supporting plate, for supporting the measurement optical system and the observation optical system.
摘要翻译：精细表面轮廓仪包括由板簧支撑的用于支撑样品的XY台，用于二维扫描XY台的压电致动器，设置在XY台下方的定位台，用于将XY台定位在任意位置，设置在XY台上方的物镜，用于允许操作者观察放大的样本图像的观察光学系统，测量光学系统，其光轴与物镜的光路对准，通过光束分离器，用于通过物镜将激光束发射到样品上并且接收由样品反射的激光束的测量光学系统，用于使用来自测量光学系统的输出来计算样本的高度信息的计算器电路，获得高度信息的二维分布，用于屏蔽XY平台的盖子，定位装置，物镜，th 光束分离器，观察光学系统和来自外部大气的测量光学系统，用于一体地保持物镜的分离测量单元，分束器和测量光学系统，支撑板，其通过柱支撑在XY平台上以及安装在支撑板上的支撑测量光学系统和观察光学系统的臂。

10. 发明公开

EP0381158A3 Memory device 失效
标题翻译：内存设备
公开(公告)号：EP0381158A3
公开(公告)日：1992-05-27
申请号：EP90101835.8
申请日：1990-01-30
申请人： OLYMPUS OPTICAL CO., LTD.
发明人： Isono, Yasuo , Kouchi, Toshihito , Toda, Akitoshi , Kajimura, Hiroshi , Mimura, Yoshiyuki , Ohta, Hiroko , Shimizu, Ryouhei
IPC分类号： G11B9/00 , G11B11/03 , G11C11/00 , G11B17/00 , G11B19/00 , G11B21/00 , G11B19/02 , G11C7/00
CPC分类号： G11C13/0014 , B82Y10/00 , G11B9/14 , G11B9/149 , G11B11/03 , G11B17/00 , G11B19/00 , G11B21/00 , G11C13/04 , Y10S977/849 , Y10S977/861 , Y10S977/881 , Y10S977/94 , Y10S977/943 , Y10S977/947
摘要： A memory device comprises a base plate (10) with a memory element supporting layer (14), a probe (18) with a pointed tip portion, and a fine scan element (20) for causing the probe (18) to scan over the surface of the memory element supporting supporting layer (14). When the probe (18) is approached to the surface of the memory element supporting layer (14) and a suitable bias voltage is applied across the probe (18) and the memory element supporting layer (14), a tunnel current is cause to flow therebetween and a specific region of the surface of the supporting layer (14) is excited. The excited region can adsorb a memory element (16), such as one molecule di-(2-ethylhexyl) phthalate. By causing the memory element (16) to be adsorbed selectively on the memory element supporting layer (14), data is recorded in the form of a projection-and-recess pattern. The recorded data can be read out by observing the surface configuration of the supporting layer (14) in accordance with the principle of an STM (scanning tunneling microscope).

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