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1. 发明公开

EP0511662A1 Scanning probe microscope, molecular processing method using the scanning probe microscope and DNA base arrangement detecting method 失效
标题翻译：扫描探针，使用显微镜和方法，用于检测DNA碱基排列分子的加工方法。
公开(公告)号：EP0511662A1
公开(公告)日：1992-11-04
申请号：EP92107342.5
申请日：1992-04-29
申请人： MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
发明人： Nakagawa, Tohru, Avant-Heights Suite 301
IPC分类号： G01B7/34 , G01N27/00
CPC分类号： G01Q60/60 , G01Q60/42 , Y10S977/728 , Y10S977/849 , Y10S977/852 , Y10S977/853 , Y10S977/86 , Y10S977/877 , Y10S977/879 , Y10S977/881 , Y10S977/924 , Y10S977/958
摘要： This invention relates to a scanning probe microscope which examines or processes directly the structure of substance surfaces at the molecular or atomic level, and a method for processing molecules using a scanning probe microscope and a method for detecting DNA base arrangement. A scanning probe microscope has a probe approaching or contacting the substance surface to detect a physical quantity between the substance surface and the probe, wherein the physical quantity is what is interacted or chemically reacted between the substance surface and the molecules or atom groups which act as a sensor and are fixed on the probe, scanning at an atomic level of precision. Therefore, surface structure within a microscopic region can be examined or processed at the molecular or atomic level. A method for detecting DNA base arrangement with any one of three or four kinds of probes fixed with any one of four different kinds of molecules interacting four kinds of bases consisting of DNA, by approaching single stranded DNA fixed on a substrate, measuring the force and scanning by an atomic force microscope at an atomic level of precision.
摘要翻译：本发明涉及一种扫描探针显微镜检查哪个或过程直接物质表面的在分子或原子水平的结构中，以及用于使用扫描型探针显微镜和用于检测DNA碱基排列的方法处理的分子的方法。的扫描探针显微镜具有探头接近或接触的物质表面，以检测该物质表面和探针之间的物理量，worin物理量是什么是相互作用或化学物质表面和分子或原子的基团作为其作用使其反应的传感器，并且在以精确原子水平固定在探针扫描。因此，微小区域内的表面结构可以检查或在分子或原子水平处理。一种用于检测DNA碱基排列与三个或四个种固定任意四个中的一个不同种类的分子相互作用的4种碱基自由DNA的，由接近固定在基板单链DNA探针的任一个中，测量力和方法在原子力显微镜扫描由在以原子精确度水平。

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